-
1
المؤلفون: Jonathan Fales, Binod Kumar G. Nair, Jeffrey E. Nelson, Frank E. Gennari, Philippe Hurat, Jac Condella, Akif Sultan, Aaron Sinnott, Xiaoyuan Qi, Sriram Madhavan, Uwe Paul Schroeder, Rwik Sengupta, Ya-Chieh Lai
المصدر: IEEE Transactions on Semiconductor Manufacturing. 34:372-378
مصطلحات موضوعية: Computer science, Process (engineering), Yield (finance), Semiconductor device modeling, Critical area, Integrated circuit, Condensed Matter Physics, Industrial and Manufacturing Engineering, Electronic, Optical and Magnetic Materials, Reliability engineering, law.invention, law, Range (statistics), Electrical and Electronic Engineering, Failure mode and effects analysis, Scaling
-
2
المؤلفون: Philippe Hurat, Ya-Chieh Lai, Atul Chittora, Jeffrey E. Nelson, Xiaoyuan Qi, Rwik Sengupta, Binod Kumar G. Nair, Aaron Sinnott, Frank E. Gennari, Jac Condella, Jonathan Fales, Shobhit Malik
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: Adaptive sampling, Computer science, law, Yield (finance), Transistor, Process (computing), Normalization (sociology), Critical area, Projection (set theory), Failure mode and effects analysis, Reliability engineering, law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e31d2dd7cd19fd6f640897511ffa93f0
https://doi.org/10.1117/12.2583515