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المؤلفون: K. Dmowski, A. Halimaoui
المصدر: Journal of Non-Crystalline Solids. 216:185-191
مصطلحات موضوعية: Materials science, Condensed matter physics, Polysilicon depletion effect, Transistor, Doping, Oxide, Analytical chemistry, Hardware_PERFORMANCEANDRELIABILITY, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Condensed Matter Physics, Capacitance, Computer Science::Other, Electronic, Optical and Magnetic Materials, law.invention, chemistry.chemical_compound, Capacitor, chemistry, Hardware_GENERAL, law, Gate oxide, Hardware_INTEGRATEDCIRCUITS, Materials Chemistry, Ceramics and Composites, Poisson's equation, Hardware_LOGICDESIGN
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المؤلفون: W. Erni, I. Keshelashvili, B. Krusche, M. Steinacher, Y. Heng, Z. Liu, H. Liu, X. Shen, Q. Wang, H. Xu, A. Aab, M. Albrecht, J. Becker, A. Csapó, F. Feldbauer, M. Fink, P. Friedel, F. H. Heinsius, T. Held, L. Klask, H. Koch, B. Kopf, S. Leiber, M. Leyhe, C. Motzko, M. Pelizäus, J. Pychy, B. Roth, T. Schröder, J. Schulze, C. Sowa, M. Steinke, T. Trifterer, U. Wiedner, J. Zhong, R. Beck, S. Bianco, K. T. Brinkmann, C. Hammann, F. Hinterberger, D. Kaiser, R. Kliemt, M. Kube, A. Pitka, T. Quagli, C. Schmidt, R. Schmitz, R. Schnell, U. Thoma, P. Vlasov, D. Walther, C. Wendel, T. Würschig, H. G. Zaunick, A. Bianconi, M. Bragadireanu, M. Caprini, D. Pantea, D. Pantelica, D. Pietreanu, L. Serbina, P. D. Tarta, D. Kaplan, T. Fiutowski, M. Idzik, B. Mindur, D. Przyborowski, K. Swientek, B. Czech, M. Kistryn, S. Kliczewski, A. Kozela, P. Kulessa, P. Lebiedowicz, K. Pysz, W. Schäfer, R. Siudak, A. Szczurek, S. Jowzaee, M. Kajetanowicz, B. Kamys, S. Kistryn, G. Korcyl, K. Korcyl, W. Krzemien, A. Magiera, P. Moskal, M. Palka, Z. Rudy, P. Salabura, J. Smyrski, A. Wrońska, I. Augustin, I. Lehmann, D. Nimorus, G. Schepers, M. Al-Turany, R. Arora, H. Deppe, H. Flemming, A. Gerhardt, K. Götzen, A. F. Jordi, G. Kalicy, R. Karabowicz, D. Lehmann, B. Lewandowski, J. Lühning, F. Maas, H. Orth, M. Patsyuk, K. Peters, T. Saito, C. J. Schmidt, L. Schmitt, C. Schwarz, J. Schwiening, M. Traxler, B. Voss, P. Wieczorek, A. Wilms, M. Zühlsdorf, V. M. Abazov, G. Alexeev, A. Arefiev, V. I. Astakhov, M. Yu. Barabanov, B. V. Batyunya, Yu. I. Davydov, V. Kh. Dodokhov, A. A. Efremov, A. G. Fedunov, A. A. Festchenko, A. S. Galoyan, S. Grigoryan, A. Karmokov, E. K. Koshurnikov, V. I. Lobanov, Yu. Yu. Lobanov, A. F. Makarov, L. V. Malinina, V. L. Malyshev, G. A. Mustafaev, A. Olshevskiy, M. A. Pasyuk, E. A. Perevalova, A. A. Piskun, T. A. Pocheptsov, G. Pontecorvo, V. K. Rodionov, Yu. N. Rogov, R. A. Salmin, A. G. Samartsev, M. G. Sapozhnikov, G. S. Shabratova, A. N. Skachkova, N. B. Skachkov, E. A. Strokovsky, M. K. Suleimanov, R. Sh. Teshev, V. V. Tokmenin, V. V. Uzhinsky, A. S. Vodopyanov, S. A. Zaporozhets, N. I. Zhuravlev, A. G. Zorin, D. Branford, D. Glazier, D. Watts, P. Woods, A. Britting, W. Eyrich, A. Lehmann, F. Uhlig, S. Dobbs, Z. Metreveli, K. Seth, A. Tomaradze, T. Xiao, D. Bettoni, V. Carassiti, A. Cotta Ramusino, P. Dalpiaz, A. Drago, E. Fioravanti, I. Garzia, M. Savriè, G. Stancari, N. Bianchi, P. Gianotti, C. Guaraldo, V. Lucherini, D. Orecchini, E. Pace, A. Bersani, G. Bracco, M. Macri, R. F. Parodi, D. Bremer, V. Dormenev, P. Drexler, M. Düren, T. Eissner, K. Föhl, M. Galuska, T. Gessler, A. Hayrapetyan, J. Hu, P. Koch, B. Kröck, W. Kühn, S. Lange, Y. Liang, O. Merle, V. Metag, M. Moritz, D. Münchow, M. Nanova, R. Novotny, B. Spruck, H. Stenzel, T. Ullrich, M. Werner, C. Euan, M. Hoek, D. Ireland, T. Keri, R. Montgomery, D. Protopopescu, G. Rosner, B. Seitz, M. Babai, A. Glazenborg-Kluttig, M. Kavatsyuk, P. Lemmens, M. Lindemulder, H. Löhner, J. Messchendorp, H. Moeini, P. Schakel, F. Schreuder, H. Smit, G. Tambave, J. C. van