المؤلفون: Jang, T.J., Kim, K.C., Cho, H.C., Seo, J.K.

المصدر: IEEE Transactions on Pattern Analysis and Machine Intelligence IEEE Trans. Pattern Anal. Mach. Intell. Pattern Analysis and Machine Intelligence, IEEE Transactions on. 44(10):6562-6568 Oct, 2022

المؤلفون: Yoon, Y.S., Amare, Y., Angelaszek, D., Anthony, N., Cheryian, K., Choi, G.H., Copley, M., Coutu, S., Derome, L., Eraud, L., Hagenau, L., Han, J.H., Huh, H.G., Hwang, Y.S., Hyun, H.J., Im, S., Jeon, H.B., Jeon, J.A., Jeong, S., Kang, S.C., Kim, H.J., Kim, K.C., Kim, M.H., Lee, H.Y., Lee, J., Lee, M.H., Liang, J., Lu, L., Lutz, L., Menchaca-Rocha, A., Mitchell, J.W., Mognet, S.I., Morton, S., Nester, M., Nutter, S., Park, H., Park, I.H., Park, J.M., Picot-Clémente, N., Seo, E.S., Smith, J.R., Walpole, P., Weinmann, R.P., Wu, J., Zhang, H.G.

المصدر: In Astroparticle Physics June 2024 158

المؤلفون: Kim, K.C., Yun, H.S., Kim, S., Seo, J.K.

المصدر: IEEE Access Access, IEEE. 8:84618-84630 2020

المؤلفون: Ko, M.H., Ryuh, B., Kim, K.C., Suprem, A., Mahalik, N.P.

المصدر: IEEE/ASME Transactions on Mechatronics IEEE/ASME Trans. Mechatron. Mechatronics, IEEE/ASME Transactions on. 20(4):1705-1716 Aug, 2015

المؤلفون: Zhang, H.G., Angelaszek, D., Copley, M., Han, J.H., Huh, H.G., Hwang, Y.S., Hyun, H.J., Jeon, H.B., Kim, K.C., Kim, M.H., Kim, H.J., Kwashnak, K., Lee, M.H., Lundquist, J.P., Lutz, L., Malinin, A., Park, H., Park, J.M., Picot-Clemente, N., Seo, E.S., Smith, J., Wu, J., Yin, Z.Y., Yoon, Y.S.

المصدر: In Astroparticle Physics July 2021 130

المؤلفون: Kim, K.C., Byun, H.R., Song, Y.J., Choi, Y.W., Chi, S.Y., Kim, K.K., Chung, Y.K.

المصدر: Proceedings of the 17th International Conference on Pattern Recognition, 2004. ICPR 2004. Pattern recognition Pattern Recognition, 2004. ICPR 2004. Proceedings of the 17th International Conference on. 2:679-682 Vol.2 2004

Relation: Proceedings of the 17th International Conference on Pattern Recognition

المؤلفون: Park, J.T., Kim, K.C., Lee, J.I.

المصدر: IEEE International Electric Machines and Drives Conference, 2003. IEMDC'03. Electric machines and drives Electric Machines and Drives Conference, 2003. IEMDC'03. IEEE International. 3:1640-1645 vol.3 2003

Relation: International Electric Machines & Drives Conference

المؤلفون: Kim, D.H., Kim, J.H., Hwang, B.J., Cho, D.Y., Kim, K.C., Kim, S.B., Hong, J.I., Park, J.W., Lee, M.Y.

المصدر: Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001 (Cat. No.01TH8548) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2001. IPFA 2001. Proceedings of the 2001 8th International Symposium on the. :165-168 2001

Relation: Proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2001

المؤلفون: Yoo, S.B., Kim, K.C., Cha, S.K.

المصدر: Proceedings. 6th International Conference on Advanced Systems for Advanced Applications Database systems for advanced applications Database Systems for Advanced Applications, 1999. Proceedings., 6th International Conference on. :347-354 1999

Relation: Proceedings. 6th International Conference on Database Systems for Advanced Applications

المؤلفون: Kang, S.C., Amare, Y., Anderson, T., Angelaszek, D., Anthony, N., Cheryian, K., Choi, G.H., Copley, M., Coutu, S., Derome, L., Eraud, L., Hagenau, L., Han, J.H., Huh, H.G., Hwang, Y.S., Hyun, H.J., Im, S., Jeon, H.B., Jeon, J.A., Jeong, S., Kim, H.J., Kim, K.C., Kim, M.H., Lee, H.Y., Lee, J., Lee, M.H., Liang, J., Link, J.T., Lu, L., Lundquist, J.P., Lutz, L., Menchaca-Rocha, A., Mernik, T., Mitchell, J.W., Mognet, S.I., Morton, S., Nester, M., Nutter, S., Ofoha, O., Park, H., Park, I.H., Park, J.M., Picot-Clemente, N., Quinn, R., Seo, E.S., Smith, J.R., Takeishi, R., Walpole, P., Weinmann, R.P., Wu, J., Yoon, Y.S.

المصدر: In Advances in Space Research 15 December 2019 64(12):2564-2569