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المؤلفون: J. S. Steckel, E. Josse, A. G. Pattantyus-Abraham, M. Bidaud, B. Mortini, H. Bilgen, O. Arnaud, S. Allegret-Maret, F. Saguin, L. Mazet, S. Lhostis, T. Berger, K. Haxaire, L. L. Chapelon, L. Parmigiani, P. Gouraud, M. Brihoum, P. Bar, M. Guillermet, S. Favreau, R. Duru, J. Fantuz, S. Ricq, D. Ney, I. Hammad, D. Roy, A. Arnaud, B. Vianne, G. Nayak, N. Virollet, V. Farys, P. Malinge, A. Tournier, F. Lalanne, A. Crocherie, J. Galvier, S. Rabary, O. Noblanc, H. Wehbe-Alause, S. Acharya, A. Singh, J. Meitzner, D. Aher, H. Yang, J. Romero, B. Chen, C. Hsu, K. C. Cheng, Y. Chang, M. Sarmiento, C. Grange, E. Mazaleyrat, K. Rochereau
المصدر: 2021 IEEE International Electron Devices Meeting (IEDM).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f9ba7ab2beceb487279311b475596647
https://doi.org/10.1109/iedm19574.2021.9720560 -
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المؤلفون: Gerard Ghibaudo, Antoine Cros, K. Rochereau, S. Bordez, A. Cathignol
المصدر: Solid-State Electronics. 53:127-133
مصطلحات موضوعية: business.industry, Chemistry, Flow (psychology), Electrical engineering, Biasing, Hardware_PERFORMANCEANDRELIABILITY, Condensed Matter Physics, Electrostatics, Electronic, Optical and Magnetic Materials, MOSFET, Hardware_INTEGRATEDCIRCUITS, Materials Chemistry, Rectangular potential barrier, Optoelectronics, Electrical and Electronic Engineering, Current (fluid), business, Voltage, Degradation (telecommunications)
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المؤلفون: Emmanuel Vincent, J. Armand, M. Valenza, Frédéric Martinez, K. Rochereau
المساهمون: Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Micro électronique, Composants, Systèmes, Efficacité Energétique (M@CSEE), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Institut de Microélectronique, Electromagnétisme et Photonique (IMEP), Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique de Grenoble (INPG)-Université Joseph Fourier - Grenoble 1 (UJF), Service de physique de l'état condensé (SPEC - UMR3680), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), Université Joseph Fourier - Grenoble 1 (UJF)-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS)
المصدر: Microelectronic Engineering
Microelectronic Engineering, Elsevier, 2007, 84 (9-10), pp.2382-2385. ⟨10.1016/j.mee.2007.04.099⟩
Microelectronic Engineering, 2007, 84 (9-10), pp.2382-2385. ⟨10.1016/j.mee.2007.04.099⟩مصطلحات موضوعية: Materials science, Infrasound, Trap profiles, Oxide, Time-dependent gate oxide breakdown, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 01 natural sciences, Noise (electronics), chemistry.chemical_compound, Gate oxide, 0103 physical sciences, MOSFET, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, Low frequency noise, 010302 applied physics, Noise measurement, business.industry, 020206 networking & telecommunications, Green's function, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, [SPI.TRON]Engineering Sciences [physics]/Electronics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry, Optoelectronics, Node (circuits), business, Hardware_LOGICDESIGN
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المؤلفون: L. Vishnubhotla, Pierre Morin, Robert Fox, S. Boret, R. Difrenza, B. Tavel, K. Rochereau, P. Stolk, C. Detcheverry, Daniel Gloria, M.T. Basso, M. Woo, M. Broekaart, B. Duriez, P. Garnier, D. Reber, Y. Trouille, J. Bienacel, M. Denais, D. Barge, C. Ortolland, K. Cooper, Frederic Boeuf, S. Vanbergue, Vincent Huard, Jean-Damien Chapon, J. Belledent, Pascal Gouraud, Nicolas Planes, Franck Arnaud, P. Abramowitz, E. Saboure, Y. Laplanche, C. Julien, M. Bidaud, M. Marin, Romain Gwoziecki
المصدر: Solid-State Electronics. 50:573-578
مصطلحات موضوعية: Engineering, business.industry, Transistor, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, Ring oscillator, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, law.invention, CMOS, law, Low-power electronics, Dynamic demand, Hardware_INTEGRATEDCIRCUITS, Materials Chemistry, Electronic engineering, Power semiconductor device, Flicker noise, Electrical and Electronic Engineering, business, Low voltage, NMOS logic
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المؤلفون: Andrew R. Brown, Alexander L. Shluger, Asen Asenov, A. Cathignol, K. Rochereau, Keith P. McKenna, D. Chanemougame, Binjie Cheng, Gerard Ghibaudo
المصدر: IEEE Electron Device Letters. 29:913-915
مصطلحات موضوعية: Materials science, Silicon, Condensed matter physics, business.industry, chemistry.chemical_element, Surface finish, Standard deviation, Electronic, Optical and Magnetic Materials, Threshold voltage, Semiconductor, chemistry, CMOS, MOSFET, Electronic engineering, Grain boundary, Electrical and Electronic Engineering, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::229a6d02b5b03908d8f9095fc60b99a8
