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1مؤتمر
المؤلفون: Phang, J.C.H., Chan, D.S.H., Tan, S.L., Len, W.B., Yim, K.H., Koh, L.S., Chua, C.M., Balk, L.J.
المصدر: Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. Proceedings of the 12th International Symposium on the. :275-281 2005
Relation: Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits
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2مؤتمر
المؤلفون: Phang, J.C.H., Chan, D.S.H., Palaniappan, M., Chin, J.M., Davis, B., Bruce, M., Wilcox, J., Gilfeather, G., Chua, C.M., Koh, L.S., Ng, H.Y., Tan, S.H.
المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :255-261 2004
Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004
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3مؤتمر
المؤلفون: Phang, J.C.H., Goh, S.H., Quah, A.C.T., Chua, C.M., Koh, L.S., Tan, S.H., Chua, W.P.
المصدر: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the. :11-18 Jul, 2009
Relation: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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4مؤتمر
المؤلفون: Goh, S.H., Quah, A.C.T., Sheppard, C.J.R., Chua, C.M., Koh, L.S., Phang, J.C.H.
المصدر: 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2008. IPFA 2008. 15th International Symposium on the. :1-6 Jul, 2008
Relation: 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits
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5مؤتمر
المؤلفون: Tan, S.L., Teo, J.K.J., Toh, K.H., Isakov, D., Chan, D.S.H., Koh, L.S., Chua, C.M., Phang, J.C.H.
المصدر: 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2008. IPFA 2008. 15th International Symposium on the. :1-5 Jul, 2008
Relation: 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits
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6مؤتمرDC-Coupled Laser Induced Detection System for Fault Localization in Microelectronic Failure Analysis
المؤلفون: Quah, A.C.T., Koh, L.S., Chua, C.M., Palaniappan, M., Chin, JM., Phang, J.C.H.
المصدر: 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2006. 13th International Symposium on the. :327-332 Jul, 2006
Relation: 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits
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7مؤتمر
المؤلفون: Tan, S.L., Yim, K.H., Chan, D.S.H., Phang, J.C.H., Zhou, Y., Balk, L.J., Chua, C.M., Koh, L.S.
المصدر: 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2006. 13th International Symposium on the. :315-319 Jul, 2006
Relation: 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits
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8مؤتمر
المؤلفون: Teo, J.K.J., Chua, C.M., Koh, L.S., Phang, J.C.H.
المصدر: 2011 International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2011 IEEE International. :FA.4.1-FA.4.6 Apr, 2011
Relation: 2011 IEEE International Reliability Physics Symposium (IRPS)
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9دورية أكاديمية
المؤلفون: Chee, C.L., Shuen, W.H. Timothy, Tan, Y.L. Charmaine, Chua, Y.H. Joelle, Liu, X. Adrianna, Koh, L.S., Ba, R., Toh, H.C.
المصدر: In ESMO Open October 2023 8(1) Supplement 5
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10مؤتمر
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