المؤلفون: Ghosh, S., Mukhopadhyay, S., Keejong Kim, Roy, K.

المصدر: 2006 43rd ACM/IEEE Design Automation Conference Design Automation Conference Design Automation Conference, 2006 43rd ACM/IEEE. :971-976 2006

Relation: 2006 Design Automation Conference

المؤلفون: Kulkarni, Jaydeep P., Keejong Kim, Park, Sang Phill, Roy, Kaushik

المصدر: 2008 45th ACM/IEEE Design Automation Conference Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE. :108-113 Jun, 2008

Relation: 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

المؤلفون: Saibal Mukhopadhyay, Swaroop Ghosh, Keejong Kim, Kaushik Roy

المصدر: 2006 IEEE International SOC Conference SOC Conference, 2006 IEEE International. :155-159 Sep, 2006

Relation: 2006 IEEE International SOC Conference

المؤلفون: Soonsung Hong, Youngsup Choi, Keejong Kim, Juae Park, A. Mbaya, L. Madzingaidzo, J Nzuma

المصدر: Journal of the Korean Society of International Agricultue. 32:320-326

مصطلحات موضوعية: Tenderness, Horticulture, Income security, Yield (wine), Capitata, Industry standard, medicine, Randomized block design, Brassica, Leafy vegetables, medicine.symptom, Biology, biology.organism_classification

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7c2f1c2c176ef44063072a98a40e37e5
https://doi.org/10.12719/ksia.2020.32.4.320

المؤلفون: K. Roy, Keejong Kim, Ik Joon Chang, Jae-Joon Kim

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 19:1429-1437

مصطلحات موضوعية: Engineering, Pass transistor logic, business.industry, Clock signal, Logic family, Logic level, Hardware and Architecture, Clock domain crossing, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, CPU core voltage, Electrical and Electronic Engineering, business, Software, Dynamic logic (digital electronics), Asynchronous circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2bdf85bc9faf09de566d85dc677052c4
https://doi.org/10.1109/tvlsi.2010.2051240

المؤلفون: Keejong Kim, Kaushik Roy, Sang Phill Park, Kunhyuk Kang

المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 18:270-280

مصطلحات موضوعية: Engineering, business.industry, Circuit design, Hardware_PERFORMANCEANDRELIABILITY, Phase detector, Process variation, Phase-locked loop, Voltage-controlled oscillator, Reliability (semiconductor), CMOS, Hardware and Architecture, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Electrical and Electronic Engineering, business, Software, Electronic circuit

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5b4bbdbc72fc7466372dec5d674d0abf
https://doi.org/10.1109/tvlsi.2008.2010399

المؤلفون: Kaushik Roy, Keejong Kim, Hamid Mahmoodi

المصدر: Department of Electrical and Computer Engineering Faculty Publications

مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Energy dissipation, Electrical engineering, Static random access storage, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, Program processors, Chip, Capacitance, Power (physics), law.invention, Process variation, Electric potential, Charge transfer, CMOS, law, Low-power electronics, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Static random-access memory, Electrical and Electronic Engineering, business

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::60a3801eca01dc16703b5e0bc9882674
https://doi.org/10.1109/jssc.2007.914294

المؤلفون: Kaushik Roy, Keejong Kim, Jaydeep P. Kulkarni

المصدر: IEEE Journal of Solid-State Circuits. 42:2303-2313

مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Subthreshold conduction, Electrical engineering, Process corners, Process variation, CMOS, Memory cell, Schmitt trigger, Low-power electronics, Electronic engineering, Static random-access memory, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b15589c07baf2129f23da0a609522a18
https://doi.org/10.1109/jssc.2007.897148

المؤلفون: Kaushik Roy, Keejong Kim, Saibal Mukhopadhyay, Hamid Mahmoodi

المصدر: IEEE Journal of Solid-State Circuits. 42:1370-1382

مصطلحات موضوعية: Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit design, Ring oscillator, Integrated circuit, Process corners, law.invention, Process variation, CMOS, law, Electronic engineering, Static random-access memory, Electrical and Electronic Engineering, business, Parametric statistics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6135983b1c3eab8ad5756770356db1dc
https://doi.org/10.1109/jssc.2007.897161

المؤلفون: Kaushik Roy, Jaydeep P. Kulkarni, Sang Phill Park, Keejong Kim

المصدر: DAC

مصطلحات موضوعية: Process variation, Engineering, Hardware_MEMORYSTRUCTURES, business.industry, Schmitt trigger, Low-power electronics, Electronic engineering, Static random-access memory, business, Low voltage, Dynamic voltage scaling, Threshold voltage, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fabb79834daf994ec33a7a9e7d817441
https://doi.org/10.1145/1391469.1391498