المؤلفون: Phang, J.C.H., Chan, D.S.H., Tan, S.L., Len, W.B., Yim, K.H., Koh, L.S., Chua, C.M., Balk, L.J.

المصدر: Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. Proceedings of the 12th International Symposium on the. :275-281 2005

Relation: Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits

المؤلفون: Phang, J.C.H., Chan, D.S.H., Palaniappan, M., Chin, J.M., Davis, B., Bruce, M., Wilcox, J., Gilfeather, G., Chua, C.M., Koh, L.S., Ng, H.Y., Tan, S.H.

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :255-261 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Phang, J.C.H., Goh, S.H., Quah, A.C.T., Chua, C.M., Koh, L.S., Tan, S.H., Chua, W.P.

المصدر: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2009. IPFA 2009. 16th IEEE International Symposium on the. :11-18 Jul, 2009

Relation: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Goh, S.H., Quah, A.C.T., Sheppard, C.J.R., Chua, C.M., Koh, L.S., Phang, J.C.H.

المصدر: 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2008. IPFA 2008. 15th International Symposium on the. :1-6 Jul, 2008

Relation: 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits

المؤلفون: Tan, S.L., Teo, J.K.J., Toh, K.H., Isakov, D., Chan, D.S.H., Koh, L.S., Chua, C.M., Phang, J.C.H.

المصدر: 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2008. IPFA 2008. 15th International Symposium on the. :1-5 Jul, 2008

Relation: 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits

المؤلفون: Quah, A.C.T., Koh, L.S., Chua, C.M., Palaniappan, M., Chin, JM., Phang, J.C.H.

المصدر: 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2006. 13th International Symposium on the. :327-332 Jul, 2006

Relation: 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits

المؤلفون: Tan, S.L., Yim, K.H., Chan, D.S.H., Phang, J.C.H., Zhou, Y., Balk, L.J., Chua, C.M., Koh, L.S.

المصدر: 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2006. 13th International Symposium on the. :315-319 Jul, 2006

Relation: 2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits

المؤلفون: Teo, J.K.J., Chua, C.M., Koh, L.S., Phang, J.C.H.

المصدر: 2011 International Reliability Physics Symposium Reliability Physics Symposium (IRPS), 2011 IEEE International. :FA.4.1-FA.4.6 Apr, 2011

Relation: 2011 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Chee, C.L., Shuen, W.H. Timothy, Tan, Y.L. Charmaine, Chua, Y.H. Joelle, Liu, X. Adrianna, Koh, L.S., Ba, R., Toh, H.C.

المصدر: In ESMO Open October 2023 8(1) Supplement 5

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