المؤلفون: Laleni, Nellie, Padma, Sahana, Kampfe, Thomas, Jang, Taekwang

المصدر: 2024 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2024 IEEE International Symposium on. :1-5 May, 2024

Relation: 2024 IEEE International Symposium on Circuits and Systems (ISCAS)

المؤلفون: Lederer, Maximilian, Muller, Franz, Hoffmann, Raik, Olivo, Ricardo, Raffel, Yannick, Yang, Shouzhuo, De, Sourav, Potjan, Roman, Ostien, Oliver, Altawil, Abdelrahman, Sunbul, Ayse, Lehninger, David, Kampfe, Thomas, Seidel, Konrad

المصدر: 2024 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2024 IEEE International. :1-4 May, 2024

Relation: 2024 IEEE International Memory Workshop (IMW)

المؤلفون: Vardar, Alptekin, Muller, Franz, Gecin, Ipek, Laleni, Nellie, Kampfe, Thomas

المصدر: 2024 IEEE 6th International Conference on AI Circuits and Systems (AICAS) AI Circuits and Systems (AICAS), 2024 IEEE 6th International Conference on. :258-262 Apr, 2024

Relation: 2024 IEEE 6th International Conference on AI Circuits and Systems (AICAS)

المؤلفون: Sunbul, Ayse, Lehninger, David, Hoffmann, Raik, Mahne, Hannes, Bernert, Kerstin, Thiem, Steffen, Kampfe, Thomas, Siedel, Konrad, Lederer, Maximilian, Eng, Lukas M.

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-5 Apr, 2024

Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Xu, Zhicheng, Liu, Che-Kai, Li, Chao, Mao, Ruibin, Yang, Jianyi, Kampfe, Thomas, Imani, Mohsen, Li, Can, Zhuo, Cheng, Yin, Xunzhao

المصدر: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-6 Mar, 2024

Relation: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Xu, Haotian, Yang, Jianyi, Zhuo, Cheng, Kampfe, Thomas, Ni, Kai, Yin, Xunzhao

المصدر: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-6 Mar, 2024

Relation: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Li, Taixin, Zhong, Hongtao, Wu, Juejian, Kampfe, Thomas, Ni, Kai, Narayanan, Vijaykrishnan, Yang, Huazhong, Li, Xueqing

المصدر: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-6 Mar, 2024

Relation: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Huang, Qingrong, Barkam, Hamza Errahmouni, Yang, Zeyu, Yang, Jianyi, Kampfe, Thomas, Ni, Kai, Zhang, Grace Li, Li, Bing, Schlichtmann, Uif, Imani, Mohsen, Zhuo, Cheng, Yin, Xunzhao

المصدر: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-6 Mar, 2024

Relation: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Deng, Shan, Xiao, Yi, Zhao, Zijian, Huang, Tzu-Jung, Kampfe, Thomas, Narayanan, Vijaykrishnan, Ni, Kai

المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)

المؤلفون: Chatterjee, Swetaki, Kumar, Shubham, Sunil, Athira, De, Sourav, Lehninger, David, Jank, Michael, Kampfe, Thomas, Chauhan, Yogesh Singh, Amrouch, Hussam

المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023

Relation: 2023 International Electron Devices Meeting (IEDM)