المؤلفون: Lee, Hyunui, Kang, Sukyong, Yu, Hye-Seung, Yun, Won-Joo, Jung, Jae-Hun, Ahn, Sungoh, Kim, Wang-Soo, Kil, Beomyong, Sung, Yoo-Chang, Shin, Sang-Hoon, Park, Yong-Sik, Kim, Yong-Hwan, Nam, Kyung-Woo, Song, Indal, Sohn, Kyomin, Bae, Yong-Cheol, Choi, Jung-Hwan, Jang, Seong-Jin, Jin, Gyo-Young

المصدر: 2016 IEEE Asian Solid-State Circuits Conference (A-SSCC) Solid-State Circuits Conference (A-SSCC), 2016 IEEE Asian. :169-172 Nov, 2016

Relation: 2016 IEEE Asian Solid-State Circuits Conference (A-SSCC)

المؤلفون: Yoo-Chang Sung, Seong-Jin Jang, Jung-Hwan Choi, Gyo-Young Jin, Sang-hoon Shin, Yong-Hwan Kim, Beomyong Kil, Kim Wang-Soo, Hye-Seung Yu, Yong-Cheol Bae, S.J. Ahn, Won-Joo Yun, Jae-Hun Jung, Kang Sukyong, Kyung-woo Nam, Hyunui Lee, Kyomin Sohn, In-Dal Song, Park Yong-Sik

المصدر: A-SSCC

مصطلحات موضوعية: Engineering, business.industry, 020208 electrical & electronic engineering, Bandwidth (signal processing), 02 engineering and technology, High Bandwidth Memory, law.invention, Phase-locked loop, Automatic test equipment, law, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Resistor, business, Electrical impedance, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::13371010392315c40c16666119735ceb
https://doi.org/10.1109/asscc.2016.7844162