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المؤلفون: Song Yongliang, Karry Chien, Jeff Wu, Atman Zhao Yong, Zhaoxing Chen, Zhuo Song
المصدر: ECS Transactions. 52:947-952
مصطلحات موضوعية: Work (thermodynamics), Materials science, Failure mechanism, Stress conditions, NMOS logic, Simulation, Voltage, Hot-carrier injection, Degradation (telecommunications), PMOS logic, Reliability engineering