يعرض 1 - 10 نتائج من 131 نتيجة بحث عن '"Kochte, Michael A."', وقت الاستعلام: 0.87s تنقيح النتائج
  1. 1
    مؤتمر
    Synthesis of Fault-Tolerant Reconfigurable Scan Networks

    المؤلفون: Brandhofer, Sebastian, Kochte, Michael A., Wunderlich, Hans-Joachim

    المصدر: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE). :798-803 Mar, 2020

    Relation: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)

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  2. 2
    مؤتمر
    Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses

    المؤلفون: Holst, Stefan, Schneider, Eric, Kochte, Michael A., Wen, Xiaoqing, Wunderlich, Hans-Joachim

    المصدر: 2019 IEEE International Test Conference (ITC) Test Conference (ITC), 2019 IEEE International. :1-10 Nov, 2019

    Relation: 2019 IEEE International Test Conference (ITC)

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  3. 3
    مؤتمر
    Detecting and Resolving Security Violations in Reconfigurable Scan Networks

    المؤلفون: Raiola, Pascal, Kochte, Michael A., Atteya, Ahmed, Gomez, Laura Rodriguez, Wunderlich, Hans-Joachim, Becker, Bernd, Sauer, Matthias

    المصدر: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS) On-Line Testing And Robust System Design (IOLTS), 2018 IEEE 24th International Symposium on. :91-96 Jul, 2018

    Relation: 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS)

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  4. 4
    مؤتمر
    Online prevention of security violations in reconfigurable scan networks

    المؤلفون: Atteya, Ahmed, Kochte, Michael A., Sauer, Matthias, Raiola, Pascal, Becker, Bernd, Wunderlich, Hans-Joachim

    المصدر: 2018 IEEE 23rd European Test Symposium (ETS) Test Symposium (ETS), 2018 IEEE 23rd European. :1-6 May, 2018

    Relation: 2018 IEEE European Test Symposium (ETS)

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  5. 5
    مؤتمر
    Multi-level timing simulation on GPUs

    المؤلفون: Schneider, Eric, Kochte, Michael A., Wunderlich, Hans-Joachim

    المصدر: 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC) Design Automation Conference (ASP-DAC), 2018 23rd Asia and South Pacific. :470-475 Jan, 2018

    Relation: 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC)

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  6. 6
    مؤتمر
    Structure-Oriented Test of Reconfigurable Scan Networks

    المؤلفون: Ull, Dominik, Kochte, Michael, Wunderlich, Hans-Joachim

    المصدر: 2017 IEEE 26th Asian Test Symposium (ATS) ATS Asian Test Symposium (ATS), 2017 IEEE 26th. :127-132 Nov, 2017

    Relation: 2017 IEEE 26th Asian Test Symposium (ATS)

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  7. 7
    مؤتمر
    Analysis and mitigation or IR-Drop induced scan shift-errors

    المؤلفون: Holst, Stefan, Schneider, Eric, Kawagoe, Koshi, Kochte, Michael A., Miyase, Kohei, Wunderlich, Hans-Joachim, Kajihara, Seiji, Wen, Xiaoqing

    المصدر: 2017 IEEE International Test Conference (ITC) Test Conference (ITC), 2017 IEEE International. :1-8 Oct, 2017

    Relation: 2017 IEEE International Test Conference (ITC)

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  8. 8
    مؤتمر
    Trustworthy reconfigurable access to on-chip infrastructure

    المؤلفون: Kochte, Michael A., Baranowski, Rafal, Wunderlich, Hans-Joachim

    المصدر: 2017 International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2017 International. :119-124 Sep, 2017

    Relation: 2017 International Test Conference in Asia (ITC-Asia)

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  9. 9
    مؤتمر
    Specification and verification of security in reconfigurable scan networks

    المؤلفون: Kochte, Michael A., Sauer, Matthias, Gomez, Laura Rodriguez, Raiola, Pascal, Becker, Bernd, Wunderlich, Hans-Joachim

    المصدر: 2017 22nd IEEE European Test Symposium (ETS) Test Symposium (ETS), 2017 22nd IEEE. :1-6 May, 2017

    Relation: 2017 22nd IEEE European Test Symposium (ETS)

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  10. 10
    مؤتمر
    Aging monitor reuse for small delay fault testing

    المؤلفون: Liu, Chang, Kochte, Michael A., Wunderlich, Hans-Joachim

    المصدر: 2017 IEEE 35th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2017 IEEE 35th. :1-6 Apr, 2017

    Relation: 2017 IEEE 35th VLSI Test Symposium (VTS)

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