المؤلفون: Achanta, Ravi, McGahay, V., Boffoli, S., Kothandaraman, C., Gambino, J.

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :P32-1-P32-4 Mar, 2022

Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Hu, G., Nowak, J.J., Gottwald, M.G., Sun, J.Z., Houssameddine, D., Bak, J., Brown, S.L., Hashemi, P., He, Q., Kim, J., Kothandaraman, C., Lauer, G., Lee, H.K., Suwannasiri, T., Trouilloud, P.L., Worledge, D.C.

المصدر: IEEE Magnetics Letters IEEE Magn. Lett. Magnetics Letters, IEEE. 10:1-4 2019

المؤلفون: Hu, G., Nowak, J. J., Gottwald, M. G., Brown, S. L., Doris, B., D'Emic, C. P., Hashemi, P., Houssameddine, D., He, Q., Kim, D., Kim, J., Kothandaraman, C., Lauer, G., Lee, H K, Marchack, N., Reuter, M., Robertazzi, R. P., Sun, J. Z., Suwannasiri, T., Trouilloud, P. L., Woo, S., Worledge, D. C.

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :2.6.1-2.6.4 Dec, 2019

Relation: 2019 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Hu, G., Nowak, J. J., Lauer, G., Lee, J. H., Sun, J. Z., Harms, J., Annunziata, A., Brown, S., Chen, W., Kim, Y. H., Marchack, N., Murthy, S., Kothandaraman, C., O'Sullivan, E. J., Park, J. H., Reuter, M., Robertazzi, R. P., Trouilloud, P. L., Zhu, Y., Worledge, D. C.

المصدر: 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) VLSI Design, Automation and Test (VLSI-DAT), 2017 International Symposium on. :1-2 Apr, 2017

Relation: 2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

المؤلفون: Hu, G., Gottwald, M. G., He, Q., Park, J. H., Lauer, G., Nowak, J. J., Brown, S. L., Doris, B., Edelstein, D., Evarts, E. R., Hashemi, P., Khan, B., Kim, Y. H., Kothandaraman, C., Marchack, N., O'Sullivan, E. J., Reuter, M., Robertazzi, R. P., Sun, J. Z., Suwannasiri, T., Trouilloud, P. L., Zhu, Y., Worledge, D. C.

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :38.3.1-38.3.4 Dec, 2017

Relation: 2017 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Kothandaraman, C., Rosenblatt, S., Safran, J., Oldiges, P., Kulkarni-Kerber, P., Xumalo, J., Landers, W., Liu, J., Oakley, J. A., Butt, S., Graves-Abe, T. L., Robson, N., Farooq, M. G., Berger, D., Iyer, S. S.

المصدر: 2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :9.6.1-9.6.4 Dec, 2016

Relation: 2016 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Tian, C., Moy, D., Le, C., Messenger, B., Kothandaraman, C., Safran, J., Wu, S., Robson, N., Iyer, S. S.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 8(3):536-542 Sep, 2008

المؤلفون: Kothandaraman, C., Cohen, S.

المصدر: 2016 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2016 IEEE International. :6B-3-1-6B-3-4 Apr, 2016

Relation: 2016 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Chen, X., Samavedam, S., Narayanan, V., Stein, K., Hobbs, C., Baiocco, C., Li, W., Jaeger, D., Zaleski, M., Yang, H. S., Kim, N., Lee, Y., Zhang, D., Kang, L., Chen, J., Zhuang, H., Sheikh, A., Wallner, J., Aquilino, M., Han, J., Jin, Z., Li, J., Massey, G., Kalpat, S., Jha, R., Moumen, N., Mo, R., Kirshnan, S., Wang, X., Chudzik, M., Chowdhury, M., Nair, D., Reddy, C., Teh, Y. W., Kothandaraman, C., Coolbaugh, D., Pandey, S., Tekleab, D., Thean, A., Sherony, M., Lage, C., Sudijono, J., Lindsay, R., Ku, J. H., Khare, M., Steegen, A.

المصدر: 2008 Symposium on VLSI Technology VLSI Technology, 2008 Symposium on. :88-89 Jun, 2008

Relation: 2008 Symposium on VLSI Technology

المؤلفون: Tian, C., Moy, D., Messenger, B., Kothandaraman, C., Safran, J., Wu, S., Robson, N., Iyer, SS.

المصدر: 2007 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2007. IRW 2007. IEEE International. :90-93 Oct, 2007

Relation: 2007 IEEE International Integrated Reliability Workshop Final Report