المؤلفون: T. C. C. Lavra, L. A. Silva, K. S. B. Cavalcante, K. L. L. Marinho, B. A. M. Figueira, J. M. Rivas Mercury

المصدر: Cerâmica, Vol 65, Iss 376, Pp 547-553 (2019)

مصطلحات موضوعية: synthesis, microwave radiation, birnessite, thermal analysis, spectroscopy, Engineering (General). Civil engineering (General), TA1-2040

وصف الملف: electronic resource

Relation: http://www.scielo.br/pdf/ce/v65n376/1678-4553-ce-65-376-547.pdf; http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0366-69132019000400007&tlng=en; https://doaj.org/toc/1678-4553

URL الوصول: https://doaj.org/article/8c1dc47e40304bd184c72c3bf78dba62

المؤلفون: Krishna Sasanka, K. S. B. S.^Aff5, Sree Sudha, T. Y.^Aff6, Chandran, Megha^Aff7, Kuotsu, Ruuzeno^Aff8, Varshney, Saurabh^Aff9

المساهمون: Timiri Shanmugam, Prakash Srinivasan, editor^Aff1, Thangaraju, Pugazhenthan, editor^Aff2, Sampath, Thamizharasan, editor^Aff3, Jagadeeswaran, Indumathy, editor^Aff4

المصدر: Significant and Nonsignificant Risk Medical Devices. :151-177

المؤلفون: Bansal, Adity^Aff5, Irom, Urmila^Aff6, Sree Sudha, T. Y.^Aff7, Krishna Sasanka, K. S. B. S.^Aff8

المساهمون: Timiri Shanmugam, Prakash Srinivasan, editor^Aff1, Thangaraju, Pugazhenthan, editor^Aff2, Sampath, Thamizharasan, editor^Aff3, Jagadeeswaran, Indumathy, editor^Aff4

المصدر: Significant and Nonsignificant Risk Medical Devices. :109-150

المؤلفون: Sree Sudha, T. Y.^Aff5, Sruthi, K. G.^Aff6, Mutsaddi, Shruti^Aff7, Sasanka, K. S. B. S. Krishna^Aff8, Sahay, Shikha^Aff9, Bansal, Adity^Aff10, Singh, Harminder^Aff5

المساهمون: Timiri Shanmugam, Prakash Srinivasan, editor^Aff1, Thangaraju, Pugazhenthan, editor^Aff2, Sampath, Thamizharasan, editor^Aff3, Jagadeeswaran, Indumathy, editor^Aff4

المصدر: Significant and Nonsignificant Risk Medical Devices. :281-328

المؤلفون: Varshney, Saurabh^{Aff1, Aff2, IDs12070022033848_cor1}, Angral, Sumeet, Aggarwal, Pradeep, Sharma, Suresh, Kumar, Narendra, Sasanka, K. S. B. S., Aanand, Prem

المصدر: Indian Journal of Otolaryngology and Head & Neck Surgery. 75(Suppl 1):380-392

المؤلفون: Saikrishna, K. S. B. S.^Aff8, Subalalitha, C. N.^Aff8

المساهمون: Howlett, Robert J., Series Editor^Aff1, Jain, Lakhmi C., Series Editor^Aff2, Satapathy, Suresh Chandra, editor^Aff3, Peer, Peter, editor^Aff4, Tang, Jinshan, editor^Aff5, Bhateja, Vikrant, editor^Aff6, Ghosh, Anumoy, editor^Aff7

المصدر: Intelligent Data Engineering and Analytics : Proceedings of the 9th International Conference on Frontiers in Intelligent Computing: Theory and Applications (FICTA 2021). 266:151-163

المؤلفون: Sanjaya, Kadek Heri, Yukhi Mustaqim, K. S. B., Saputra, Hendri Maja, Lusijarto, Teguh Tri, Subagio, Dalmasius Ganjar, Subekti, Ridwan Arief, Rajani, Ahmad

المصدر: AIP Conference Proceedings; 2024, Vol. 3069 Issue 1, p1-8, 8p

المؤلفون: T Y Sree Sudha, K S. B. S Krishna Sasanka, Pugazhenthan Thangaraju, Ruuzeno Kuotsu, Akanksha G William

المصدر: Journal of Family Medicine and Primary Care, Vol 11, Iss 12, Pp 7850-7856 (2022)

مصطلحات موضوعية: long-haul covid, post-covid symptoms, post-covid syndrome, sars-cov-2 infection, Medicine

وصف الملف: electronic resource

Relation: http://www.jfmpc.com/article.asp?issn=2249-4863;year=2022;volume=11;issue=12;spage=7850;epage=7856;aulast=Sree; https://doaj.org/toc/2249-4863

URL الوصول: https://doaj.org/article/8aa8103b229c46bb85c30423daa9d898

المؤلفون: Thennakoon, H. M. K. S. B.^Aff10, Ariyarathne, S. M. W. T. P. K. T.^Aff10, Danthurebandara, M.^Aff10

المساهمون: di Prisco, Marco, Series Editor^Aff1, Chen, Sheng-Hong, Series Editor^Aff2, Vayas, Ioannis, Series Editor^Aff3, Kumar Shukla, Sanjay, Series Editor^Aff4, Sharma, Anuj, Series Editor^Aff5, Kumar, Nagesh, Series Editor^Aff6, Wang, Chien Ming, Series Editor^Aff7, Dissanayake, Ranjith, editor^Aff8, Mendis, Priyan, editor^Aff9

المصدر: ICSBE 2018 : Proceedings of the 9th International Conference on Sustainable Built Environment. 44:288-294

المؤلفون: De Silva, K. S. B., Xu, X., Li, W. X., Zhang, Y., Rindfleisch, M., Tomsic, M.

المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 21(3):2686-2689 Jun, 2011