المؤلفون: Vidhya M. Ravi, Paulina Will, Jan Kueckelhaus, Na Sun, Kevin Joseph, Henrike Salié, Jasmin von Ehr, Lea Vollmer, Jasim K. Benotmane, Nicolas Neidert, Marie Follo, Florian Scherer, Jonathan M Goeldner, Simon P. Behringer, Pamela Franco, Ulrich G. Hofmann, Christian Fung, Jürgen Beck, Roman Sankowski, Marco Prinz, Saskia Killmer, Bertram Bengsch, Axel Karl Walch, Daniel Delev, Oliver Schnell, Dieter Henrik Heiland

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::54c363038a378ba4957da7d5adc0078b
https://doi.org/10.1101/2021.02.16.431475

المؤلفون: L. Clement, J.-L. Huguenin, Frederic Boeuf, J.M. Hartmann, V Destefanis, Thomas Skotnicki, Stephane Denorme, Stephane Monfray, Y. Campidelli, C. Fenouillet-Beranger, Christian Arvet, G. Bidal, O. Faynot, M.-P. Samson, K. Benotmane, Nicolas Loubet

المصدر: Solid-State Electronics

مصطلحات موضوعية: 010302 applied physics, Engineering, business.industry, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, Electrical engineering, Context (language use), 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Power (physics), ComputingMethodologies_PATTERNRECOGNITION, Depletion region, CMOS, Power consumption, Low-power electronics, 0103 physical sciences, Materials Chemistry, Optoelectronics, Node (circuits), Electrical and Electronic Engineering, Thin film, 0210 nano-technology, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2add85a01df4d4c91e52639871e9f05f
https://doi.org/10.1016/j.sse.2009.12.013

المؤلفون: E. Ollier, C. Duprxe9, G. Arndt, J. Arcamone, C. Vizioz, L. Duraffourg, E. Sage, A. Koumela, S. Hentz, G. Cibrario, P. Meininger, K. Benotmane, C. Marcoux, O. Rozeau, G. Billiot, E. Colinet, F. Andrieu, J. Philippe, F. Aussenac, D. Mercier, H. Blanc, T. Ernst, P. Robert

المصدر: Ultra-scaled high-frequency single-crystal Si NEMS resonators and their front-end co-integration ....

URL الوصول: https://explore.openaire.eu/search/publication?articleId=erc_________::ce2ac2c41d74f000ba2adef2ac28d8f8

المؤلفون: Philippe Robert, F. Andrieu, C. Marcoux, C. Vizioz, H. Blanc, F. Aussenac, G. Cibrario, P. Meininger, Gerard Billiot, Cecilia Dupre, Eric Colinet, K. Benotmane, Sebastien Hentz, A Koumela, Gregory Arndt, Thomas Ernst, J. Philippe, Eric Sage, Eric Ollier, Olivier Rozeau, Laurent Duraffourg, Julien Arcamone, D. Mercier

المصدر: 2012 IEEE 25th International Conference on Micro Electro Mechanical Systems (MEMS).

مصطلحات موضوعية: Nanoelectromechanical systems, Materials science, business.industry, Electrical engineering, Signal, Front and back ends, Resonator, Direct-conversion receiver, CMOS, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, business, Single crystal, Sensitivity (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4d24cead439675aaebdd0d461d2ec940
https://doi.org/10.1109/memsys.2012.6170421

المؤلفون: Francois Leverd, B. Le-Gratiet, C. Borowiak, Thomas Ernst, Frederic Boeuf, L. Pinzelli, S. Barraud, T. Morel, Stephane Denorme, J.-L. Huguenin, Romain Wacquez, Sébastien Barnola, Pascal Gouraud, J. Bustos, G. Bidal, Stephane Monfray, M.-P. Samson, O. Faynot, Jf. Dalemcourt, K. Benotmane, B. Icard, Christian Arvet, Laurent Pain, Y. Campidelli, Thomas Skotnicki, P. Perreau, M. Martin, Remi Beneyton, C. De-Buttet

المصدر: 2010 International Electron Devices Meeting.

