المؤلفون: Darragh Maloney (Commentator), Kevin McStay (Commentator)

URL الوصول: https://www.europeana.eu/item/2051925/data_euscreenXL_EUS_C731644A6BC0AC10719F0CB13872D4EC?utm_source=api&utm_medium=api&utm_campaign=YuvuWBeCa

المؤلفون: Michal Rakowski, Kate McLean, Asli Sahin, Bo Peng, Brendan Harris, Karen Nummy, Javier Ayala, Andy Stricker, Ken Giewont, Abdelsalam Aboketaf, Louis Medina, John Pellerin, Zoey Sowinski, Jacob Ajey Poovannummoottil, Ted Letavic, Kevin McStay, Yusheng Bian, Thomas Houghton, Dave Riggs, Anthony Yu, Crystal Hedges, Colleen Meagher

المصدر: OFC
Scopus-Elsevier

مصطلحات موضوعية: Silicon photonics, business.industry, Computer science, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, 01 natural sciences, Power (physics), 010309 optics, 020210 optoelectronics & photonics, CMOS, Rf technology, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Node (circuits), Photonics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9424e6615fac6b4c7ea08c9fd7293488
https://doi.org/10.1364/ofc.2020.t3h.3

المؤلفون: Yanli Zhang, Kevin McStay, Mohit Bajaj, Weike Wang, Samarth Agarwal, Terence B. Hook

المصدر: IEEE Transactions on Electron Devices. 62:1357-1359

مصطلحات موضوعية: Materials science, Fin, Silicon, business.industry, Transistor, chemistry.chemical_element, Tapering, Hardware_PERFORMANCEANDRELIABILITY, STRIPS, Electronic, Optical and Magnetic Materials, law.invention, Threshold voltage, Planar, chemistry, law, Lattice (order), Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::106ed6aaa0d902e2ad1a8bc246948ea5
https://doi.org/10.1109/ted.2015.2400221

المؤلفون: E. Engbrecht, Edward P. Maciejewski, Christopher D. Sheraw, R. Divakaruni, Zhengwen Li, Allen H. Gabor, L. Economikos, Fernando Guarin, N. Zhan, H-K Lee, MaryJane Brodsky, Kenneth J. Stein, Siyuranga O. Koswatta, Y. Yang, Byeong Y. Kim, J. Hong, A. Bryant, Herbert L. Ho, Ruqiang Bao, Nicolas Breil, Babar A. Khan, E. Woodard, W-H. Lee, C-H. Lin, A. Levesque, Kevin McStay, V. Basker, Viraj Y. Sardesai, C. Tran, A. Ogino, Reinaldo A. Vega, C. DeWan, Shreesh Narasimha, J-J. An, Amit Kumar, A. Aiyar, Ravikumar Ramachandran, W. Wang, X. Wang, W. Nicoll, D. Hoyos, A. Friedman, Barry Linder, Yongan Xu, E. Alptekin, Cathryn Christiansen, S. Polvino, Han Wang, Scott R. Stiffler, G. Northrop, S. Saudari, J. Rice, Saraf Iqbal Rashid, Sunfei Fang, Michael V. Aquilino, Z. Ren, B. Kannan, Geng Wang, Noah Zamdmer, T. Kwon, Paul D. Agnello, Hasan M. Nayfeh, S. Jain, Robert R. Robison, M. Hasanuzzaman, J. Cai, L. Lanzerotti, D. Wehelle-Gamage, Basanth Jagannathan, J. Johnson, E. Kaste, Kai Zhao, Huiling Shang, Carl J. Radens, Shariq Siddiqui, Y. Ke, D. Ferrer, Ximeng Guan, D. Conklin, K. Boyd, K. Henson, Siddarth A. Krishnan, Bernard A. Engel, H. Dong, S. Mahajan, Unoh Kwon, Dominic J. Schepis, William Y. Chang, Liyang Song, Brian J. Greene, Chengwen Pei, S.-J. Jeng, Clevenger Leigh Anne H, Vijay Narayanan, C. Zhu, Wai-kin Li, Henry K. Utomo, Wei Liu, Dureseti Chidambarrao

المصدر: 2014 IEEE International Electron Devices Meeting.

مصطلحات موضوعية: Engineering, Subthreshold conduction, business.industry, Processor design, Copper interconnect, Soi finfet, Hardware_PERFORMANCEANDRELIABILITY, Thread (computing), Planar, CMOS, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Dram

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6233530b0b3fd6ddc14276a018716523
https://doi.org/10.1109/iedm.2014.7046977

المؤلفون: Myung-Hee Na, Edward J. Nowak, Kevin McStay

المصدر: ECS Transactions. 52:57-59

مصطلحات موضوعية: Materials science, business.industry, Sub threshold, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4746719ba94c0caffb00124d14c9a1b5
https://doi.org/10.1149/05201.0057ecst

المؤلفون: Rajeev Malik, Rishikesh Krishnan, Sunfei Fang, Bernhard Wunder, Kevin McStay, Yanli Zhang, Sadanand V. Deshpande, Douglas Daley, Herbert L. Ho, Sneha Gupta, Paul C. Parries, Balaji Jayaraman, Sungjae Lee, Puneet Goyal, John E. Barth, Scott R. Stiffler, Paul D. Agnello, Subramanian S. Iyer

المصدر: ICICDT

مصطلحات موضوعية: Materials science, Equivalent series resistance, business.industry, Electrical engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, eDRAM, Decoupling capacitor, Capacitance, law.invention, Capacitor, Hardware_GENERAL, law, Trench, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Metal gate

