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1مؤتمر
المصدر: 2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm) Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm), 2022 21st IEEE Intersociety Conference on. :1-5 May, 2022
Relation: 2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm)
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2مؤتمر
المؤلفون: Um, Kwi Seob, Hwang, Heejae, Kim, Hyungtak, Heo, Seo Weon
المصدر: 2020 International Conference on Electronics, Information, and Communication (ICEIC) Electronics, Information, and Communication (ICEIC), 2020 International Conference on. :1-3 Jan, 2020
Relation: 2020 International Conference on Electronics, Information, and Communication (ICEIC)
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3مؤتمر
المؤلفون: Shin, Hyungsik, Lee, Ho Kyoung, Cha, Ho-Young, Heo, Seo Weon, Kim, Hyungtak
المصدر: 2019 International Conference on Artificial Intelligence in Information and Communication (ICAIIC) Artificial Intelligence in Information and Communication (ICAIIC), 2019 International Conference on. :381-384 Feb, 2019
Relation: 2019 International Conference on Artificial Intelligence in Information and Communication (ICAIIC)
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4مؤتمر
المؤلفون: Kim, Hyunju, Kim, Hyungtak, Kim, Youngmin
المصدر: 2021 18th International SoC Design Conference (ISOCC) SoC Design Conference (ISOCC), 2021 18th International. :347-348 Oct, 2021
Relation: 2021 18th International SoC Design Conference (ISOCC)
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5دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
6مؤتمر
المؤلفون: Choi, Shinhyuk, Lee, Jae-Gil, Yoon, Hoonsang, Cha, Ho-Young, Kim, Hyungtak
المصدر: 2012 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) Compound Semiconductor Integrated Circuit Symposium (CSICS), 2012 IEEE. :1-4 Oct, 2012
Relation: 2012 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)
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7دورية أكاديمية
المؤلفون: Kim, Hyun-Seop, Kang, Myoung-Jin, Jang, Won-Ho, Seo, Kwang-Seok, Kim, Hyungtak, Cha, Ho-Young
المصدر: In Solid State Electronics November 2020 173
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8دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
9دورية أكاديميةTime-dependent dielectric breakdown of recessed AlGaN/GaN-on-Si MOS-HFETs with PECVD SiO2 gate oxide
المؤلفون: Kim, Hyun-Seop, Eom, Su-Keun, Seo, Kwang-Seok, Kim, Hyungtak, Cha, Ho-Young
المصدر: In Vacuum September 2018 155:428-433
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10دورية أكاديمية
المؤلفون: Keum, Dongmin, Kim, Hyungtak
المصدر: In Cryogenics July 2018 93:51-55