يعرض 1 - 10 نتائج من 44 نتيجة بحث عن '"Kim, Hoonki"', وقت الاستعلام: 1.78s تنقيح النتائج
  1. 1
    مؤتمر
    Breakthrough Design Technology Co-optimization using BSPDN and Standard Cell Variants for Maximizing Block-level PPA

    المؤلفون: Lee, Seungyoung, Jung, Sungyup, Jang, Yunkyeong, Do, Jungho, Yu, Jisu, You, Hyeoungyu, Jeong, Minjae, Lim, Jinyoung, Han, Jiyun, Park, Sangdo, Kim, Yongdeok, Kwon, Jooyeon, Kim, Hoonki, Yoon, Seiseung

    المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

    Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

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  2. 2
    مؤتمر
    3nm Gate-All-Around (GAA) Design-Technology Co-Optimization (DTCO) for succeeding PPA by Technology

    المؤلفون: Song, Taejoong, Jung, Hakchul, Yang, Giyoung, Tang, Hoyoung, Kim, Hayoung, Seo, Dongwook, Kim, Hoonki, Rim, Woojin, Baek, Sanghoon, Baeck, Sangyeop, Jung, Jonghoon

    المصدر: 2022 IEEE Custom Integrated Circuits Conference (CICC) Custom Integrated Circuits Conference (CICC), 2022 IEEE. :1-7 Apr, 2022

    Relation: 2022 IEEE Custom Integrated Circuits Conference (CICC)

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  3. 3
    مؤتمر
    24.3 A 3nm Gate-All-Around SRAM Featuring an Adaptive Dual-BL and an Adaptive Cell-Power Assist Circuit

    المؤلفون: Song, Taejoong, Rim, Woojin, Kim, Hoonki, Cho, Keun Hwi, Kim, Taeyeong, Lee, TaeJung, Bae, Geumjong, Kim, Dong-Won, Kwon, SD, Baek, Sanghoon, Jung, Jonghoon, Kye, Jongwook, Jung, Hakchul, Kim, Hyungtae, Jung, Soon-Moon, Park, Jaehong

    المصدر: 2021 IEEE International Solid-State Circuits Conference (ISSCC) Solid-State Circuits Conference (ISSCC), 2021 IEEE International. 64:338-340 Feb, 2021

    Relation: 2021 IEEE International Solid-State Circuits Conference (ISSCC)

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  4. 4
    مؤتمر
    A 7nm FinFET SRAM using EUV lithography with dual write-driver-assist circuitry for low-voltage applications

    المؤلفون: Song, Taejoong, Jung, Jonghoon, Rim, Woojin, Kim, Hoonki, Kim, Yongho, Park, Changnam, Do, Jeongho, Park, Sunghyun, Cho, Sungwee, Jung, Hyuntaek, Kwon, Bongjae, Choi, Hyun-Su, Choi, JaeSeung, Yoon, Jong Shik

    المصدر: 2018 IEEE International Solid-State Circuits Conference - (ISSCC) Solid-State Circuits Conference - (ISSCC), 2018 IEEE International. :198-200 Feb, 2018

    Relation: 2018 IEEE International Solid-State Circuits Conference - (ISSCC)

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  5. 5
    مؤتمر
    An 8bit, 2.6ps two-step TDC in 65nm CMOS employing a switched ring-oscillator based time amplifier

    المؤلفون: Kim, Bongjin, Kim, Hoonki, Kim, Chris H.

    المصدر: 2015 IEEE Custom Integrated Circuits Conference (CICC) Custom Integrated Circuits Conference (CICC), 2015 IEEE. :1-4 Sep, 2015

    Relation: 2015 IEEE Custom Integrated Circuits Conference - CICC 2015

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  6. 6
    مؤتمر
    Circuit techniques for mitigating short-term vth instability issues in successive approximation register (SAR) ADCs

    المؤلفون: Choi, Won Ho, Kim, Hoonki, Kim, Chris H.

    المصدر: 2015 IEEE Custom Integrated Circuits Conference (CICC) Custom Integrated Circuits Conference (CICC), 2015 IEEE. :1-4 Sep, 2015

    Relation: 2015 IEEE Custom Integrated Circuits Conference - CICC 2015

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  7. 7
    مؤتمر
    Smart scaling technology for advanced FinFET node

    المؤلفون: Kye, Jongwook, Kim, Hoonki, Lim, Jinyoung, Lee, Seungyoung, Jung, Jonghoon, Song, Taejoong

    المصدر: 2018 IEEE Symposium on VLSI Technology VLSI Technology, 2018 IEEE Symposium on. :149-150 Jun, 2018

    Relation: 2018 IEEE Symposium on VLSI Technology

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  8. 8
    مؤتمر
    Half-and-Half Compare Content Addressable Memory with Charge-Sharing Based Selective Match-Line Precharge Scheme

    المؤلفون: Choi, Woong, Park, Jongsun, Kim, Hoonki, Park, Changnam, Song, Taejoong

    المصدر: 2018 IEEE Symposium on VLSI Circuits VLSI Circuits, 2018 IEEE Symposium on. :17-18 Jun, 2018

    Relation: 2018 IEEE Symposium on VLSI Circuits

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  9. 9
    مؤتمر
    Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

    المؤلفون: Kumar, Saurabh, Cho, Minki, Everson, Luke, Kim, Hoonki, Tang, Qianying, Mazanec, Paul, Meinerzhagen, Pascal, Malavasi, Andres, Lake, Dan, Tokunaga, Carlos, Quinn, Heather, Khellah, Muhammad, Tschanz, James, Borkar, Shekhar, De, Vivek, Kim, Chris H.

    المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :C114-C115 Jun, 2017

    Relation: 2017 Symposium on VLSI Technology

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  10. 10
    مؤتمر
    12.2 A 7nm FinFET SRAM macro using EUV lithography for peripheral repair analysis

    المؤلفون: Song, Taejoong, Kim, Hoonki, Rim, Woojin, Kim, Yongho, Park, Sunghyun, Park, Changnam, Hong, Minsun, Yang, Giyong, Do, Jeongho, Lim, Jinyoung, Lee, Seungyoung, Kim, Ingyum, Baek, Sanghoon, Jung, Jonghoon, Ha, Daewon, Jang, Hyungsoon, Lee, Taejung, Park, Chul-Hong, Kwon, Bongjae, Jung, Hyuntaek, Cho, Sungwee, Choo, Yongjae, Choi, JaeSeung

    المصدر: 2017 IEEE International Solid-State Circuits Conference (ISSCC) Solid-State Circuits Conference (ISSCC), 2017 IEEE International. :208-209 Feb, 2017

    Relation: 2017 IEEE International Solid- State Circuits Conference - (ISSCC)

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