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المصدر: 2014 International Test Conference Test Conference (ITC), 2014 IEEE International. :1-8 Oct, 2014

Relation: 2014 IEEE International Test Conference (ITC)

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Relation: 2011 IEEE International Solid- State Circuits Conference - (ISSCC)

المؤلفون: Lai, Jie-Wei, Wang, Chi-Hsueh, Kao, Kaipon, Lin, Anson, Cho, Yi-Hsien, Cho, Lanchou, Hung, Meng-Hsiung, Shih, Xin-Yu, Lin, Che-Min, Yan, Sheng-Hong, Chung, Yuan-Hung, Liang, Paul C.P., Dehng, Guang-Kaai, Li, Hung-Sung, Chien, George, Staszewski, Robert Bogdan

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Relation: 2013 IEEE International Solid-State Circuits Conference - (ISSCC)