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1
المؤلفون: L. Haspeslagh, Bogdan Govoreanu, Pieter Blomme, David P. Brunco, J. De Vos, D. Ruiz Aguado, Dirk Wellekens, K. van der Zanden, J. Van Houdt
المصدر: Solid-State Electronics. 52:557-563
مصطلحات موضوعية: Materials science, business.industry, Integrated circuit, Condensed Matter Physics, Flash memory, Electronic, Optical and Magnetic Materials, law.invention, Non-volatile memory, Reliability (semiconductor), Stack (abstract data type), law, Materials Chemistry, Electronic engineering, Erasure, Optoelectronics, Electrical and Electronic Engineering, Metal gate, business, High-κ dielectric
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2
المؤلفون: E.-O. Andersen, K. van der Zanden, Y. Gong, L. Pescini, R. Allinger, R. Kakoschke, J.R. Power
المصدر: Solid-State Electronics. 52:550-556
مصطلحات موضوعية: Engineering, business.industry, Electrical engineering, High voltage, Integrated circuit, Dielectric, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, law.invention, Flash (photography), Reliability (semiconductor), law, Materials Chemistry, Optoelectronics, Erasure, Electrical and Electronic Engineering, business, High-κ dielectric, Voltage
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3
المؤلفون: Arnaud Furnemont, K. De Meyer, J. Van Houdt, Maarten Rosmeulen, Herman Maes, K. van der Zanden
المصدر: IEEE Transactions on Electron Devices. 54:1351-1359
مصطلحات موضوعية: Annealing (metallurgy), Chemistry, Oxide, Analytical chemistry, Nitride, Electronic, Optical and Magnetic Materials, Threshold voltage, Non-volatile memory, Tunnel effect, chemistry.chemical_compound, Chemical physics, Electrical measurements, Electrical and Electronic Engineering, Quantum tunnelling
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4
المؤلفون: Bart Nauwelaers, K. van der Zanden, W De Raedt, Dominique Schreurs, Servaas Vandenberghe, Geert Carchon
المصدر: International Journal of RF and Microwave Computer‐Aided Engineering. 10:81-90
مصطلحات موضوعية: Overdetermined system, Propagation of uncertainty, Optimization problem, Computer science, Estimation theory, Electronic engineering, Equivalent circuit, Parasitic extraction, High-electron-mobility transistor, Electrical and Electronic Engineering, Measure (mathematics), Computer Graphics and Computer-Aided Design, Computer Science Applications
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4489064821973b7428d8b6d16ffdfc0d
https://doi.org/10.1002/(sici)1099-047x(200001)10:1<81::aid-mmce9>3.3.co;2-g -
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المؤلفون: K. van der Zanden, W. De Raedt, M. Valenza, H. van Meer, Eddy Simoen
المصدر: Solid-State Electronics. 43:1797-1800
مصطلحات موضوعية: Materials science, business.industry, Noise spectral density, Schottky barrier, Noise intensity, Low frequency, Condensed Matter Physics, Noise (electronics), Electronic, Optical and Magnetic Materials, Computer Science::Hardware Architecture, Materials Chemistry, Optoelectronics, Flicker noise, Electrical and Electronic Engineering, business, Gate current
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6
المصدر: IEEE Transactions on Electron Devices. 46:1570-1576
مصطلحات موضوعية: Phase difference, Materials science, Passivation, business.industry, Schottky diode, High-electron-mobility transistor, Electronic, Optical and Magnetic Materials, Reliability study, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, FET's, indium compounds, MODFET's, reliability testing, stress, testing, business, Transmission-line pulse, Voltage, Leakage (electronics)
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7
المؤلفون: Maarten Rosmeulen, Herman Maes, K. van der Zanden, K. De Meyer, Arnaud Furnemont, J. Van Houdt
المصدر: IEEE Electron Device Letters. 28:276-278
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, business.industry, Electrical engineering, Electron hole, Integrated circuit, Electron, Nitride, Electronic, Optical and Magnetic Materials, law.invention, Non-volatile memory, law, Optoelectronics, Electrical and Electronic Engineering, Data retention, business, Voltage, Hot-carrier injection
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8Low-frequency drain current noise behavior of InP based MODFET's in the linear and saturation regime
المؤلفون: Eddy Simoen, K. van der Zanden, W. De Raedt, H. van Meer, M. Valenza
المصدر: IEEE Transactions on Electron Devices. 45:2475-2482
مصطلحات موضوعية: Physics, Noise power, Infrasound, Spectral density, Low frequency, Electronic, Optical and Magnetic Materials, Computational physics, chemistry.chemical_compound, chemistry, Phase noise, Electronic engineering, Indium phosphide, Flicker noise, Electrical and Electronic Engineering, Saturation (magnetic)
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9
المؤلفون: J. Bentell, K. van der Zanden, U. Van Bogget, T. Colin, P. Merken, J. Vermeiren
المصدر: Proceedings of the 2012 International Conference on Quantitative InfraRed Thermography.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8eb579665a150be9eaff4e53cc884f62
https://doi.org/10.21611/qirt.2012.389 -
10
المؤلفون: P Mijlemans, K. van der Zanden, Dominique Schreurs, Gustaaf Borghs
المصدر: IEEE Electron Device Letters. 21:57-59
مصطلحات موضوعية: Materials science, business.industry, Transconductance, Transistor, Electrical engineering, chemistry.chemical_element, Germanium, Epitaxy, Capacitance, Electronic, Optical and Magnetic Materials, law.invention, Gallium arsenide, chemistry.chemical_compound, chemistry, law, Optoelectronics, Dry etching, Electrical and Electronic Engineering, Reactive-ion etching, business