المؤلفون: Jonghan Kwon, Picard, Yoosuf N., Skowronski, Marek, Sharma, Abhishek A., Bain, James A.

المصدر: 2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :5E.5.1-5E.5.5 Jun, 2014

Relation: 2014 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Hyun Woo Shim, Taehun Lee, Jonghan Kwon

المصدر: International Symposium for Testing and Failure Analysis.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dbf86443b0e9dbf275fa21e778bfdf8b
https://doi.org/10.31399/asm.cp.istfa2022p0206

المؤلفون: Taehun Lee, Hyun Woo Shim, Jonghan Kwon

المصدر: International Symposium for Testing and Failure Analysis.

مصطلحات موضوعية: Workflow, business.industry, Computer science, Embedded system, business, Characterization (materials science)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::22b1eda1a29c61d8c0f3e7cf34bcec91
https://doi.org/10.31399/asm.cp.istfa2021p0126

المؤلفون: Sharma, Abhishek A., Karpov, Ilya V., Kotlyar, Roza, Jonghan Kwon, Skowronski, Marek, Bain, James A.

المصدر: Journal of Applied Physics; 2015, Vol. 118 Issue 11, p114903-1-114903-7, 7p, 3 Diagrams, 4 Graphs

مصطلحات موضوعية: ELECTROFORMING, BINARY metallic systems, OXIDATION, METAL oxide semiconductors, SWITCHING circuits, ELECTRIC fields, ACTIVATION energy

المؤلفون: George M. Pharr, Easo P. George, V. McCreary, P. Sudaharshan Phani, Jonghan Kwon, Hongbin Bei, Yanfei Gao, M. C. Brandes, Michael J. Mills, M.L. Bowers, Ian M. Robertson

المصدر: Acta Materialia. 89:315-326

مصطلحات موضوعية: Nial, Materials science, Polymers and Plastics, Lüders band, Metals and Alloys, Slip (materials science), Plasticity, Electronic, Optical and Magnetic Materials, Deformation mechanism, Ceramics and Composites, Composite material, Dislocation, computer, computer.programming_language, Directional solidification, Eutectic system

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ea7633d354787612edb828a22fab28cb
https://doi.org/10.1016/j.actamat.2015.01.059

المؤلفون: Yoosuf N. Picard, James A. Bain, Jonghan Kwon, Abhishek Sharma, Marek Skowronski

المصدر: Advanced Functional Materials. 25:2876-2883

مصطلحات موضوعية: Resistive touchscreen, Materials science, Condensed matter physics, chemistry.chemical_element, Biasing, Condensed Matter Physics, Oxygen, Electronic, Optical and Magnetic Materials, Resistive random-access memory, Biomaterials, Crystallography, chemistry, Vacancy defect, Electric field, Electrochemistry, Partial dislocations, Excitation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a005eaa5036431d6392eb77646302ec5
https://doi.org/10.1002/adfm.201500444

المؤلفون: Yanfei Gao, Easo P. George, P. Sudharshan Phani, George M. Pharr, Jonghan Kwon, A. P. Pilchak, Michael J. Mills, M. C. Brandes

المصدر: Acta Materialia. 61:4743-4756

مصطلحات موضوعية: Materials science, Polymers and Plastics, Scanning electron microscope, Metals and Alloys, Slip (materials science), Nanoindentation, Plasticity, Electronic, Optical and Magnetic Materials, Crystallography, Indentation, Critical resolved shear stress, Scanning transmission electron microscopy, Ceramics and Composites, Composite material, Elastic modulus

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6cd3130ae2f8473b49de3b7b3b310c41
https://doi.org/10.1016/j.actamat.2013.05.005

المؤلفون: Malgorzata Jurczak, C. Y. Chen, Andrew A. Herzing, James A. Bain, Marek Skowronski, Abhishek Sharma, Andrea Fantini, Jonghan Kwon, Yoosuf N. Picard

المصدر: ACS applied materialsinterfaces. 8(31)

مصطلحات موضوعية: 010302 applied physics, Resistive touchscreen, Materials science, business.industry, Nanotechnology, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Amorphous solid, Resistive random-access memory, Protein filament, Transmission electron microscopy, 0103 physical sciences, Optoelectronics, General Materials Science, Transient (oscillation), 0210 nano-technology, business, High-resolution transmission electron microscopy, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::00c872799aa714975d28ff991841d148
https://pubmed.ncbi.nlm.nih.gov/27351065

المؤلفون: Jonghan Kwon, Abhishek Sharma, C. Y. Chen, Andrea Fantini, James A. Bain, Yoosuf N. Picard, Marek Skowronski, Malgorzata Jurczak

المصدر: 2016 IEEE International Reliability Physics Symposium (IRPS).

مصطلحات موضوعية: 010302 applied physics, Heat-affected zone, Materials science, business.industry, Nanotechnology, 02 engineering and technology, 021001 nanoscience & nanotechnology, Microstructure, 01 natural sciences, Temperature measurement, Resistive random-access memory, Protein filament, 0103 physical sciences, Optoelectronics, Transient (oscillation), Crystallite, 0210 nano-technology, business, High-resolution transmission electron microscopy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::22a7a8ad7da246ba0166fff72987867c
https://doi.org/10.1109/irps.2016.7574579

المؤلفون: Jonghan Kwon

مصطلحات موضوعية: FOS: Materials engineering, 91299 Materials Engineering not elsewhere classified

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::929dc518cbff54bf19007d0de9ef4145