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1مؤتمر
المؤلفون: Feinberg, A., Ersland, P., Widom, A., Kaper, V.
المصدر: Annual Reliability and Maintainability Symposium, 2005. Proceedings. Reliability and Maintainability Reliability and Maintainability Symposium, 2005. Proceedings. Annual. :266-270 2005
Relation: Annual Reliability and Maintainability Symposium. 2005 Proceedings
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2مؤتمر
المؤلفون: Kaper, V., Thompson, R., Prunty, T., Shealy, J.R.
المصدر: 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) Microwave symposium digest Microwave Symposium Digest, 2004 IEEE MTT-S International. 2:1145-1148 Vol.2 2004
Relation: 2004 IEEE MTT-S International Microwave Symposium Digest
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3مؤتمر
المؤلفون: Kaper, V., Tilak, V., Green, B., Thompson, R., Prunty, T., Eastman, L.F., Shealy, J.R.
المصدر: 61st ARFTG Conference Digest, Spring 2003. ARFTG Conference Digest, Spring 2003. 61st. :97-102 2003
Relation: 61st ARFTG Conference Digest, Spring 2003.
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4مؤتمر
المؤلفون: Kaper, V., Tilak, V., Green, B., Prunty, T., Smart, J., Eastman, L.F., Shealy, J.R.
المصدر: Proceedings. IEEE Lester Eastman Conference on High Performance Devices High performance devices High Performance Devices, 2002. Proceedings. IEEE Lester Eastman Conference on. :118-125 2002
Relation: IEEE Lester Eastmann Biennial Conference
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5مؤتمر
المؤلفون: Kaper, V., Ersland, P.
المصدر: 1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459) GaAs reliability GaAs Reliability Workshop, 1999. Proceedings. :61-68 1999
Relation: 1999 GaAs Reliability Workshop. Proceedings
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6مؤتمر
المؤلفون: Kaper, V., Gao, F., Ersland, P.
المصدر: 1998 GaAs Reliability Workshop. Proceedings (Cat. No.98EX219) GaAs reliability workshop GaAs Reliability Workshop, 1998. Proceedings. :63-68 1998
Relation: 1998 GaAs Reliability Workshop. Proceedings
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7مؤتمر
المؤلفون: Thompson, R., Kaper, V., Prunty, T., Shealy, J.R.
المصدر: 25th Annual Technical Digest 2003. IEEE Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 2003. GaAs IC symposium Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 2003. 25th Annual Technical Digest 2003. IEEE. :298-300 2003
Relation: GaAs IC Symposium. 25th Annual Technical Digest 2003
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8دورية أكاديمية
المؤلفون: Thompson, R., Prunty, T., Kaper, V., Shealy, J.R.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(2):292-295 Feb, 2004
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9دورية أكاديمية
المؤلفون: Tilak, V., Green, B., Kaper, V., Kim, H., Prunty, T., Smart, J., Shealy, J., Eastman, L.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 22(11):504-506 Nov, 2001
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10دورية أكاديمية
المؤلفون: Cha, Ho-Young, Choi, Y. C., Thompson, R. M., Kaper, V., Shealy, J. R., Eastman, L. F., Spencer, M. G.
المصدر: Journal of Electronic Materials. August 2004 33(8):908-911