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1
المؤلفون: Arjun Chaudhuri, Jonti Talukdar, Fei Su, Krishnendu Chakrabarty
المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41:5657-5670
مصطلحات موضوعية: Electrical and Electronic Engineering, Computer Graphics and Computer-Aided Design, Software
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2
المؤلفون: Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty
المصدر: Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0d55341bf2d2ce015acdd339295de4b0
https://doi.org/10.1145/3508352.3561121 -
3
المصدر: 2022 IEEE International Test Conference (ITC).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ce768c05af97237ca1e1c445582db284
https://doi.org/10.1109/itc50671.2022.00022 -
4
المؤلفون: Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty
المصدر: 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c4f0290a72991abfaf18412bd60afcb1
https://doi.org/10.1109/isvlsi54635.2022.00074 -
5
المؤلفون: Jonti Talukdar, Arjun Chaudhuri, Krishnendu Chakrabarty
المصدر: 2022 IEEE European Test Symposium (ETS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3abfb46166bf611c26608b38c51e1426
https://doi.org/10.1109/ets54262.2022.9810399 -
6
المؤلفون: Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty
المصدر: 2022 IEEE 40th VLSI Test Symposium (VTS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::88b0a98bfbf761f6a9e30e197d8efc2a
https://doi.org/10.1109/vts52500.2021.9794215 -
7
المؤلفون: Sohrab Aftabjahani, Peilin Song, Krishnendu Chakrabarty, Amitabh Das, Jonti Talukdar, Siyuan Chen
المصدر: ITC
مصطلحات موضوعية: Scheme (programming language), Obfuscation (software), Computer science, Computer security, computer.software_genre, Resilience (network), computer, Oracle, computer.programming_language
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fd94d1879b634bafc92d18b785d112a0
https://doi.org/10.1109/itc50571.2021.00025 -
8
المؤلفون: Ching-Yuan Chen, Abhishek Kumar Dubey, Arjun Chaudhuri, Jonti Talukdar, Krishnendu Chakrabarty, Siddarth Madala
المصدر: ITC
مصطلحات موضوعية: Failure mode, effects, and criticality analysis, Computer science, Fault (power engineering), Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1163864550bf91a781628de4fd37cd30
https://doi.org/10.1109/itc50571.2021.00015 -
9
المؤلفون: Arjun Chaudhuri, Jonti Talukdar, Sanmitra Banerjee, Shao-Chun Hung, Krishnendu Chakrabarty, Ching-Yuan Chen, Mahdi Nikdast
المصدر: 2021 IEEE Microelectronics Design & Test Symposium (MDTS).
مصطلحات موضوعية: Computer science, Emerging technologies, Memristor, Fault (power engineering), Reliability engineering, law.invention, symbols.namesake, CMOS, law, Component (UML), symbols, Performance improvement, Efficient energy use, Von Neumann architecture
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5b9a6d607f5cd5836a5e026b07018851
https://doi.org/10.1109/mdts52103.2021.9476140 -
10
المصدر: DATE
مصطلحات موضوعية: Feature engineering, geography, geography.geographical_feature_category, Artificial neural network, Computer science, Fault tolerance, Fault (geology), computer.software_genre, Criticality assessment, Criticality, Graph (abstract data type), Data mining, computer, MNIST database
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5e9406d36f97b111c57fc89947261fbc
https://doi.org/10.23919/date51398.2021.9474128