المؤلفون: Jin-Ping Han, Malte J. Rasch, Zuoguang Liu, Paul Solomon, Kevin Brew, Kangguo Cheng, Injo Ok, Victor Chan, Michael Longstreet, Wanki Kim, Robert L. Bruce, Cheng-Wei Cheng, Nicole Saulnier, Vijay Narayanan

المصدر: Advanced Intelligent Systems, Vol 4, Iss 5, Pp n/a-n/a (2022)

مصطلحات موضوعية: analog RPU inference, deep-learning networks, flicker noise, hardware awareness training, PCM, weight drift, Computer engineering. Computer hardware, TK7885-7895, Control engineering systems. Automatic machinery (General), TJ212-225

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2640-4567

URL الوصول: https://doaj.org/article/cd4b4e542e274fda8fb5ec86f7016fcd

المؤلفون: Lee, S.H., Kim, Y.K., Lee, Y.H., Kang, H.S., Ahn, C.G., Kang, B.K., Jinju Lee, Kangguo Cheng, Zhi Chen, Hess, K., Lyding, J.W.

المصدر: 1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395) Plasma process-induced damage Plasma Process-Induced Damage, 1999 4th International Symposium on. :188-191 1999

Relation: 1999 4th International Symposium on Plasma Process-Induced Damage

المؤلفون: Young-Kwang Kim, Seok-Ha Lee, Hyui-Seung Lee, Bong-Seok Kim, Yong-Hee Lee, Jinju Lee, Kangguo Cheng, Zhi Chen, Hess, K., Lyding, J.W.

المصدر: 1999 4th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.99TH8395) Plasma process-induced damage Plasma Process-Induced Damage, 1999 4th International Symposium on. :65-68 1999

Relation: 1999 4th International Symposium on Plasma Process-Induced Damage

المؤلفون: Kangguo Cheng, Lyding, J.W.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 24(10):655-657 Oct, 2003

المؤلفون: Kangguo Cheng, Lyding, J.W.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 24(7):487-489 Jul, 2003

المؤلفون: Kangguo Cheng, Jinju Lee, Karl, H., Lyding, J.W., Young-Kwang Kim, Young-Wug Kim, Kwang-Pyuk Suh

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 49(3):529-531 Mar, 2002

المؤلفون: Kangguo Cheng, Hess, K., Lyding, J.W.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 22(9):441-443 Sep, 2001

المؤلفون: Zhi Chen, Kangguo Cheng, Jinju Lee, Lyding, J.W., Hess, K., Chetlur, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 48(4):813-815 Apr, 2001

المؤلفون: Jinju Lee, Kangguo Cheng, Zhi Chen, Hess, K., Lyding, J.W., Young-Kwang Kim, Hyui-Seung Lee, Young-Wug Kim, Kwang-Pyuk Suh

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 21(5):221-223 May, 2000

المؤلفون: Kangguo Cheng, Lyding, J.W.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 24(11):710-710 Nov, 2003