المؤلفون: Hoon Lim, Seung-Jae Lee, Jong-Mil Youn, Tae-Hong Ha, Jin-Ho Kim, Bong-Hyun Choi, Ki-Joon Kim, Ho-Jin Kim, Kyeong-Tae Kim, Hyun-Geun Byun

المصدر: 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167) Reliability physics symposium Reliability Physics Symposium, 2001. Proceedings. 39th Annual. 2001 IEEE International. :48-51 2001

Relation: 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual

المؤلفون: Yuri Yasuda-Masuoka, Jaehun Jeong, Kihwang Son, SeungWook Lee, Seulki Park, Youngho Lee, Ju Youn Kim, Jaeho Lee, Moongi Cho, Sihyung Lee, Soohun Hong, Heebum Hong, Younghun Jung, Changkeun Yoon, Yonghyun Ko, Kyunghoon Jung, Taehun Myung, Jong Mil Youn, Gitae Jeong

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM).

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b6ed776a19715b49489ce62a2a6dafe1
https://doi.org/10.1109/iedm19574.2021.9720656

المؤلفون: Won Ji Park, Jae Hee Oh, Ji Hyung Kim, Seong Wook Moon, Jeong Hoon Ahn, Ding Shaofeng, Jung Ho Park, Won Hyoung Lee, Min Guk Kang, Choi Yun Ki, Seung Ki Nam, Je Gwan Hwang, Jong Mil Youn

المصدر: 2021 IEEE International Interconnect Technology Conference (IITC).

مصطلحات موضوعية: Interconnection, Materials science, Dielectric strength, business.industry, Insulator (electricity), Time-dependent gate oxide breakdown, Hardware_PERFORMANCEANDRELIABILITY, Capacitance, law.invention, Capacitor, Hardware_GENERAL, law, visual_art, Electronic component, Hardware_INTEGRATEDCIRCUITS, visual_art.visual_art_medium, Interposer, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::342c132f1ebe9f90373a841699094d8f
https://doi.org/10.1109/iitc51362.2021.9537342

المؤلفون: Jong-Mil Youn, Kichang Sung, Ju-Heon Kim, Jeong-Hoon Ahn, Wonkyu Han, Junki Jang, Yun-Ki Choi, Woojin Jang, Hoon Kim, Chang-Hyun Kim, Hyunju Yim, Wonmo Kang, Rak-Hwan Kim, Youngju Lim, Young Soo Yoon, Dongwoo Shin

المصدر: 2021 IEEE International Interconnect Technology Conference (IITC).

مصطلحات موضوعية: Materials science, integumentary system, technology, industry, and agriculture, chemistry.chemical_element, Nitrogen, Metal, Atomic layer deposition, chemistry, visual_art, Transition layer, visual_art.visual_art_medium, Diffusion (business), Composite material, skin and connective tissue diseases, human activities

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3001ed74dd45f03dcc568d479888c889
https://doi.org/10.1109/iitc51362.2021.9537395

المؤلفون: Young-Gun Ko, Jeongmin Choi, Y. Yasuda-Masuoka, Kyunghoon Jung, Heebum Hong, Sungil Jo, Jae-Hun Jeong, Minseong Lee, Young-Ho Lee, Sihyung Lee, Ju Youn Kim, Gitae Jeong, Kihwang Son, Ho Lee, Byungha Choi, Hyung-Jong Lee, Chunghwan Shin, Jong Mil Youn, Sung Won Kim, Jae-Chul Kim

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Power management, Power gain, Computer architecture, Computer science, law, Extreme ultraviolet lithography, Transistor, Process (computing), State (computer science), Dual (category theory), Power (physics), law.invention

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e0efae1aa35f1f41261d412f146b43f5
https://doi.org/10.1109/iedm13553.2020.9371958

المؤلفون: Nak-Jin Son, Yongmin Park, Hwa-Sung Rhee, Sung Gun Kang, Sung-il Cho, Kyung-Hwan Yeo, Eun-Cheol Lee, Yun-Ki Choi, Jong Shik Yoon, Heebum Hong, Jeong-Hoon Ahn, Dongwoo Kim, Il-Ryong Kim, Jungtae Kim, Jong Mil Youn, Jae-Hun Jeong

المصدر: 2018 IEEE Symposium on VLSI Technology.

مصطلحات موضوعية: 010302 applied physics, Cryptocurrency, Computer science, Volume (computing), Process (computing), 01 natural sciences, Automotive engineering, High volume manufacturing, Power (physics), Reduction (complexity), Logic gate, 0103 physical sciences, 010301 acoustics, Scaling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::40b1037773b5c94d6df5444162cc2a3a
https://doi.org/10.1109/vlsit.2018.8510673

المؤلفون: S.B. Kim, J. H. Kim, Hwang So-Hee, Jong-Mil Youn, K.J. Kim, K. Kim, Yoo-Cheol Shin

المصدر: 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216).

مصطلحات موضوعية: Very-large-scale integration, Engineering, CMOS, Aspect ratio, Bar (music), business.industry, Electrode, Sram cell, Hardware_INTEGRATEDCIRCUITS, Electrical engineering, High density, business, Integrated circuit layout

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f9079f56c48725b9298e0dc383c934b2
https://doi.org/10.1109/vlsit.1998.689202

المؤلفون: Hyun-Geun Byun, Hoon Lim, Bonghyun Choi, Ki-Joon Kim, Tae-Hong Ha, Ho-Jin Kim, Seung-jae Lee, Jin-Ho Kim, Kyeong-Tae Kim, Jong-Mil Youn

المصدر: 2001 IEEE International Reliability Physics Symposium Proceedings. 39th Annual (Cat. No.00CH37167).

مصطلحات موضوعية: Materials science, Fabrication, business.industry, Oxide, Stress (mechanics), chemistry.chemical_compound, Reliability (semiconductor), chemistry, Shallow trench isolation, Chemical-mechanical planarization, Electronic engineering, Optoelectronics, Breakdown voltage, Degradation (geology), business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::20e3959e83ba7de0a9150974ca3978c6
https://doi.org/10.1109/relphy.2001.922880

المؤلفون: Kyeong-Tae Kim, Ki-Joon Kim, Jinho Kim, Soo-Hun Hong, Jong-Mil Youn, Hoon Lim

المصدر: Extended Abstracts of the 2000 International Conference on Solid State Devices and Materials.

مصطلحات موضوعية: Materials science, business.industry, MOSFET, Trench, Optoelectronics, business, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cd5cb0e57e55643856d1db7db8c30f1c
https://doi.org/10.7567/ssdm.2000.a-4-3