يعرض 1 - 10 نتائج من 102 نتيجة بحث عن '"Kee-Soo Nam"', وقت الاستعلام: 1.06s تنقيح النتائج
  1. 1
    مؤتمر
    Trench corner rounding technology using hydrogen annealing for highly reliable trench DMOSFETs

    المؤلفون: Sang-Gi Kim, Jongdae Kim, Jin Gun Koo, Kee Soo Nam, Kyoung-Ik Cho

    المصدر: 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094) Power semiconductor devices and ICs Power Semiconductor Devices and ICs, 2000. Proceedings. The 12th International Symposium on. :87-90 2000

    Relation: 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings

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  2. 2
    مؤتمر
    High-density low on-resistance trench MOSFETs employing oxide spacers and self-align technique for DC/DC converter

    المؤلفون: Jongdae Kim, Tae Moon Rob, Sang-Gi Kim, Song, Q.S., Jin Gun Koo, Kee Soo Nam, Kyoung-Ik Cho, Dong Sung Ma

    المصدر: 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094) Power semiconductor devices and ICs Power Semiconductor Devices and ICs, 2000. Proceedings. The 12th International Symposium on. :381-384 2000

    Relation: 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings

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  3. 3
    مؤتمر
    Reliability investigation of ultrathin oxides grown by high pressure oxidation and nitrided in N/sub 2/O for ULSI device applications

    المؤلفون: Tae Moon Roh, Dae Woo Lee, Jongdae Kim, Kyu Ha Baek, Jin Gun Koo, Duk Dong Lee, Kee-Soo Nam

    المصدر: Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and failure analysis of integrated circuits Physical & Failure Analysis of Integrated Circuits, 1997., Proceedings of the 1997 6th International Symposium on. :7-11 1997

    Relation: Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits

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  4. 4
    مؤتمر
    Optimization of high Q CMOS-compatible microwave inductors using silicon CMOS technology

    المؤلفون: Min Park, Seonghearn Lee, Hyun Kyu Yu, Kee Soo Nam

    المصدر: 1997 IEEE MTT-S International Microwave Symposium Digest Microwave symposium Microwave Symposium Digest, 1997., IEEE MTT-S International. 1:129-132 vol.1 1997

    Relation: 1997 IEEE MTT-S International Microwave Symposium Digest

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  5. 5
    مؤتمر
    CMOS layout and bias optimization for RF IC design applications

    المؤلفون: Cheon Soo Kim, Hyun Kyu Yu, Hanjin Cho, Seonghearn Lee, Kee Soo Nam

    المصدر: 1997 IEEE MTT-S International Microwave Symposium Digest Microwave symposium Microwave Symposium Digest, 1997., IEEE MTT-S International. 2:945-948 vol.2 1997

    Relation: 1997 IEEE MTT-S International Microwave Symposium Digest

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  6. 6
    مؤتمر
    High Q microwave inductors in CMOS double-metal technology and its substrate bias effects for 2 GHz RF ICs application

    المؤلفون: Min Park, Cheon Soo Kim, Jong Moon Park, Hyun Kyu Yu, Kee Soo Nam

    المصدر: International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :59-62 1997

    Relation: International Electron Devices Meeting. IEDM Technical Digest

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  7. 7
    دورية أكاديمية
    The detailed analysis of high Q CMOS-compatible microwave spiral inductors in silicon technology

    المؤلفون: Min Park, Seonghearn Lee, Cheon Soo Kim, Hyun Kyu Yu, Kee Soo Nam

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 45(9):1953-1959 Sep, 1998

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  8. 8
    دورية أكاديمية
    Plasma electron density generated by a semiconductor bridge as a function of input energy and land material

    المؤلفون: Jongdae Kim, Kee-Soo Nam, Jungling, K.C.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 44(6):1022-1026 Jun, 1997

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  9. 9
    دورية أكاديمية
    A novel simplified process for fabricating a very high density p-channel trench gate power MOSFET

    المؤلفون: Kee Soo Nam, Ju Wook Lee, Sang-Gi Kim, Tae Moon Roh, Hoon Soo Park, Jin Gun Koo, Kyung Ik Cho

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 21(7):365-367 Jul, 2000

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  10. 10
    دورية أكاديمية
    Unique extraction of substrate parameters of common-source MOSFETs

    المؤلفون: Chung-Hwan Kim, Cheon Soo Kim, Hyun Kyu Yu, Kee Soo Nam

    المصدر: IEEE Microwave and Guided Wave Letters IEEE Microw. Guid. Wave Lett. Microwave and Guided Wave Letters, IEEE. 9(3):108-110 Mar, 1999

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