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::83d6b2dd06f89254c9ba9a3578b0ab30
https://doi.org/10.1109/icicdt.2012.6232872

المؤلفون: James H. Stathis, Andreas Kerber, R. Divakaruni, Yue Hu, Hemanth Jagannathan, Dae-Gyu Park, Siddarth A. Krishnan, Richard Carter, Deleep R. Nair, Yun-Yu Wang, Ricardo A. Donaton, William K. Henson, Shahab Siddiqui, Ernest Y. Wu, Murshed M. Chowdhury, Kathy Barla, Huiming Bu, Mukesh Khare, Rohit Pal, J.-P. Han, Matthew W. Stoker, S. Saroop, Sufi Zafar, Michael P. Chudzik, Eduard A. Cartier, X. Chen, Jin Cai, Vamsi Paruchuri, Eric C. Harley, Myung-Hee Na, Dimitris P. Ioannou, Ryosuke Iijima, Min Dai, Kevin McStay, Takashi Ando, Joseph F. Shepard, J. Schaeffer, J-H Lee, Naim Moumen, P. Montanini, Lisa F. Edge, Paul D. Agnello, Shreesh Narasimha, Srikanth Samavedam, Dechao Guo, Unoh Kwon, Dominic J. Schepis, Yue Liang, Martin Ostermayr, S. Inumiya, Thomas A. Wallner, B. Greene, H. Yamasaki, D.P. Prakash, Jaeger Daniel, Stephen W. Bedell, M. Hargrove, Michael A. Gribelyuk, Gauri Karve, Y. Lee, Vijay Narayanan, S. Uchimura, Martin M. Frank

المصدر: 2011 International Electron Devices Meeting.

مصطلحات موضوعية: Materials science, Silicon, business.industry, Electrical engineering, chemistry.chemical_element, Hardware_PERFORMANCEANDRELIABILITY, Threshold voltage, chemistry, CMOS, Hardware_GENERAL, Low-power electronics, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Wafer, business, Metal gate, Hardware_LOGICDESIGN, High-κ dielectric

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d662cd649e124b99bca46657dff7712f
https://doi.org/10.1109/iedm.2011.6131628

المؤلفون: Herbert L. Ho, Jinping Liu, Paul C. Parries, Norman Robson, Jing Li, Puneet Goyal, S.S. Iyer, Ming Yin, Babar A. Khan, Zhengwen Li, Paul D. Agnello, K. V. Hawkins, Sunfei Fang, T. Weaver, Scott R. Stiffler, Kevin McStay, Rishikesh Krishnan, W. Davies, R. Takalkar, T. Kirihata, Sami Rosenblatt, S. Galis, A. Blauberg, Shreesh Narasimha, Michael P. Chudzik, Amanda L. Tessier, William K. Henson, W. Kong, Edward P. Maciejewski, Alberto Cestero, Nauman Zafar Butt, Joseph Ervin, S. Gupta, Jeyaraj Antony Johnson, S. Rombawa, Sungjae Lee, J. Barth, Ying Zhang

المصدر: 2010 International Electron Devices Meeting.

مصطلحات موضوعية: Engineering, business.industry, Transistor, Silicon on insulator, eDRAM, law.invention, Threshold voltage, Capacitor, Hardware_GENERAL, law, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Metal gate, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::324242387bfae4ae688888a5d8ad886a
https://doi.org/10.1109/iedm.2010.5703434

المؤلفون: Russell H. Arndt, Ashima B. Chakravarti, Anthony G. Domenicucci, Amanda L. Tessier, Jinping Liu, Sunfei Fang, Kevin McStay, Zhengwen Li, Randolph F. Knarr, S. Lee, Joseph F. Shepard, Herbert L. Ho, A. Arya, R. Venigalla, W. Davies, R. Takalkar, Rishikesh Krishnan, Paul C. Parries, B. Morgenfeld, Xin Li, S. Gupta, Michael P. Chudzik, Scott R. Stiffler, Puneet Goyal, Babar A. Khan, Sadanand V. Deshpande, J. Dadson, Scott D. Allen

المصدر: 2010 IEEE International SOI Conference (SOI).

مصطلحات موضوعية: Materials science, business.industry, chemistry.chemical_element, eDRAM, Capacitance, Engineering physics, law.invention, Capacitor, Semiconductor, chemistry, Hardware_GENERAL, law, Shallow trench isolation, Trench, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, business, Tin, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::923f4cfd581d96da2ab4d0cb5f97f7c8
https://doi.org/10.1109/soi.2010.5641378

المؤلفون: S.S. Iyer, Ravi M. Todi, Rajeev Malik, Erik A. Nelson, Rishikesh Krishnan, Sunfei Fang, Byeong Y. Kim, R. Takalkar, D. Anand, Oh-Jung Kwon, Michael P. Chudzik, Nauman Zafar Butt, Scott R. Stiffler, Herbert L. Ho, Joseph Ervin, Siddarth A. Krishnan, Babar A. Khan, Alberto Cestero, Gregory G. Freeman, Geng Wang, Karen A. Nummy, J. Sim, Amanda L. Tessier, Jin Liu, W. Kong, Paul C. Parries, Kevin McStay

المصدر: 2009 IEEE International Electron Devices Meeting (IEDM).

مصطلحات موضوعية: Computer science, business.industry, Transistor, Electrical engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, eDRAM, law.invention, Capacitor, Hardware_GENERAL, law, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Node (circuits), business, Metal gate, Dram

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2d6cc411a517f48787c659ad0590ab81
https://doi.org/10.1109/iedm.2009.5424375