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المؤلفون: Kerem Akarvardar, H. -S. Philip Wong
المصدر: Proceedings of the IEEE. 111:92-112
مصطلحات موضوعية: Electrical and Electronic Engineering
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المؤلفون: Carlos H. Diaz, Jau-Yi Wu, Rawan Naous, Shimeng Yu, Kerem Akarvardar, C. H. Lee, Xiaoyu Sun, H. Y. Lee, X. Y. Bao, H.-S. P. Wong, Win-San Khwa, T. C. Chen, Yu-Lin Chen, Ming-Hsung Chang
المصدر: IEEE Transactions on Electron Devices. 68:5585-5591
مصطلحات موضوعية: Phase-change memory, Nonlinear system, Artificial neural network, Inference, Overhead (computing), Statistical model, Electrical and Electronic Engineering, Algorithm, Noise (electronics), Electronic, Optical and Magnetic Materials, Degradation (telecommunications), Mathematics
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المؤلفون: Win-San Khwa, Hung-jen Liao, Mahmut E. Sinangil, Burak Erbagci, Rawan Naous, Yih Wang, Dar Sun, Jonathan Chang, Kerem Akarvardar
المصدر: IEEE Journal of Solid-State Circuits. 56:188-198
مصطلحات موضوعية: Random access memory, business.industry, Sense amplifier, Computer science, 020208 electrical & electronic engineering, 02 engineering and technology, Flash ADC, Charge sharing, 0202 electrical engineering, electronic engineering, information engineering, Bandwidth (computing), Static random-access memory, Electrical and Electronic Engineering, Macro, business, Throughput (business), Computer hardware, Access time
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المؤلفون: Hidehiro Fujiwara, Haruki Mori, Wei-Chang Zhao, Mei-Chen Chuang, Rawan Naous, Chao-Kai Chuang, Takeshi Hashizume, Dar Sun, Chia-Fu Lee, Kerem Akarvardar, Saman Adham, Tan-Li Chou, Mahmut Ersin Sinangil, Yih Wang, Yu-Der Chih, Yen-Huei Chen, Hung-Jen Liao, Tsung-Yung Jonathan Chang
المصدر: 2022 IEEE International Solid- State Circuits Conference (ISSCC).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::399687bfa437d849b1e2758496cfcdf6
https://doi.org/10.1109/isscc42614.2022.9731754 -
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المؤلفون: Subhasish Mitra, Chenming Hu, H.-S. Philip Wong, Kerem Akarvardar, Tsu-Jae King-Liu, Sayeef Salahuddin, Jeffrey Bokor, James D. Plummer, Dimitri A. Antoniadis
المصدر: Proceedings of the IEEE. 108:478-482
مصطلحات موضوعية: Computer science, Semiconductor technology, business.industry, Transistor, Electrical engineering, Semiconductor device, law.invention, Semiconductor industry, law, Gauge (instrument), Metric (mathematics), Point (geometry), Electrical and Electronic Engineering, Dimension (data warehouse), business
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المؤلفون: Cheng-Han Lu, Yu-Lin Chen, Yen-Huei Chen, Mori Haruki, Rawan Naous, Kerem Akarvardar, Yi-Chun Shih, Zhao Wei-Chang, Dar Sun, Yu-Der Chih, Lee Chia-Fu, Tsung-Yung Jonathan Chang, Mahmut E. Sinangil, Po-Hao Lee, Meng-Fan Chang, Hung-jen Liao, Tan-Li Chou, Yih Wang, Fujiwara Hidehiro, Chieh-Pu Lo
المصدر: ISSCC
مصطلحات موضوعية: Edge device, business.industry, Computer science, Cloud computing, Machine learning, computer.software_genre, Bandwidth (computing), Static random-access memory, Artificial intelligence, Enhanced Data Rates for GSM Evolution, Latency (engineering), business, Field-programmable gate array, computer, Efficient energy use
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f02840e0b9986b888ee405272a4cca03
https://doi.org/10.1109/isscc42613.2021.9365766 -
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المؤلفون: Kerem Akarvardar, Balasubramanian S. Haran, Dinesh Gupta, Juntao Li, Takashi Ando, Economikos Laertis, James J. Demarest, Andreas Knorr, Kai Zhao, Victor Chan, Ruqiang Bao, Cave Nigel, Huimei Zhou, Richard A. Conti, Veeraraghavan S. Basker, Andrew M. Greene, Huiming Bu, Miaomiao Wang, Robert R. Robison, Kanakasabapathy Sivananda K, Indira Seshadri, Chanro Park, Dechao Guo, Muthumanickam Sankarapandian, Ruilong Xie, Liying Jiang
المصدر: 2019 Symposium on VLSI Technology.
