يعرض 1 - 10 نتائج من 183 نتيجة بحث عن '"Jung, D. J."', وقت الاستعلام: 1.18s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: 2012 IEEE-EMBS Conference on Biomedical Engineering and Sciences Biomedical Engineering and Sciences (IECBES), 2012 IEEE EMBS Conference on. :28-33 Dec, 2012

    Relation: 2012 IEEE EMBS Conference on Biomedical Engineering and Sciences (IECBES 2012)

  2. 2
    مؤتمر

    المصدر: 2012 IEEE-EMBS Conference on Biomedical Engineering and Sciences Biomedical Engineering and Sciences (IECBES), 2012 IEEE EMBS Conference on. :40-45 Dec, 2012

    Relation: 2012 IEEE EMBS Conference on Biomedical Engineering and Sciences (IECBES 2012)

  3. 3
    دورية أكاديمية
  4. 4
    دورية أكاديمية

    المؤلفون: Jung, D.-J., Chang, K.

    المصدر: IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 57(7):1798-1805 Jul, 2009

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  6. 6
    مؤتمر

    المصدر: 2008 Symposium on VLSI Technology VLSI Technology, 2008 Symposium on. :102-103 Jun, 2008

    Relation: 2008 Symposium on VLSI Technology

  7. 7
    مؤتمر

    المصدر: 2007 IEEE Symposium on VLSI Technology VLSI Technology, 2007 IEEE Symposium on. :230-231 Jun, 2007

    Relation: 2007 IEEE Symposium on VLSI Technology

  8. 8
    مؤتمر

    المصدر: 2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on. :25-27 May, 2007

    Relation: 2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics

  9. 9
    مؤتمر

    المصدر: 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual Reliability physics symposium, 2007. proceedings. 45th annual. ieee international. :554-557 Apr, 2007

    Relation: 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual

  10. 10
    مؤتمر

    المصدر: 2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006

    Relation: 2006 International Electron Devices Meeting