der Weele, R. Veenstra, H. Sohlbach, M. Büscher, D. Deermann, R. Dosdall, S. Esch, A. Gillitzer, F. Goldenbaum, D. Grunwald, S. Henssler, A. Herten, Q. Hu, G. Kemmerling, H. Kleines, V. Kozlov, A. Lehrach, R. Maier, M. Mertens, H. Ohm, S. Orfanitski, D. Prasuhn, T. Randriamalala, J. Ritman, M. Röder, S. Schadmand, V. Serdyuk, G. Sterzenbach, T. Stockmanns, P. Wintz, P. Wüstner, J. Kisiel, S. Li, Z. Li, Z. Sun, V. Rigato, S. Fissum, K. Hansen, L. Isaksson, M. Lundin, B. Schröder, P. Achenbach, S. Bleser, U. Cahit, M. Cardinali, A. Denig, M. Distler, M. Fritsch, P. Jasinski, D. Kangh, A. Karavdina, W. Lauth, H. Merkel, M. Michel, M. C. Mora Espi, U. Müller, J. Pochodzalla, S. Sanchez, A. Sanchez-Lorente, S. Schlimme, C. Sfienti, M. Thiel, T. Weber, V. I. Dormenev, A. A. Fedorov, M. V. Korzhik, O. V. Missevitch, V. Balanutsa, V. Chernetsky, A. Demekhin, A. Dolgolenko, P. Fedorets, A. Gerasimov, V. Goryachev, V. Varentsov, A. Boukharov, O. Malyshev, I. Marishev, A. Semenov, F. Böhmer, S. Dørheim, B. Ketzer, S. Paul, A. K. Hergemöller, A. Khoukaz, E. Köhler, A. Täschner, J. Wessels, R. Varma, A. Chaterjee, V. Jha, S. Kailas, B. J. Roy, Y. Yan, K. Chinorat, K. Khanchai, L. Ayut, S. Pomrad, E. Baldin, K. Kotov, S. Peleganchuk, Yu. Tikhonov, J. Boucher, V. Chambert, A. Dbeyssi, M. Gumberidze, T. Hennino, M. Imre, R. Kunne, C. Le Galliard, B. Ma, D. Marchand, A. Maroni, S. Ong, B. Ramstein, P. Rosier, E. Tomasi-Gustafsson, J. Van de Wiele, G. Boca, A. Braghieri, S. Costanza, P. Genova, L. Lavezzi, P. Montagna, A. Rotondi, V. Abramov, N. Belikov, A. Davidenko, A. Derevschikov, Y. Goncharenko, V. Grishin, V. Kachanov, D. Konstantinov, V. Kormilitsin, Y. Melnik, A. Levin, N. Minaev, V. Mochalov, D. Morozov, L. Nogach, S. Poslavskiy, A. Ryazantsev, S. Ryzhikov, P. Semenov, I. Shein, A. Uzunian, A. Vasiliev, A. Yakutin, T. Bäck, B. Cederwall, K. Makónyi, P. E. Tegnér, K. M. von Würtemberg, S. Belostotski, G. Gavrilov, A. Itzotov, A. Kashchuk, A. Kisselev, P. Kravchenko, O. Levitskaya, S. Manaenkov, O. Miklukho, Y. Naryshkin, D. Veretennikov, V. Vikhrov, A. Zhadanov, D. Alberto, A. Amoroso, M. P. Bussa, L. Busso, F. De Mori, M. Destefanis, L. Fava, L. Ferrero, M. Greco, M. Maggiora, S. Marcello, S. Sosio, S. Spataro, L. Zotti, D. Calvo, S. Coli, P. De Remigis, A. Filippi, G. Giraudo, S. Lusso, G. Mazza, O. Morra, A. Rivetti, R. Wheadon, F. Iazzi, A. Lavagno, H. Younis, R. Birsa, F. Bradamante, A. Bressan, A. Martin, H. Clement, B. Galander, L. Caldeira Balkeståhl, H. Calén, K. Fransson, T. Johansson, A. Kupsc, P. Marciniewski, E. Thomé, M. Wolke, J. Zlomanczuk, J. Díaz, A. Ortiz, K. Dmowski, P. Duda, R. Korzeniewski, B. Slowinski, A. Chlopik, Z. Guzik, K. Kosinski, D. Melnychuk, A. Wasilewski, M. Wojciechowski, S. Wronka, A. Wysocka, B. Zwieglinski, P. Bühler, O. N. Hartman, P. Kienle, J. Marton, K. Suzuki, E. Widmann, J. Zmeskal
المصدر: The European Physical Journal A. 49
مصطلحات موضوعية: Straw tube, Nuclear and High Energy Physics, Spectrometer, Physics::Instrumentation and Detectors, 010308 nuclear & particles physics, Computer science, Detector, Tracking (particle physics), 01 natural sciences, Particle identification, NO, Set (abstract data type), Computer Science::Hardware Architecture, 0103 physical sciences, Trajectory, Benchmark (computing), Nuclear Experiment, 010306 general physics, Simulation
