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1مؤتمر
المؤلفون: Constantin, Rares, Duck, Moritz, Alexandrov, Anton, Matosevic, Patrik, Keidar, Daphna, El-Assady, Mennatallah
المصدر: 2022 IEEE Workshop on TRust and EXpertise in Visual Analytics (TREX) TREX TRust and EXpertise in Visual Analytics (TREX), 2022 IEEE Workshop on. :1-7 Oct, 2022
Relation: 2022 IEEE Workshop on TRust and EXpertise in Visual Analytics (TREX)
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2مؤتمر
المؤلفون: Yaron, Daniel, Keidar, Daphna, Goldstein, Elisha, Shachar, Yair, Blass, Ayelet, Frank, Oz, Schipper, Nir, Shabshin, Nogah, Grubstein, Ahuva, Suhami, Dror, Bogot, Naama R., Weiss, Chedva S., Sela, Eyal, Dror, Amiel A., Vaturi, Mordehay, Mento, Federico, Torri, Elena, Inchingolo, Riccardo, Smargiassi, Andrea, Soldati, Gino, Perrone, Tiziano, Demi, Libertario, Galun, Meirav, Bagon, Shai, Elyada, Yishai M., Eldar, Yonina C.
المصدر: ICASSP 2021 - 2021 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP) Acoustics, Speech and Signal Processing (ICASSP), ICASSP 2021 - 2021 IEEE International Conference on. :8153-8157 Jun, 2021
Relation: ICASSP 2021 - 2021 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)
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3تقرير
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4تقرير
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5تقرير
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6تقرير
المؤلفون: Yaron, Daniel, Keidar, Daphna, Goldstein, Elisha, Shachar, Yair, Blass, Ayelet, Frank, Oz, Schipper, Nir, Shabshin, Nogah, Grubstein, Ahuva, Suhami, Dror, Bogot, Naama R., Sela, Eyal, Dror, Amiel A., Vaturi, Mordehay, Mento, Federico, Torri, Elena, Inchingolo, Riccardo, Smargiassi, Andrea, Soldati, Gino, Perrone, Tiziano, Demi, Libertario, Galun, Meirav, Bagon, Shai, Elyada, Yishai M., Eldar, Yonina C.
مصطلحات موضوعية: Electrical Engineering and Systems Science - Image and Video Processing, Computer Science - Computer Vision and Pattern Recognition
URL الوصول: http://arxiv.org/abs/2011.01789
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7تقرير
المؤلفون: Goldstein, Elisha, Keidar, Daphna, Yaron, Daniel, Shachar, Yair, Blass, Ayelet, Charbinsky, Leonid, Aharony, Israel, Lifshitz, Liza, Lumelsky, Dimitri, Neeman, Ziv, Mizrachi, Matti, Hajouj, Majd, Eizenbach, Nethanel, Sela, Eyal, Weiss, Chedva S, Levin, Philip, Benjaminov, Ofer, Bachar, Gil N, Tamir, Shlomit, Rapson, Yael, Suhami, Dror, Dror, Amiel A, Bogot, Naama R, Grubstein, Ahuva, Shabshin, Nogah, Elyada, Yishai M, Eldar, Yonina C
مصطلحات موضوعية: Electrical Engineering and Systems Science - Image and Video Processing, Computer Science - Computer Vision and Pattern Recognition, Computer Science - Machine Learning
URL الوصول: http://arxiv.org/abs/2010.01362
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8دورية أكاديمية
المؤلفون: Keidar, Daphna, Yaron, Daniel, Goldstein, Elisha, Shachar, Yair, Blass, Ayelet, Charbinsky, Leonid, Aharony, Israel, Lifshitz, Liza, Lumelsky, Dimitri, Neeman, Ziv, Mizrachi, MattiAff6, Aff7, Hajouj, MajdAff6, Aff7, Eizenbach, NethanelAff6, Aff7, Sela, EyalAff6, Aff7, Weiss, Chedva S., Levin, Philip, Benjaminov, Ofer, Bachar, Gil N.Aff9, Aff10, Tamir, ShlomitAff9, Aff10, Rapson, YaelAff9, Aff10, Suhami, DrorAff9, Aff10, Atar, EliAff9, Aff10, Dror, Amiel A.Aff6, Aff7, Bogot, Naama R., Grubstein, AhuvaAff9, Aff10, Shabshin, Nogah, Elyada, Yishai M., Eldar, Yonina C.Aff2
المصدر: European Radiology. 31(12):9654-9663
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9دورية أكاديمية
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