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لا يتم عرض هذه النتيجة على الضيوف.
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المؤلفون: Park C; School of Electrical Engineering, Korea University, 5-1 Anam, Sungbuk, Seoul 136-701, Korea., Lee S, Choi M, Kang M, Jung Y, Hwang S, Ahn D, Lee J, Song C

المصدر: Journal of nanoscience and nanotechnology [J Nanosci Nanotechnol] 2007 Nov; Vol. 7 (11), pp. 4150-3.

نوع المنشور: Journal Article; Research Support, Non-U.S. Gov't

بيانات الدورية: Publisher: American Scientific Publishers Country of Publication: United States NLM ID: 101088195 Publication Model: Print Cited Medium: Print ISSN: 1533-4880 (Print) Linking ISSN: 15334880 NLM ISO Abbreviation: J Nanosci Nanotechnol Subsets: MEDLINE

مواضيع طبية MeSH: Transistors, Electronic*, Crystallization/*methods , Imides/*chemistry , Nanostructures/*chemistry , Nanostructures/*ultrastructure , Nanotechnology/*instrumentation , Silicon/*chemistry, Equipment Design ; Equipment Failure Analysis ; Materials Testing ; Nanotechnology/methods ; Particle Size ; Plastics/chemistry