المؤلفون: Sang-Hun Seo, Sung-Jin Kim, Won-Suk Yang, Jun-Yong Ju, Joo-Young Kim, Seung-Hyun Park, Seug-Gyu Kim, Kijoon Kim

المصدر: 2003 8th International Symposium Plasma- and Process-Induced Damage. Plasma- and process-induced damage Plasma- and Process-Induced Damage, 2003 8th International Symposium. :146-149 2003

Relation: 2003 8th International Symposium on Plasma- and Process-Induced Damage

المؤلفون: Sang-Hun Seo, Won-Suk Yang, Sung-Jin Kim, Jun-Yong Ju, Joo-Young Kim, Hyun-Chul Peak, Seung-Hyun Park, Seug-Gyu Kim, Kyeong-Tae Kim

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 24(12):727-729 Dec, 2003

المؤلفون: Won-suk Yang, Jun-Yong Ju, Ki-Joon Kim, Sung-Jin Kim, Joo-Young Kim, Sang-Hun Seo, Seug-Gyu Kim, Seung-Hyun Park

المصدر: 2003 8th International Symposium Plasma- and Process-Induced Damage..

مصطلحات موضوعية: Materials science, business.industry, Transconductance, Transistor, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, equipment and supplies, Threshold voltage, law.invention, Notching, law, Electric field, Low-power electronics, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Static random-access memory, business, Hardware_LOGICDESIGN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::127580d512a2a6640e4db04f7890f1f7
https://doi.org/10.1109/ppid.2003.1200944

المؤلفون: Lee, Usik, Jun, Yong Ju, Park, Ilwook

المصدر: Advanced Materials Research; November 2011, Vol. 393 Issue: 1 p3-6, 4p

المؤلفون: Kim, Kwan Mook, Park, Jung Su, Kim, Yeong-Sang, Jun, Yong Ju, Kang, Tae Yi, Sohn, Youn Soo, Jun, Moo-Jin

المصدر: Angewandte Chemie International Edition; Jul2001, Vol. 40 Issue 13, p2458-2460, 3p

المؤلفون: Kim, Kwan Mook, Park, Jung Su, Kim, Yeong-Sang, Jun, Yong Ju, Kang, Tae Yi, Sohn, Youn Soo, Jun, Moo-Jin

المصدر: Angewandte Chemie. International Edition; July 2, 2001, Vol. 40 Issue: 13 p2458-2460, 3p

المؤلفون: Chung MY; Department of Neuropsychiatry, Seoul Veterans Hospital, Seoul, Korea. vetmoon@kornet.net, Min KH, Jun YJ, Kim SS, Kim WC, Jun EM

المصدر: Human psychopharmacology [Hum Psychopharmacol] 2004 Oct; Vol. 19 (7), pp. 489-94.

نوع المنشور: Clinical Trial; Journal Article; Randomized Controlled Trial; Research Support, Non-U.S. Gov't

بيانات الدورية: Publisher: Wiley & Sons Country of Publication: England NLM ID: 8702539 Publication Model: Print Cited Medium: Print ISSN: 0885-6222 (Print) Linking ISSN: 08856222 NLM ISO Abbreviation: Hum Psychopharmacol Subsets: MEDLINE

مواضيع طبية MeSH: Mianserin/*analogs & derivatives , Mianserin/*therapeutic use , Sertraline/*therapeutic use , Stress Disorders, Post-Traumatic/*drug therapy, Adult ; Aged ; Humans ; Korea ; Male ; Mianserin/adverse effects ; Middle Aged ; Mirtazapine ; Sertraline/adverse effects ; Veterans

المؤلفون: Kim KM; Life Science Division Korea Institute of Science and Technology Seoul 130-650 (Korea)., Park JS, Kim YS, Jun YJ, Kang TY, Sohn YS, Jun MJ

المصدر: Angewandte Chemie (International ed. in English) [Angew Chem Int Ed Engl] 2001 Jul 02; Vol. 40 (13), pp. 2458-2460.

نوع المنشور: Journal Article

بيانات الدورية: Publisher: Wiley-VCH Country of Publication: Germany NLM ID: 0370543 Publication Model: Print Cited Medium: Internet ISSN: 1521-3773 (Electronic) Linking ISSN: 14337851 NLM ISO Abbreviation: Angew Chem Int Ed Engl