-
1دورية أكاديميةA simulation study to evaluate the feasibility of midgap workfunction metal gates in 25 nm bulk CMOS
المؤلفون: Kingsuk Maitra, Misra, V.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 24(11):707-709 Nov, 2003
-
2
المؤلفون: Suman Datta, Kingsuk Maitra, Salil Mujumdar
المصدر: IEEE Transactions on Electron Devices. 59:72-78
مصطلحات موضوعية: Materials science, business.industry, Transistor, Integrated circuit layout, Electronic, Optical and Magnetic Materials, law.invention, Silicon-germanium, Stress (mechanics), chemistry.chemical_compound, Planar, chemistry, law, Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Optoelectronics, Node (circuits), Field-effect transistor, Electrical and Electronic Engineering, business
-
3Opportunities and Challenges of FinFET as a Device Structure Candidate for 14nm Node CMOS Technology
المؤلفون: Vamsi Paruchuri, Andres Bryant, Bruce B. Doris, Tenko Yamashita, Hiroshi Sunamura, Effendi Leobandung, Hemanth Jagannathan, Junli Wang, Atsuro Inada, Theodorus E. Standaert, Pranita Kulkarni, Robert J. Miller, Johnathan E. Faltermeier, Kingsuk Maitra, Huiming Bu, Veeraraghavan S. Basker, James A. O’Neill, Sivananda K. Kanakasabapathy, Chung-Hsun Lin, T. Yamamoto, Chun-Chen Yeh, Jin Cho, Mukesh Khare
المصدر: ECS Transactions. 34:81-86
مصطلحات موضوعية: Structure (mathematical logic), CMOS, business.industry, Computer science, Node (networking), Hardware_INTEGRATEDCIRCUITS, Hardware_PERFORMANCEANDRELIABILITY, business, Computer network
-
4
المؤلفون: Andreas Kerber, Eduard A. Cartier, M. Hargrove, Amlan Majumdar, Kingsuk Maitra, R. Carter
المصدر: IEEE Transactions on Electron Devices. 55:3175-3183
مصطلحات موضوعية: Materials science, Negative-bias temperature instability, business.industry, Electrical engineering, chemistry.chemical_element, Orders of magnitude (numbers), Electronic, Optical and Magnetic Materials, Tunnel effect, chemistry, CMOS, Relaxation (physics), Optoelectronics, Field-effect transistor, Electrical and Electronic Engineering, Tin, business, High-κ dielectric
-
5
المؤلفون: A. Marathe, Rune Hartung Jensen, K. Srinivasan, Brian Keith Langendorf, V. Jadhav, S. Chen, Julia Purtell, Kingsuk Maitra, Raj N. Master, Tung Thanh Nguyen, Ranjit Gannamani
المصدر: IRPS
مصطلحات موضوعية: Engineering, Reliability (semiconductor), Form factor (electronics), business.industry, Limit (music), Thermal, Electrical engineering, Electronic engineering, System on a chip, Operating voltage, business, Constant (mathematics), Mobile device
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e8d848bd77f2486c46e00db913f3f2e0
https://doi.org/10.1109/irps.2015.7112708 -
6
المؤلفون: Barry Linder, E. Cartier, P. Jamison, John C. Arnold, Vijay Narayanan, Evgeni Gusev, Roy A. Carruthers, Vamsi Paruchuri, Kingsuk Maitra, Dianne L. Lacey, Martin M. Frank, D.C. La Tulipe, Michelle L. Steen
المصدر: IEEE Electron Device Letters. 27:591-594
مصطلحات موضوعية: Electron mobility, Materials science, business.industry, chemistry.chemical_element, Chemical vapor deposition, Electronic, Optical and Magnetic Materials, Metal, chemistry, visual_art, MOSFET, Electronic engineering, visual_art.visual_art_medium, Optoelectronics, Process optimization, Electrical and Electronic Engineering, business, Tin, Layer (electronics), High-κ dielectric
-
7
المؤلفون: Navakanta Bhat, Kingsuk Maitra
المصدر: IEEE Transactions on Electron Devices. 51:409-414
مصطلحات موضوعية: Physics, Equivalent series resistance, Process (computing), Hardware_PERFORMANCEANDRELIABILITY, Electronic, Optical and Magnetic Materials, Reliability (semiconductor), CMOS, Electric field, Metric (mathematics), Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Inverter, Electrical and Electronic Engineering, Hardware_LOGICDESIGN, Electronic circuit
-
8
المؤلفون: R. J. Miller, J. Faltermeier, Pranita Kulkarni, Bruce B. Doris, Kingsuk Maitra, D. McHerron, N R Klymko, E Leobundung, H. Adhikari, Huiming Bu, Chun-Chen Yeh, Katherine L. Saenger, Vamsi Paruchuri, J. O'Neil, Veeraraghavan S. Basker, Ali Khakifirooz, Theodorus E. Standaert, Hemanth Jagannathan
المصدر: IEEE Electron Device Letters. 32:713-715
مصطلحات موضوعية: Materials science, business.industry, Transconductance, Electrical engineering, Silicon on insulator, Strained silicon, Electronic, Optical and Magnetic Materials, Logic gate, MOSFET, Optoelectronics, Field-effect transistor, Electrical and Electronic Engineering, business, Metal gate, High-κ dielectric
-
9
المؤلفون: S. Chen, Rune Hartung Jensen, Brian Keith Langendorf, Tung Thanh Nguyen, Ranjit Gannamani, Raj N. Master, Julia Purtell, N. Liu, A. Marathe, M. Mccormack, Kingsuk Maitra, S. Dixit
المصدر: 2014 IEEE International Reliability Physics Symposium.
مصطلحات موضوعية: Engineering, Reliability (semiconductor), User experience design, business.industry, Thermal, Heat transfer coefficient, Electronics, Heat sink, business, Proxy (statistics), Simulation, Voltage, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6acec7e9a1538a6542518a4d541f08a5
https://doi.org/10.1109/irps.2014.6860647 -
10
المؤلفون: Andreas Kerber, Frank Yeh, Robert J. Miller, Chung-Hsun Lin, Huiming Bu, Veeraraghavan S. Basker, Kingsuk Maitra, Pranita Kulkarni, Sujata Paul, Hemanth Jagannathan
المصدر: IEEE Electron Device Letters. 31:650-652
مصطلحات موضوعية: Materials science, business.industry, Transistor, Silicon on insulator, Electronic, Optical and Magnetic Materials, law.invention, CMOS, Parasitic capacitance, Depletion region, law, MOSFET, Electronic engineering, Optoelectronics, Equivalent circuit, Electrical and Electronic Engineering, business, High-κ dielectric