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المؤلفون: B. Lepley, E. Losson, K. Dmowski
المصدر: Physica Status Solidi (a). 156:413-420
مصطلحات موضوعية: Physics, Optics, business.industry, Condensed Matter Physics, business, Geomorphology, Smoothing, Electronic, Optical and Magnetic Materials
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المؤلفون: Dominique Vuillaume, B. Lepley, K. Dmowski
المصدر: Journal of Applied Physics. 79:1468-1475
مصطلحات موضوعية: Arrhenius equation, Deep-level transient spectroscopy, Chemistry, Analytical chemistry, General Physics and Astronomy, Modified method, Activation energy, Spectral line, symbols.namesake, Amplitude, Sampling (signal processing), symbols, Atomic physics, Maxima
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المؤلفون: K. Dmowski, Dominique Vuillaume, A. Bath, B. Lepley, E. Losson
المصدر: Review of Scientific Instruments. 66:4283-4288
مصطلحات موضوعية: Energy distribution, Materials science, Deep-level transient spectroscopy, Spectrometer, Silicon, Interface (computing), chemistry.chemical_element, law.invention, Capacitor, chemistry, law, State (computer science), Atomic physics, Instrumentation
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المؤلفون: A. Bath, B. Lepley, K. Dmowski, E. Losson
المصدر: Materials Science and Engineering: B. 32:51-55
مصطلحات موضوعية: Measure (data warehouse), Materials science, Deep-level transient spectroscopy, Deep level, Spectrometer, business.industry, Mechanical Engineering, Analytical chemistry, Condensed Matter Physics, Spectral line, Optics, Mechanics of Materials, General Materials Science, Transient (oscillation), business
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المؤلفون: K Dmowski
المصدر: Solid-State Electronics. 38:1051-1057
مصطلحات موضوعية: Deep-level transient spectroscopy, Materials science, Binomial (polynomial), Analytical chemistry, Condensed Matter Physics, Capacitance, Spectral line, Electronic, Optical and Magnetic Materials, Computational physics, Weighting, Simple (abstract algebra), Materials Chemistry, Correlation method, Electrical and Electronic Engineering, Transient spectroscopy
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المؤلفون: A. Jakubowski, K. Dmowski
المصدر: Journal of Applied Physics. 76:352-358
مصطلحات موضوعية: chemistry.chemical_compound, Tunnel effect, Deep-level transient spectroscopy, Binomial (polynomial), Chemistry, Oxide, General Physics and Astronomy, Atomic physics, Capacitance, Signal, Quantum tunnelling, Computational physics, Weighting
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المؤلفون: Jerzy Golimowski, K. Dmowski
المصدر: Science of The Total Environment. :251-258
مصطلحات موضوعية: Pollution, Environmental Engineering, media_common.quotation_subject, chemistry.chemical_element, Biology, Birds, Biomonitoring, Electrochemistry, Zinc smelting, medicine, Animals, Industry, Environmental Chemistry, Pica (disorder), Waste Management and Disposal, media_common, Cadmium, Geography, Ecology, Feathers, Metal pollution, Lead, chemistry, Feather, visual_art, Environmental chemistry, visual_art.visual_art_medium, Poland, medicine.symptom, Environmental Pollution, Bioindicator, Environmental Monitoring
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المؤلفون: B. Lepley, K. Dmowski, M. El Bouabdellati, E. Losson
المصدر: Journal of Applied Physics. 74:3936-3943
مصطلحات موضوعية: Optics, Deep-level transient spectroscopy, Spectrometer, Deep level, Chemistry, business.industry, Schottky barrier, General Physics and Astronomy, Numerical modeling, Schottky diode, business, Spectral line, Leakage (electronics)