المؤلفون: Zhao Chuan Lee, Kim Ming Ho, Zhi Hui Kong, Kim, Tony T.

المصدر: 2012 International SoC Design Conference (ISOCC) SoC Design Conference (ISOCC), 2012 International. :200-203 Nov, 2012

Relation: 2012 International SoC Design Conference (ISOCC 2012)

المؤلفون: Zhi Hui Kong, Kim Ming Ho, Tony Tae-Hyoung Kim, Zhao Chuan Lee

المساهمون: School of Electrical and Electronic Engineering, International SoC Design Conference (2012 : Jeju, Korea)

المصدر: ISOCC

مصطلحات موضوعية: Positive bias temperature instability, Reliability (semiconductor), Materials science, Negative-bias temperature instability, business.industry, Voltage control, Engineering::Electrical and electronic engineering [DRNTU], Electrical engineering, Static random-access memory, Circuit reliability, business, Stability (probability), Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cc351be311f969527af7a753b83f01fc
https://hdl.handle.net/10356/100241