يعرض 1 - 10 نتائج من 10 نتيجة بحث عن '"Karel, Amit"', وقت الاستعلام: 1.10s تنقيح النتائج
  1. 1
    مؤتمر
    Bistatic MIMO System with Uniform Circular Arc Arrays for Single near Field Target Localization

    المؤلفون: Du, Jinze, Wu, Bin, Yang, Yi, Yuan, Chao, Singh, Parth Raj, Karel, Amit, Li, Lian

    المصدر: 2018 10th International Conference on Communication Software and Networks (ICCSN) Communication Software and Networks (ICCSN), 2018 10th International Conference on. :357-360 Jul, 2018

    Relation: 2018 10th International Conference on Communication Software and Networks (ICCSN)

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  2. 2
    مؤتمر
    Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies

    المؤلفون: Karel, Amit, Azais, Florence, Comte, Mariane, Galliere, Jean-Marc, Renovell, Michel

    المصدر: 2018 IEEE 19th Latin-American Test Symposium (LATS) Test Symposium (LATS), 2018 IEEE 19th Latin-American. :1-5 Mar, 2018

    Relation: 2018 IEEE 19th Latin-American Test Symposium (LATS)

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  3. 3
    مؤتمر
    Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology

    المؤلفون: Karel, Amit, Azais, Florence, Comte, Mariane, Galliere, Jean-Marc, Renovell, Michel, Singh, Keshav

    المصدر: 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ISVLSI VLSI (ISVLSI), 2017 IEEE Computer Society Annual Symposium on. :320-325 Jul, 2017

    Relation: 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

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  4. 4
    مؤتمر
    Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI -- LVT and RVT Configurations

    المؤلفون: Karel, Amit, Comte, Mariane, Galliere, Jean-Marc, Azais, Florence, Renovell, Michel

    المصدر: 2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) VLSI (ISVLSI), 2016 IEEE Computer Society Annual Symposium on. :164-169 Jul, 2016

    Relation: 2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

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  5. 5
    مؤتمر
    Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect

    المؤلفون: Karel, Amit, Comte, Mariane, Galliere, Jean-Marc, Azais, Florence, Renovell, Michel

    المصدر: 2016 17th Latin-American Test Symposium (LATS) Test Symposium (LATS), 2016 17th Latin-American. :129-134 Apr, 2016

    Relation: 2016 17th Latin-American Test Symposium (LATS)

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  6. 6
    مؤتمر
    Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions

    المؤلفون: Karel, Amit, Azais, Florence, Comte, Mariane, Galliere, Jean-Marc, Renovell, Michel, Singh, Keshav

    المصدر: 2017 22nd IEEE European Test Symposium (ETS) Test Symposium (ETS), 2017 22nd IEEE. :1-2 May, 2017

    Relation: 2017 22nd IEEE European Test Symposium (ETS)

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  7. 7
    دورية أكاديمية
    Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies

    المؤلفون: Karel, Amit, Azaïs, FlorenceAff1, Comte, Mariane, Gallière, Jean-Marc, Renovell, Michel

    المصدر: Journal of Electronic Testing: Theory and Applications. 35(1):59-75

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  8. 8
    دورية أكاديمية
    Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies

    المؤلفون: Karel, Amit, Comte, Mariane, Galliere, Jean-Marc, Azais, Florence, Renovell, Michel

    المصدر: Journal of Electronic Testing: Theory and Applications. August 2017 33(4):515-527

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  9. 9
    Comparative Study of FinFET and FDSOI Nanometric Technologies Based on Manufacturing Defect Testability

    المؤلفون: Karel, Amit

    المساهمون: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier (LIRMM), Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM), Université Montpellier, Michel Renovell

    المصدر: Micro and nanotechnologies/Microelectronics. Université Montpellier, 2017. English. ⟨NNT : 2017MONTS084⟩

    مصطلحات موضوعية: Technology, FinFET, Fd-Soi, Test orienté défauts, Technologie, Defect-Oriented Testing, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Testability, Testabilité

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=od_______212::f8d24e55a26c083f55259922881406ad
    https://tel.archives-ouvertes.fr/tel-01952734

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  10. 10
    دورية أكاديمية

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