يعرض 1 - 10 نتائج من 390 نتيجة بحث عن '"Kim, Taewhan"', وقت الاستعلام: 0.88s تنقيح النتائج
  1. 1
    مؤتمر
    Net Topology Exploration and Tuning for Mitigating Congestion in Global Routing

    المؤلفون: Kim, Hwapyong, Kim, Taewhan

    المصدر: 2024 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2024 IEEE International Symposium on. :1-5 May, 2024

    Relation: 2024 IEEE International Symposium on Circuits and Systems (ISCAS)

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  2. 2
    مؤتمر
    BOXGB: Design Parameter Optimization with Systematic Integration of Bayesian Optimization and XGBoost

    المؤلفون: Jeon, Chanhee, Won, Doyeon, Yang, Jaewan, Choi, Kyu-Myung, Kim, Taewhan

    المصدر: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-6 Mar, 2024

    Relation: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)

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  3. 3
    مؤتمر
    Standard Cell Layout Generator Amenable to Design Technology Co-Optimization in Advanced Process Nodes

    المؤلفون: Cho, Handong, Seo, Hyunbae, Chung, Sehyeon, Choi, Kyu-Myung, Kim, Taewhan

    المصدر: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2024. :1-6 Mar, 2024

    Relation: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)

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  4. 4
    مؤتمر
    Design and Technology Co-Optimization for Useful Skew Scheduling on Multi-Bit Flip-Flops

    المؤلفون: Kim, Suwan, Kim, Taewhan

    المصدر: 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD) Computer Aided Design (ICCAD), 2023 IEEE/ACM International Conference on. :1-9 Oct, 2023

    Relation: 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD)

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  5. 5
    مؤتمر
    Debanking Techniques on Multi-bit Flip-flops for Reinforcing Useful Clock Skew Scheduling

    المؤلفون: Yang, Jaewan, Kim, Taewhan

    المصدر: 2023 IEEE 36th International System-on-Chip Conference (SOCC) System-on-Chip Conference (SOCC), 2023 IEEE 36th International. :1-6 Sep, 2023

    Relation: 2023 IEEE 36th International System-on-Chip Conference (SOCC)

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  6. 6
    مؤتمر
    Machine Learning Driven Synthesis of Clock Gating

    المؤلفون: Won, Doyeon, Kim, Soomin, Kim, Taewhan

    المصدر: 2023 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED) Low Power Electronics and Design (ISLPED), 2023 IEEE/ACM International Symposium on. :1-6 Aug, 2023

    Relation: 2023 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)

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  7. 7
    مؤتمر
    Challenges on Design and Technology Co-Optimization: Design Automation Perspective

    المؤلفون: Kim, Taewhan

    المصدر: 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS) Circuits and Systems (MWSCAS), 2023 IEEE 66th International Midwest Symposium on. :212-216 Aug, 2023

    Relation: 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS)

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  8. 8
    مؤتمر
    Machine Learning Based Flip-Flop Grouping for Toggling Driven Clock Gating

    المؤلفون: Park, Sora, Kim, Taewhan

    المصدر: 2023 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2023 IEEE International Symposium on. :1-5 May, 2023

    Relation: 2023 IEEE International Symposium on Circuits and Systems (ISCAS)

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  9. 9
    مؤتمر
    DTOC: integrating Deep-learning driven Timing Optimization into the state-of-the-art Commercial EDA tool

    المؤلفون: Chang, Kyungjoon, Ahn, Jaehoon, Park, Heechun, Choi, Kyu-Myung, Kim, Taewhan

    المصدر: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023. :1-6 Apr, 2023

    Relation: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)

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  10. 10
    مؤتمر
    Synthesis and Utilization of Standard Cells Amenable to Gear Ratio of Gate-Metal Pitches for Improving Pin Accessibility

    المؤلفون: Jeong, Jooyeon, Chung, Sehyeon, Jo, Kyeongrok, Kim, Taewhan

    المصدر: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023. :1-6 Apr, 2023

    Relation: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)

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