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المؤلفون: Amy Kutnerian, Lee Yu, Charles A Barber, Anthony F. Marlow, Rick L. Paul, Candace Wallace, Jessica McCandless, Alaina Rieke, Raymond Carl, John R. Sieber, Laura J. Wood
المصدر: X-Ray Spectrometry. 50:210-223
مصطلحات موضوعية: Fusion, Wavelength, Materials science, chemistry, Zirconium alloy, Analytical chemistry, chemistry.chemical_element, X-ray fluorescence, Boron, Mass spectrometry, Quantitative analysis (chemistry), Spectroscopy
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المؤلفون: John R. Sieber
المصدر: Powder Diffraction. 35:104-111
مصطلحات موضوعية: Radiation, Traceability, Fluorescence spectrometry, 010402 general chemistry, 010403 inorganic & nuclear chemistry, Condensed Matter Physics, 01 natural sciences, 0104 chemical sciences, Metrology, Certified reference materials, Quality management system, Systems engineering, NIST, General Materials Science, International System of Units, Instrumentation, Accreditation
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المؤلفون: Blaza Toman, Brian E. Lang, Lee L. Yu, Jeanice M. Brown Thomas, Jerome Mulloor, Michael A. Nelson, Stanley Lo, John R. Sieber
مصطلحات موضوعية: medicine.medical_specialty, chemistry.chemical_compound, chemistry, business.industry, Bilirubin, Medicine, Medical physics, Certification, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2e51a7e14c0b8df0231375f2615dc634
https://doi.org/10.6028/nist.sp.260-212 -
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المؤلفون: John L. Molloy, Caroline E Bibb, N Alan Heckert, Matthew W Boyce, John R. Sieber
مصطلحات موضوعية: Polyvinyl chloride, chemistry.chemical_compound, Materials science, chemistry, Certification, Composite material
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d654e195936413128360d4d0a8796d66
https://doi.org/10.6028/nist.sp.260-200 -
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المؤلفون: Evan P. Jahrman, John R. Sieber, Gerald T. Seidler
المصدر: Analytical chemistry. 90(11)
مصطلحات موضوعية: Chromium, Chemistry, 010401 analytical chemistry, Spectrometry, X-Ray Emission, 02 engineering and technology, Contamination, 021001 nanoscience & nanotechnology, 01 natural sciences, Tailings, Fluorescence spectroscopy, Article, 0104 chemical sciences, Analytical Chemistry, X-ray absorption fine structure, chemistry.chemical_compound, Hazardous waste, Environmental chemistry, media_common.cataloged_instance, European union, Hexavalent chromium, 0210 nano-technology, Absorption (electromagnetic radiation), Laboratories, Plastics, media_common
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المؤلفون: Jeffrey M. Davis, John L. Molloy, David L. Jacobson, John R. Sieber, Daniel S. Hussey, Dale P. Bentz, Scott Z. Jones
المصدر: Cementconcrete composites. 81
مصطلحات موضوعية: Materials science, 0211 other engineering and technologies, Fluorescence spectrometry, 020101 civil engineering, 02 engineering and technology, Building and Construction, Epoxy, Thermal diffusivity, Chloride, Article, 0201 civil engineering, Corrosion, Cracking, visual_art, 021105 building & construction, Service life, medicine, visual_art.visual_art_medium, General Materials Science, Composite material, Mortar, medicine.drug
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المؤلفون: Kirk D. Rice, John R. Sieber, Chad R. Snyder, Jonathan E. Seppala, Gale A. Holmes, Paul E. Stutzman, Yoonae Heo
المصدر: Journal of Materials Science. 50:7048-7057
مصطلحات موضوعية: Diffraction, Thermogravimetric analysis, Differential scanning calorimetry, Materials science, Shear thinning, Rheology, Mechanics of Materials, Mechanical Engineering, Solid mechanics, Composite number, General Materials Science, Dynamic mechanical analysis, Composite material
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المؤلفون: Albert Wills, Thomas Belliveau, Denis Choquette, John R. Sieber, Olivier Gabis, Rebecca K Wyss, Michael L. Ruschak
المصدر: Light Metals 2017 ISBN: 9783319515403
مصطلحات موضوعية: Engineering drawing, Guard (information security), Engineering, chemistry, Aluminium, Elemental analysis, business.industry, Metallurgy, chemistry.chemical_element, Standard test, Optical emission spectrometry, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::817d17745cd2eb0998a34687eb7117b2
https://doi.org/10.1007/978-3-319-51541-0_37 -
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المؤلفون: John R. Sieber, Adam Mortensen
المصدر: X-Ray Spectrometry. 43:259-268
مصطلحات موضوعية: Certified reference materials, Chemistry, Elemental analysis, Soldering, Metallurgy, Fluorescence spectrometry, Calibration, X-ray fluorescence, chemistry.chemical_element, Thin film, Tin, Spectroscopy