مصطلحات موضوعية: Very-large-scale integration, Materials science, Silicon, business.industry, Transistor, Electrical engineering, chemistry.chemical_element, Silicon-germanium, law.invention, chemistry.chemical_compound, Planar, CMOS, chemistry, Direct exposure, law, Logic gate, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8f28f8ef509130416e0f809c762831fb
https://doi.org/10.1109/iedm.2010.5703339

المؤلفون: C. Borowiak, Stephane Denorme, M.-P. Samson, L. Clement, Francois Leverd, G. Bidal, Sébastien Barnola, F. Abbate, K. Benotmane, Y. Campidelli, C. Fenouillet-Beranger, Thomas Skotnicki, Frederic Boeuf, Gerard Ghibaudo, Stephane Monfray, Dominique Golanski, P. Perreau, J.-L. Huguenin, Nicolas Loubet

المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Laboratoire de physiopathologie de la nutrition (LPN), Université Paris Diderot - Paris 7 (UPD7)-Centre National de la Recherche Scientifique (CNRS), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS), Domenget, Chahla, Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS)

المصدر: International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), 2010, Taiwan
HAL

مصطلحات موضوعية: Materials science, Silicon, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, chemistry.chemical_element, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 01 natural sciences, law.invention, Stack (abstract data type), law, Low-power electronics, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Wafer, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, ComputingMilieux_MISCELLANEOUS, 010302 applied physics, business.industry, Transistor, Electrical engineering, 021001 nanoscience & nanotechnology, chemistry, Logic gate, Optoelectronics, 0210 nano-technology, Tin, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::82bf0d61aebef7940501c0cc121ab605
https://hal.science/hal-00604654

المؤلفون: G. Bidal, Ph. Galy, O. Faynot, L. Clement, Frederic Boeuf, A. Bajolet, Antoine Cros, S. Handler, D. Marin-Cudraz, Christian Arvet, Qing Liu, Francois Leverd, Y. Campidelli, Stephane Denorme, Gerard Ghibaudo, F. Abbate, Sébastien Barnola, Stephane Monfray, J.-L. Huguenin, M.-P. Samson, Claire Fenouillet-Beranger, Nicolas Loubet, T. Benoist, K. Benotmane, Thomas Skotnicki, C. Borowiak, P. Perreau

المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Laboratoire de physiopathologie de la nutrition (LPN), Université Paris Diderot - Paris 7 (UPD7)-Centre National de la Recherche Scientifique (CNRS), Interactions et dynamique des environnements de surface (IDES), Université Paris-Sud - Paris 11 (UP11)-Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS), Science et Ingénierie des Matériaux et Procédés (SIMaP), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS), Domenget, Chahla

المصدر: IEEE VLSI symposium 2010
IEEE VLSI symposium 2010, 2010, Hawai, United States
HAL

مصطلحات موضوعية: 010302 applied physics, Materials science, Electrostatic discharge, business.industry, Electrical engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, Chip, 01 natural sciences, Silicon-germanium, chemistry.chemical_compound, chemistry, [PHYS.COND.CM-GEN] Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other], Logic gate, Low-power electronics, [PHYS.COND.CM-GEN]Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other], 0103 physical sciences, Optoelectronics, System on a chip, Static random-access memory, business, ComputingMilieux_MISCELLANEOUS

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f7c786658dd0d682608c1dd6f053c89e
https://hal.science/hal-00604653

المؤلفون: Nicolas Loubet, R. Beneyton, T. Morel, Stephane Denorme, L. Pinzelli, B. Le-Gratiet, Francois Leverd, Stephane Monfray, G. Bidal, J.-L. Huguenin, M.-P. Samson, Sébastien Barnola, Aomar Halimaoui, K. Benotmane, Thomas Skotnicki, Frederic Boeuf, C. De-Butet, Gerard Ghibaudo, Christian Arvet, Y. Campidelli, Pascal Gouraud, P. Perreau

المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Institut d'Astrophysique de Paris (IAP), Université Pierre et Marie Curie - Paris 6 (UPMC)-Institut national des sciences de l'Univers (INSU - CNRS)-Centre National de la Recherche Scientifique (CNRS), Science et Ingénierie des Matériaux et Procédés (SIMaP), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Institut de Chimie du CNRS (INC)-Centre National de la Recherche Scientifique (CNRS), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS), Centre National de la Recherche Scientifique (CNRS)-Institut national des sciences de l'Univers (INSU - CNRS)-Université Pierre et Marie Curie - Paris 6 (UPMC)

المصدر: SSDM 2010
SSDM 2010, 2010, tokyo, Japan
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مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Power (physics), CMOS, [PHYS.COND.CM-GEN]Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other], 0103 physical sciences, Optoelectronics, 0210 nano-technology, business, ComputingMilieux_MISCELLANEOUS, High-κ dielectric

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6cab4d94a457099f7252be35b1cf4a04
https://hal.science/hal-00604648

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