يعرض 1 - 10 نتائج من 231 نتيجة بحث عن '"Kovalgin, A. Y."', وقت الاستعلام: 1.32s تنقيح النتائج
  1. 1
    مؤتمر
    Electrical behavior of ALD-molybdenum films in the thin-film limit

    المؤلفون: van der Zouw, Kees, Dulfer, Simone D., Aarnink, Antonius A.I., Kovalgin, Alexey Y.

    المصدر: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2024 IEEE 36th International Conference on. :1-6 Apr, 2024

    Relation: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)

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  2. 2
    مؤتمر
    Electrical characterization of hot-wire assisted atomic layer deposited Tungsten films

    المؤلفون: van der Zouw, Kees, Aarnink, Antonius A.I., Schmitz, Jurriaan, Kovalgin, Alexey Y.

    المصدر: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2019 IEEE 32nd International Conference on. :48-53 Mar, 2019

    Relation: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)

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  3. 3
    مؤتمر
    Electrical test structures for verifying continuity of ultra-thin insulating and conducting films

    المؤلفون: Banerjee, Sourish, van der Velde, Rik, Yang, Mengdi, Schmitz, Jurriaan, Kovalgin, Alexey Y.

    المصدر: 2017 International Conference of Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2017 International Conference of. :1-6 Mar, 2017

    Relation: 2017 International Conference of Microelectronic Test Structures (ICMTS)

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  4. 4
    مؤتمر
    Dealing with leakage current in TLM and CTLM structures with vertical junction isolation

    المؤلفون: Bystrova, Svetlana N., Smits, Sander M., Klootwijk, Johan H., Wolters, Rob A. M., Kovalgin, Alexey Y., Nanver, Lis K., Schmitz, Jurriaan

    المصدر: 2017 International Conference of Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2017 International Conference of. :1-6 Mar, 2017

    Relation: 2017 International Conference of Microelectronic Test Structures (ICMTS)

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  5. 5
    مؤتمر
    An approach to characterize ultra-thin conducting films protected against native oxidation by an in-situ capping layer

    المؤلفون: Van Bui, H., Wiggers, F. B., de Jong, M. P., Kovalgin, A. Y.

    المصدر: 2014 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2014 International Conference on. :53-57 Mar, 2014

    Relation: 2014 International Conference on Microelectronic Test Structures (ICMTS)

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  6. 6
    مؤتمر
    Micro- and nano-link ultra-low power heaters for sensors

    المؤلفون: Groenland, A. W., Vereshchagina, E., Kovalgin, A. Y., Wolters, R. A. M., Gardeniers, J. G. E., Schmitz, J.

    المصدر: 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2012 Proceedings of the European. :169-172 Sep, 2012

    Relation: ESSDERC 2012 - 42nd European Solid State Device Research Conference

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  7. 7
    مؤتمر
    Light emission enhancement by geometrical scaling of carrier injectors in Si-based LEDs

    المؤلفون: Piccolo, G., Puliyankot, V., Kovalgin, A. Y., Hueting, R. J. E., Heringa, A., Schmitz, J.

    المصدر: 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2011 Proceedings of the European. :175-178 Sep, 2011

    Relation: ESSDERC 2011 - 41st European Solid State Device Research Conference

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  8. 8
    دورية أكاديمية
    Li intercalation into multilayer graphene with controlled defect densities

    المؤلفون: Ochapski, Michal W., Ataç, Derya, Sanderink, Johnny G.M., Kovalgin, Alexey Y., de Jong, Michel P.

    المصدر: In Carbon Trends July 2021 4

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  9. 9
    دورية أكاديمية
    Large scale structures in chemical vapor deposition-grown graphene on Ni thin films

    المؤلفون: Ataç, Derya, Sanderink, Johnny G.M., Kinge, Sachin, Gravesteijn, Dirk J., Kovalgin, Alexey Y., de Jong, Michel P.

    المصدر: In Thin Solid Films 1 September 2020 709

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  10. 10
    دورية أكاديمية
    Four Point Probe Structures With Buried and Surface Electrodes for the Electrical Characterization of Ultrathin Conducting Films

    المؤلفون: Groenland, A. W., Wolters, R. A. M., Kovalgin, A. Y., Schmitz, J.

    المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 25(2):178-184 May, 2012

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