المؤلفون: Sasse, G.T., de Kort, R., Schmitz, J.

المصدر: Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :113-116 2004

Relation: Proceedings of the 34th European Solid-State Device Research Conference

المؤلفون: Paasschens, J.C.J., de Kort, R.

المصدر: Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting. :108-111 2004

Relation: Proceedings of the 2004 Bipolar/BiCMOS Circuits and Technology Meeting

المؤلفون: Donkers, J.J.T.M., Vanhoucke, T., Agarwal, P., Hueting, R.J.E., Meunier-Beillard, P., Vijayaraghavan, M.N., Magnee, P.H.C., Verheijen, M.A., de Kort, R., Slotboom, J.W.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :243-246 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Tiemeijer, L.F., Havens, R.J., de Kort, R., Scholten, A.J., van Langevelde, R., Klaassen, D.B.M., Sasse, G.T., Bouttement, Y., Petot, C., Bardy, S., Gloria, D., Scheer, P., Boret, S., Van Haaren, B., Clement, C., Larchanche, J.-F., Lim, I.-S., Duvallet, A., Zlotnicka, A.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :441-444 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Melai, J., Magnee, P.H.C., Hueting, R.J.E., Neuilly, F.I., de Kort, R., Slotboom, J.W.

المصدر: 2004 Proceedings of the 16th International Symposium on Power Semiconductor Devices and ICs Power semiconductor devices and ICs Power Semiconductor Devices and ICs, 2004. Proceedings. ISPSD '04. The 16th International Symposium on. :33-36 2004

Relation: Proceedings of the 16th International Symposium on Power Semiconductor Devices & IC's

المؤلفون: Schmitz, J., Cubaynes, F.N., Havens, R.J., de Kort, R., Scholten, A.J., Tiemeijer, L.F.

المصدر: International Conference on Microelectronic Test Structures, 2003. Microelectronic test structures Microelectronic Test Structures, 2003. International Conference on. :181-185 2003

Relation: ICMTS 2002. Proceedings of the 2003 International Conference on Microelectronic Test Structures

المؤلفون: Tiemeijer, L.F., Havens, R.J., de Kort, R., Scholten, A.J.

المصدر: IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 53(9):2917-2925 Sep, 2005

المؤلفون: Schmitz, J., Cubaynes, F.N., Havens, R.J., de Kort, R., Scholten, A.J., Tiemeijer, L.F.

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 17(2):150-154 May, 2004

المؤلفون: de Kort, R. M.

المصدر: Tijdschrift voor de Procespraktijk; apr2024, Issue 2, p51-54, 4p

المؤلفون: Schmitz, J., Cubaynes, F.N., Havens, R.J., de Kort, R., Scholten, A.J., Tiemeijer, L.F.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 24(1):37-39 Jan, 2003