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1مؤتمر
المصدر: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE). :798-803 Mar, 2020
Relation: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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2مؤتمر
المؤلفون: Holst, Stefan, Schneider, Eric, Kochte, Michael A., Wen, Xiaoqing, Wunderlich, Hans-Joachim
المصدر: 2019 IEEE International Test Conference (ITC) Test Conference (ITC), 2019 IEEE International. :1-10 Nov, 2019
Relation: 2019 IEEE International Test Conference (ITC)
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3مؤتمر
المؤلفون: Raiola, Pascal, Kochte, Michael A., Atteya, Ahmed, Gomez, Laura Rodriguez, Wunderlich, Hans-Joachim, Becker, Bernd, Sauer, Matthias
المصدر: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS) On-Line Testing And Robust System Design (IOLTS), 2018 IEEE 24th International Symposium on. :91-96 Jul, 2018
Relation: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)
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4مؤتمر
المؤلفون: Atteya, Ahmed, Kochte, Michael A., Sauer, Matthias, Raiola, Pascal, Becker, Bernd, Wunderlich, Hans-Joachim
المصدر: 2018 IEEE 23rd European Test Symposium (ETS) Test Symposium (ETS), 2018 IEEE 23rd European. :1-6 May, 2018
Relation: 2018 IEEE European Test Symposium (ETS)
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5مؤتمر
المصدر: 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC) Design Automation Conference (ASP-DAC), 2018 23rd Asia and South Pacific. :470-475 Jan, 2018
Relation: 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC)
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6مؤتمر
المؤلفون: Ull, Dominik, Kochte, Michael, Wunderlich, Hans-Joachim
المصدر: 2017 IEEE 26th Asian Test Symposium (ATS) ATS Asian Test Symposium (ATS), 2017 IEEE 26th. :127-132 Nov, 2017
Relation: 2017 IEEE 26th Asian Test Symposium (ATS)
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7مؤتمر
المؤلفون: Holst, Stefan, Schneider, Eric, Kawagoe, Koshi, Kochte, Michael A., Miyase, Kohei, Wunderlich, Hans-Joachim, Kajihara, Seiji, Wen, Xiaoqing
المصدر: 2017 IEEE International Test Conference (ITC) Test Conference (ITC), 2017 IEEE International. :1-8 Oct, 2017
Relation: 2017 IEEE International Test Conference (ITC)
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8مؤتمر
المصدر: 2017 International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2017 International. :119-124 Sep, 2017
Relation: 2017 International Test Conference in Asia (ITC-Asia)
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9مؤتمر
المؤلفون: Kochte, Michael A., Sauer, Matthias, Gomez, Laura Rodriguez, Raiola, Pascal, Becker, Bernd, Wunderlich, Hans-Joachim
المصدر: 2017 22nd IEEE European Test Symposium (ETS) Test Symposium (ETS), 2017 22nd IEEE. :1-6 May, 2017
Relation: 2017 22nd IEEE European Test Symposium (ETS)
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10مؤتمر
المؤلفون: Liu, Chang, Kochte, Michael A., Wunderlich, Hans-Joachim
المصدر: 2017 IEEE 35th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2017 IEEE 35th. :1-6 Apr, 2017
Relation: 2017 IEEE 35th VLSI Test Symposium (VTS)