المؤلفون: Fink, S., Kim, H.-R., Mueller, R., Noe, M., Zwecker, V.

المصدر: 2014 ICHVE International Conference on High Voltage Engineering and Application High Voltage Engineering and Application (ICHVE), 2014 International Conference on. :1-4 Sep, 2014

Relation: 2014 International Conference on High Voltage Engineering and Application (ICHVE)

المؤلفون: Fink, S., Mueller, R., Noe, M., Zwecker, V., Kim, H.-R.

المصدر: 2014 IEEE 18th International Conference on Dielectric Liquids (ICDL) Dielectric Liquids (ICDL), 2014 IEEE 18th International Conference on. :1-4 Jun, 2014

Relation: 2014 IEEE 18th International Conference on Dielectric Liquids (ICDL)

المؤلفون: Jung, T., Park, D., Park, J.-S., Lee, J.-H., Kim, S., Kim, B. K., Kim, H.-R.

المصدر: Journal of Display Technology J. Display Technol. Display Technology, Journal of. 11(3):229-235 Mar, 2015

المؤلفون: Oh, T.-Y., Chung, H., Park, J.-Y., Lee, K.-W., Oh, S., Doo, S.-Y., Kim, H.-J., Lee, C., Kim, H.-R., Lee, J.-H., Lee, J.-I., Ha, K.-S., Choi, Y., Cho, Y.-C., Bae, Y.-C., Jang, T., Park, C., Park, K., Jang, S., Choi, J. S.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 50(1):178-190 Jan, 2015

المؤلفون: Kim H. R. Ouwehand, Kate M. Xu, Marieke Meeuwisse, Sabine E. Severiens, Lisette Wijnia

المصدر: Frontiers in Education, Vol 7 (2022)

مصطلحات موضوعية: SES, migration background, classroom management, cognitive activation, clarity of instruction, student-teacher relationship, Education (General), L7-991

وصف الملف: electronic resource

Relation: https://www.frontiersin.org/articles/10.3389/feduc.2022.815795/full; https://doaj.org/toc/2504-284X

URL الوصول: https://doaj.org/article/db17c3b2fb3040d99edd0c343b18446f

المؤلفون: Hyun, O.-B., Yim, S.-W., Yu, S.-D., Yang, S. E., Kim, W.-S., Kim, H.-R., Lee, G.-H., Sim, J., Park, K.-B.

المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 21(3):2131-2134 Jun, 2011

المؤلفون: Seo, I.-Y., Yim, S.-W., Kim, H.-R., Hyun, O.-B.

المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 21(3):1229-1232 Jun, 2011

المؤلفون: Oh, T.-Y., Sohn, Y.-S., Bae, S.-J., Park, M.-S., Lim, J.-H., Cho, Y.-K., Kim, D.-H., Kim, D.-M., Kim, H.-R., Kim, H.-J., Kim, J.-H., Kim, J.-K., Kim, Y.-S., Kim, B.-C., Kwak, S.-H., Lee, J.-H., Lee, J.-Y., Shin, C.-H., Yang, Y., Cho, B.-S., Bang, S.-Y., Yang, H.-J., Choi, Y.-R., Moon, G.-S., Park, C.-G., Hwang, S.-W., Lim, J.-D., Park, K.-I., Choi, J. S., Jun, Y.-H.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 46(1):107-118 Jan, 2011

المؤلفون: Kim, H-R., Pak, K-M., Jun, K-W., Choi, H-W., Lim, J-S., Won, Y-H.

المصدر: IEEE Photonics Journal IEEE Photonics J. Photonics Journal, IEEE. 2(4):553-562 Aug, 2010

المؤلفون: Seo, I.-Y., Yim, S.-W., Kim, H.-R., Ha, B.-N., Hyun, O.-B.

المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 20(3):1254-1258 Jun, 2010