يعرض 1 - 10 نتائج من 18,577 نتيجة بحث عن '"Keim, A."', وقت الاستعلام: 1.22s تنقيح النتائج
  1. 1
    دورية أكاديمية
    FS/DS: A Theoretical Framework for the Dual Analysis of Feature Space and Data Space

    المؤلفون: Dennig, F.L., Miller, M., Keim, D.A., El-Assady, M.

    المصدر: IEEE Transactions on Visualization and Computer Graphics IEEE Trans. Visual. Comput. Graphics Visualization and Computer Graphics, IEEE Transactions on. 30(8):5165-5182 Aug, 2024

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  2. 2
    دورية أكاديمية
    Automorphism Faithfulness Metrics for Symmetric Graph Drawings

    المؤلفون: Meidiana, A., Hong, S., Eades, P., Keim, D.

    المصدر: IEEE Transactions on Visualization and Computer Graphics IEEE Trans. Visual. Comput. Graphics Visualization and Computer Graphics, IEEE Transactions on. 30(7):3241-3255 Jul, 2024

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  3. 3
    مؤتمر
    Requirements Classification for Traceability Link Recovery

    المؤلفون: Hey, Tobias, Keim, Jan, Corallo, Sophie

    المصدر: 2024 IEEE 32nd International Requirements Engineering Conference (RE) RE Requirements Engineering Conference (RE), 2024 IEEE 32nd International. :155-167 Jun, 2024

    Relation: 2024 IEEE 32nd International Requirements Engineering Conference (RE)

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  4. 4
    مؤتمر
    An Image Quality Dataset with Triplet Comparisons for Multi-dimensional Scaling

    المؤلفون: Jenadeleh, Mohsen, Dennig, Frederik L., Cutura, Rene, Ngo, Quynh Quang, Keim, Daniel A., Sedlmair, Michael, Saupe, Dietmar

    المصدر: 2024 16th International Conference on Quality of Multimedia Experience (QoMEX) Quality of Multimedia Experience (QoMEX), 2024 16th International Conference on. :278-281 Jun, 2024

    Relation: 2024 16th International Conference on Quality of Multimedia Experience (QoMEX)

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  5. 5
    مؤتمر
    New Standard-under-Development for Chiplet Interconnect Test and Repair: IEEE Std P3405

    المؤلفون: Marinissen, Erik Jan, Evans, Adrian, Chuang, Po-Yao, Keim, Martin, Chandra, Anshuman

    المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-10 May, 2024

    Relation: 2024 IEEE European Test Symposium (ETS)

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  6. 6
    مؤتمر
    Combining Built-In Redundancy Analysis with ECC for Memory Testing

    المؤلفون: Romain, Luc, Nordmann, Paul-Patrick, Nadeau-Dostie, Benoit, Schramm, Lori, Keim, Martin

    المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-6 May, 2024

    Relation: 2024 IEEE European Test Symposium (ETS)

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  7. 7
    مؤتمر
    MBIST-based weak bit screening method for embedded MRAM

    المؤلفون: Yun, Jongsin, Mamaghani, Sina Bakhtavari, Tahoori, Mehdi, Munch, Christopher, Keim, Martin

    المصدر: 2024 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2024 IEEE. :1-4 May, 2024

    Relation: 2024 IEEE European Test Symposium (ETS)

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  8. 8
    مؤتمر
    Power Loss Analysis of Two-Level and Three-Level Converters under Active Short-Circuit Operating Conditions for Multi-Lane Electric Aviation Applications

    المؤلفون: Wang, Wei, Noland, Jonas Kristiansen, Keim Olsen, Pal

    المصدر: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia), 2024 IEEE 10th International. :1964-1969 May, 2024

    Relation: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)

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  9. 9
    مؤتمر
    Cluster-Faithful Graph Visualization: New Metrics and Algorithms

    المؤلفون: Cai, Shijun, Hong, Seok-Hee, Meidiana, Amyra, Eades, Peter, Keim, Daniel

    المصدر: 2024 IEEE 17th Pacific Visualization Conference (PacificVis) PACIFICVIS Pacific Visualization Conference (PacificVis), 2024 IEEE 17th. :192-201 Apr, 2024

    Relation: 2024 IEEE 17th Pacific Visualization Conference (PacificVis)

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  10. 10
    مؤتمر
    Multi-Level Reference for Test Coverage Enhancement of Resistive-Based NVM

    المؤلفون: Mamaghani, Sina Bakhtavari, Yun, Jongsin, Keim, Martin, Tahoori, Mehdi

    المصدر: 2024 IEEE 42nd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2024 IEEE 42nd. :1-7 Apr, 2024

    Relation: 2024 IEEE 42nd VLSI Test Symposium (VTS)

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