مصطلحات موضوعية: Parasitic capacitance, Computer science, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, Metal gate, Scaling, Hardware_LOGICDESIGN, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c79d17d97f0f8e79a50e6f8d02ad91d6
https://doi.org/10.23919/vlsit.2019.8776493 -
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المؤلفون: Oleg Gluschenkov, Zuoguang Liu, Chengyu Niu, Andreas Knorr, Tenko Yamashita, Jay W. Strane, Mukesh Khare, Gen Tsutsui, Chris M. Prindle, Abraham Arceo, Indira Seshadri, Bruce Miao, A. Petrescu, Stan D. Tsai, Curtis Durfee, Soon-Cheon Seo, Adra Carr, Jie Yang, Walter Kleemeier, Kisik Choi, F. Lie, W. Wang, Rama Divakaruni, Chanro Park, Mark Raymond, Heng Wu, Huiming Bu, Dechao Guo, Anuja DeSilva, George Yang, Dinesh Gupta, Muthumanickam Sankarapandian, Praneet Adusumilli, Sam Choi, Kerem Akarvardar
المصدر: 2017 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Very-large-scale integration, Materials science, business.industry, Doping, Phase (waves), 02 engineering and technology, Ring oscillator, 021001 nanoscience & nanotechnology, Epitaxy, 01 natural sciences, Reduction (complexity), CMOS, Electrical resistivity and conductivity, 0103 physical sciences, Optoelectronics, 0210 nano-technology, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fafc4c9a45bd4b7e938db8bc086dead4
https://doi.org/10.1109/iedm.2017.8268440 -
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المؤلفون: Junli Wang, Matthew E. Colburn, Nelson Felix, Andreas Knorr, Tenko Yamashita, Charan V. V. S. Surisetty, Peter Zeitzoff, Dinesh Gupta, Y. Xu, Su Chen Fan, D. Park, Xin Miao, R. Divakaruni, Scott C. Johnson, Hiroaki Niimi, S. Lian, Balasubramanian S. Pranatharthi Haran, Andre Labonte, Eric R. Miller, Richard A. Conti, Shogo Mochizuki, Zhenxing Bi, M. Mottura, Bhagawan Sahu, Chengyu Niu, Donald F. Canaperi, John R. Sporre, James J. Demarest, Spyridon Skordas, Vamsi Paruchuri, Praneet Adusumilli, Seng Luan Lee, Lars W. Liebmann, Christopher Prindle, Walter Kleemeier, Oleg Gluschenkov, Peng Xu, Hemanth Jagannathan, Pietro Montanini, Rohit Galatage, Jody A. Fronheiser, Ruilong Xie, P. Oldiges, Neeraj Tripathi, Abraham Arceo, F. Lie, Robin Chao, Zuoguang Liu, D. Corliss, Stuart A. Sieg, Vimal Kamineni, Lee Choonghyun, Jeffrey C. Shearer, C. Labelle, J. Zhang, S. Kanakasabapathy, Stan D. Tsai, James Chingwei Li, Soon-Cheon Seo, H. Chen, H. P. Amanapu, Min Gyu Sung, Mark Raymond, Huiming Bu, Andrew M. Greene, Kisup Chung, Kerem Akarvardar, Sanjay Mehta, Richard G. Southwick, Chanro Park, C.-C. Yeh, John C. Arnold, K. Cheon, Myung-Hee Na, Mukesh Khare, Jungho Cha, Shariq Siddiqui, S. Whang, Lei Sun, Theodorus E. Standaert, Derren N. Dunn, Bassem Hamieh, T. Gow, Ki-chul Kim, Nicolas Loubet, Muthumanickam Sankarapandian, Terence B. Hook
المصدر: 2016 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Very-large-scale integration, Materials science, Silicon, business.industry, Extreme ultraviolet lithography, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, law.invention, chemistry, law, Logic gate, 0103 physical sciences, Multiple patterning, Optoelectronics, Photolithography, 0210 nano-technology, business, Lithography, Next-generation lithography
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::75a8807331b86a9948840b3fa0fbe3d5
https://doi.org/10.1109/iedm.2016.7838334 -
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المؤلفون: Chadwin D. Young, G. Bersuker, Injo Ok, Kerem Akarvardar, Matt Minakais, James Pater, Paul Kirsch, Ken Matthews, S. Deora, T. Ngai, Raj Jammy, Chris Hobbs, K.-W. Ang, Mehmet Onur Baykan
المصدر: ECS Transactions. 50:201-206
مصطلحات موضوعية: Materials science, business.industry, Transistor, Characterization (materials science), law.invention, Fin (extended surface), Reliability (semiconductor), law, Optoelectronics, Wafer, Field-effect transistor, Double gate, business, Communication channel