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المؤلفون: Maximilian W. Feil, Katja Waschneck, Hans Reisinger, Judith Berens, Thomas Aichinger, Paul Salmen, Gerald Rescher, Wolfgang Gustin, Tibor Grasser
المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dc2e7effeb63e0564acf63299000578e
https://doi.org/10.1109/irps48203.2023.10117740 -
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المؤلفون: Michael Waltl, Yoanlys Hernandez, Christian Schleich, Katja Waschneck, Bernhard Stampfer, Hans Reisinger, Tibor Grasser
المصدر: Materials Science Forum. 1062:688-695
مصطلحات موضوعية: Mechanics of Materials, Mechanical Engineering, General Materials Science, Condensed Matter Physics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5d68b1c6038bbcc1e27fea2941213465
https://doi.org/10.4028/p-pijkeu -
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المؤلفون: Maximilian W. Feil, Hans Reisinger, Dominic Waldhoer, Michael Waltl, Tibor Grasser, Katja Waschneck, Christian Schleich
المصدر: IEEE Transactions on Electron Devices. 68:4016-4021
مصطلحات موضوعية: Materials science, Silicon, business.industry, chemistry.chemical_element, Trapping, Temperature measurement, Electronic, Optical and Magnetic Materials, Threshold voltage, Stress (mechanics), chemistry.chemical_compound, chemistry, MOSFET, Silicon carbide, Optoelectronics, Transient (oscillation), Electrical and Electronic Engineering, business
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المؤلفون: Gerald Rescher, Katja Waschneck, Hans Reisinger, Thomas Aichinger, Maximilian W. Feil, P. Salmen
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Test procedures, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Stability (probability), Stress (mechanics), chemistry.chemical_compound, Reliability (semiconductor), chemistry, Stress test, 0103 physical sciences, MOSFET, Silicon carbide, 0210 nano-technology, Simulation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7126ada1b4702033392bceecb19da26b
https://doi.org/10.1109/irps46558.2021.9405207 -
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المؤلفون: Katja Waschneck, Peter Rotter, Christian Schlunder, Franz Ungar, Hans Reisinger, Georg Georgakos, Susanne Lachenmann
المصدر: IRPS
مصطلحات موضوعية: Interconnection, Reliability (semiconductor), Product design, Circuit design, Hardware_INTEGRATEDCIRCUITS, Electronic design automation, Circuit reliability, Reliability engineering, Task (project management), Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::599940aa00906bdceb94f601027326b9
https://doi.org/10.1109/irps.2019.8720457