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1
المؤلفون: John L. Freeouf, Steven Consiglio, Vimal K. Kamineni, Robert D. Clark, James N. Hilfiker, Gert J. Leusink, Alain C. Diebold
المصدر: Thin Solid Films. 519:2894-2898
مصطلحات موضوعية: Materials science, business.industry, Silicon dioxide, Gate dielectric, Metals and Alloys, Oxide, Mineralogy, Equivalent oxide thickness, Surfaces and Interfaces, Dielectric, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, X-ray reflectivity, chemistry.chemical_compound, chemistry, Lanthanum oxide, Materials Chemistry, Optoelectronics, business, High-κ dielectric
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2
المؤلفون: Jürgen Schubert, John L. Freeouf, Tassilo Heeg, Darrell G. Schlom, Y. Jia, Christoph Buchal, E. Cicerrella, Wei Tian
المصدر: Applied Physics A. 83:103-106
مصطلحات موضوعية: Materials science, Analytical chemistry, General Materials Science, Electrical measurements, General Chemistry, Dielectric, Thin film, Epitaxy, Channelling, Rutherford backscattering spectrometry, Pulsed laser deposition, Leakage (electronics)
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3
المؤلفون: E. Cicerrella, Darrell G. Schlom, Tassilo Heeg, John L. Freeouf, Scott A. Chambers, J. Schubert, Lisa F. Edge
المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 23:1676-1680
مصطلحات موضوعية: Materials science, Band gap, Analytical chemistry, Surfaces and Interfaces, Dielectric, Condensed Matter Physics, Surfaces, Coatings and Films, Pulsed laser deposition, Carbon film, Ellipsometry, Deposition (phase transition), sense organs, Thin film, High-κ dielectric
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4
المؤلفون: Ch. Buchal, E. Cicerrella, John L. Freeouf, Jürgen Schubert, Markus Boese, Martina Luysberg, Martin R. Wagner, Tassilo Heeg
المصدر: Microelectronic Engineering. 80:150-153
مصطلحات موضوعية: Materials science, Silicon, business.industry, chemistry.chemical_element, Condensed Matter Physics, Epitaxy, Atomic and Molecular Physics, and Optics, Titanate, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Amorphous solid, Pulsed laser deposition, chemistry, Gate oxide, Optoelectronics, Electrical measurements, Electrical and Electronic Engineering, Thin film, business
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5
المؤلفون: Gerald Lucovsky, Y. Zou, John L. Freeouf, D.G. Scholm, Robert J. Nemanich, J. G. Hong, C. C. Fulton, Harald Ade
المصدر: physica status solidi (b). 241:2221-2235
مصطلحات موضوعية: Metal K-edge, Chemistry, Band gap, Inorganic chemistry, Electronic structure, Condensed Matter Physics, Metal L-edge, Band offset, Electronic, Optical and Magnetic Materials, Condensed Matter::Materials Science, Transition metal, Chemical physics, Electronic band structure, High-κ dielectric
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6
المؤلفون: Darrell G. Schlom, Gerald Lucovsky, John L. Freeouf, Y. Zhang, Jerry L. Whitten
المصدر: Microelectronic Engineering. 72:288-293
مصطلحات موضوعية: Permittivity, Condensed matter physics, Chemistry, Band gap, Rare earth, Dielectric, Electronic structure, Condensed Matter Physics, Molecular physics, Atomic and Molecular Physics, and Optics, Symmetry (physics), Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Transition metal, Electrical and Electronic Engineering, Electronic band structure
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7
المؤلفون: Shan Zhang, Qingfen Yang, Zonglin Yan, John L. Freeouf, Wennian Li, Guohua Li, Jerry M. Woodall
المصدر: Solar Energy Materials and Solar Cells. 75:307-312
مصطلحات موضوعية: Materials science, Renewable Energy, Sustainability and the Environment, business.industry, Radiation, Epitaxy, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, chemistry.chemical_compound, Optics, chemistry, law, Solar cell, Indium phosphide, Thin film, business, Layer (electronics), Radiation hardening, Radiation resistance
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8
المؤلفون: G. W. Charache, C. A. Wang, K. Wei, Martin Muñoz, John L. Freeouf, Fred H. Pollak
المصدر: Journal of Applied Physics. 87:1780-1787
مصطلحات موضوعية: Condensed matter physics, Band gap, Ellipsometry, Chemistry, Ab initio quantum chemistry methods, Exciton, Lattice (order), Binding energy, General Physics and Astronomy, Atomic physics, Electronic band structure, Spectral line
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9
المؤلفون: G. W. Charache, K. Wei, Fred H. Pollak, John L. Freeouf, Martin Muñoz
المصدر: Physical Review B. 60:8105-8110
مصطلحات موضوعية: Physics, Crystallography, Effective mass (solid-state physics), Ellipsometry, Binding energy, Dielectric function, Single crystal, Spectral line
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::42e504e74fdf03c6caae40b6eb9e57c0
https://doi.org/10.1103/physrevb.60.8105 -
10
المؤلفون: K. Wei, John L. Freeouf, Alvin D. Compaan, Diana Shvydka, Fred H. Pollak
المصدر: Journal of Applied Physics. 85:7418-7425
مصطلحات موضوعية: Range (particle radiation), Band gap, business.industry, Exciton, Binding energy, Oxide, Analytical chemistry, General Physics and Astronomy, Molecular physics, chemistry.chemical_compound, Semiconductor, chemistry, Ellipsometry, Coulomb, business