https://doi.org/10.1109/led.2008.2000843
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المؤلفون: V. Huard, F. Martinez, M. Valenza, E. Vincent, J. Armand, P. Benoit, K. Rochereau
المساهمون: Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Micro électronique, Composants, Systèmes, Efficacité Energétique (M@CSEE), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics [Crolles] (ST-CROLLES)
المصدر: Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures
Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures, American Vacuum Society (AVS), 2009, 27 (3), pp.1129. ⟨10.1116/1.3130166⟩مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Infrasound, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, [SPI.TRON]Engineering Sciences [physics]/Electronics, Stress (mechanics), Burst noise, Semiconductor, 0103 physical sciences, MOSFET, Optoelectronics, Flicker noise, Field-effect transistor, Electrical and Electronic Engineering, 0210 nano-technology, business, Noise (radio)
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المؤلفون: Binjie Cheng, D. Chanemougame, K. Rochereau, Asen Asenov, Gerard Ghibaudo, A. Cathignol, Andrew R. Brown
المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS), Domenget, Chahla
المصدر: IEEE Electron Device Letters
IEEE Electron Device Letters, Institute of Electrical and Electronics Engineers, 2008, 29 (6), pp.609-611
HALمصطلحات موضوعية: 010302 applied physics, Materials science, Band gap, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Fermi level, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Electronic, Optical and Magnetic Materials, Computational physics, symbols.namesake, Low-power electronics, 0103 physical sciences, MOSFET, symbols, Electronic engineering, Miniaturization, Power semiconductor device, Grain boundary, Granularity, Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5780f2d7d72c482297cf7474e6d6dec8
https://hal.archives-ouvertes.fr/hal-00392652
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المؤلفون: K. Rochereau, Antoine Cros, S. Bordez, A. Cathignol, G. Ghibaudo
المصدر: 2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA).
مصطلحات موضوعية: Negative-bias temperature instability, Materials science, business.industry, Electrical engineering, Drain-induced barrier lowering, Hardware_PERFORMANCEANDRELIABILITY, Electrostatics, Threshold voltage, Modulation, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Current (fluid), business, Degradation (telecommunications)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a876a2f6adadb4e062d09ae2ebb13f8d
https://doi.org/10.1109/vtsa.2008.4530850 -
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المؤلفون: P. Benoit, Frédéric Martinez, C. Guerin, Emmanuel Vincent, K. Rochereau, J. Gyani, M. Valenza, Vincent Huard, J. Armand
المساهمون: Institut d’Electronique et des Systèmes (IES), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), Micro électronique, Composants, Systèmes, Efficacité Energétique (M@CSEE), Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics [Crolles] (ST-CROLLES)
المصدر: 2008 9th International Conference on Ultimate Integration on Silicon (ULIS)
2008 9th International Conference on Ultimate Integration on Silicon (ULIS), Mar 2008, Udine, France. pp.155-158, ⟨10.1109/ULIS.2008.4527162⟩مصطلحات موضوعية: 010302 applied physics, Condensed Matter::Quantum Gases, Materials science, business.industry, Infrasound, Analytical chemistry, Oxide, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Molecular physics, [SPI.TRON]Engineering Sciences [physics]/Electronics, Trap (computing), Stress (mechanics), chemistry.chemical_compound, chemistry, 0103 physical sciences, MOSFET, Microelectronics, Degradation (geology), 0210 nano-technology, business, Noise (radio)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::823b294cf7c340d7be01ef48ba26aa6d
https://hal.archives-ouvertes.fr/hal-02052984 -
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المؤلفون: Gerard Ghibaudo, S. Bordez, A. Cathignol, K. Rochereau
المصدر: 2007 IEEE International Conference on Microelectronic Test Structures.
مصطلحات موضوعية: Matching (statistics), Engineering, business.industry, Transistor, System testing, law.invention, Task (project management), Set (abstract data type), law, Distortion, MOSFET, Electronic engineering, Microelectronics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3032b0bdbd85d1ed734594983ff8018d
https://doi.org/10.1109/icmts.2007.374490
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