Alternate Title: Machine-readable and machine-actionable digital calibration certificate (DCC) and its use in practice. (English)

المؤلفون: Hackel, Siegfried, Schönhals, Shanna, Krah, Thomas, Doering, Lutz

المصدر: Technisches Messen; Jan2024, Vol. 91 Issue 1, p51-62, 12p

مصطلحات موضوعية: DIGITAL certificates, DIGITAL signatures, INFORMATION sharing, DATA modeling, METROLOGY, CRYPTOGRAPHY

مصطلحات جغرافية: EUROPE

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المؤلفون: Al Mamun, Abdullah, Hussein, Ahmed, Keidel, Anke, Matamala, Antonio, Gloger, Benjamin, Hyland, Brett, Cooksey, Catherine C., Rohrig, Christian, Francese, Claudio, Pietri, Damiano, Hutzschenreuter, Daniel, Balslev-Harder, David, Nahuel Coppa, Diego, Camara, Dinis, Macedo, Eric Matos, Söylev Öktem, Gamze, Foyer, Gisa, Koch, Hans, Smith, Ian, Garcia, Igor Fernando Modesto, Domínguez-Mendoza, Itzel, Fester, Jakob, Lopez-Celis, José Armando, Suárez Barón, Juan Carlos, Haller, Julian, Jagieniak, Justin, Yamazawa, Kazuaki, Stotz, Maik, Bierzychudek, Marcos E., Kuster, Mark, Stocker, Markus, Häfner, Martin, Brown, Michael, Gadelrab, Mohammed S., Jordan, Moritz, Demir, Muhammed-Ali, Werhahn, Olav, Thongluang, Praiya, Hilgers, Robert, Fay, Robin, Schönhals, Shanna, Hackel, Siegfried, Parana, Sunantiya, Kuch, Susanne, Al-Rahali, Talaat Abdulkadder, Pathiragoda, Thilini, Engel, Thomas, Krah, Thomas

مصطلحات موضوعية: Different DCC Approaches, DCC and Industry, Digital SchemaX (DX), DCC-Tools, Digital SI (D-SI), DCC and Machines, Security in DCC, Digital Calibration Certificate (DCC), Digital Reference Materials (DRM), Digital Quality Infrastructure (QI Digital), Accreditation, Semantics, Human Readable DCC, Persistent Identification, DCC Good Practice (GP), Commercial Approaches to DCC

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0235396facfa4f310a57e980fbf2c06d

المؤلفون: Laiz, Héctor, Hackel, Siegfried, Härtig, Frank, Schrader, Thorsten, Shanna, Shanna, Loewe, Jan, Doering, Lutz, Gloger, Benjamin, Jagieniak, Justin, Hutzschenreuter, Daniel, Söylev-Öktem, Gamze, Phuaknoi, Pawat, Mongkolsuttirat, Kittisun, Chantawong, Narin, Limthunyalak, Wasin, Buajarern, Jariya, Hanisch, Robert, Fedchak, James Antony, Choquette, Steven, Rimmer, Caterine, Long, Benjamin, Plante, Raymond, Lippa, Katrice, Camara, Dinis, Saxholm, Sari, Kärkkäinen, Anu, Hemming, Björn, Sairanen, Hannu, Koskinen, Sami, Nummiluikki, Juho, Riska, Kennet, Järnefelt, Tapio, Mustapää, Tuukka, Viitala, Raine, Ijäs, Miikka, Brandt, Jari, Haapalainen, Mikko, Videnoja, Emmi, Banholzer, Karlheinz, Müller-Schöll, Christian, Haller, Julian, Reitzer, Heiko, Kuenz, Eric, Koch, Hans, Lopez-Celis, Jose Armando, Dominguez-Mendoza, Itzel, Galvan-Hernandez, Carlos, Garcia-Gonzalez, Aldo, Gasca Aragon, Hugo, Ramos-Monsalvo, Oscar, Kuster, Mark, Tobola, Andreas, Bernien, Matthias, Bock, Thomas, Niepraschk, Rolf, Jousten, Karl, Matamala, Antonio, Proskurin, Pavel, Engel, Thomas, Smith, Ian, Stotz, Maik, Stobe, Caroline, Röske, Dirk, Schwartz, Schwartz Michael L., Cenker, Greg, Kuch, Susanne, Kirmes, Raoul, Witt, Florian, Bakri, Saad Ali Haj, Al-Rahali, Talaat, Busser, Lisa, Xiong, Xingchuang, Brown, Robert, Morse, Ed, Krah, Thomas

مصطلحات موضوعية: Digital Test Certificate (DTC), DCC Good Practice, Digital SchemaX (DX), Envelope Digital Certificate (EDC), Digital SI (D-SI), Security in DCC, Quality Information Framework (QIF), Digital Calibration Certificate (DCC), Excel tool for generating DCCs, Digital Reference Materials (DRM)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7f861f45b95b3569361c833c718f14b

المؤلفون: Richter, Claudia, Krah, Thomas, Büttgenbach, Stephanus

المصدر: Microsystem Technologies: Micro- and NanosystemsInformation Storage and Processing Systems. August 2012 18(7-8):1109-1118

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المؤلفون: Wedmann, Achim, Kniel, Karin, Krah, Thomas, Härtig, Frank

المصدر: Technisches Messen; Aug2014, Vol. 81 Issue 7/8, p381-386, 6p

مصطلحات موضوعية: ACCURACY, METROLOGY, STANDARDS, ELECTRONIC probes, TECHNOLOGY

المؤلفون: Schrader, Christian, Herbst, Christian, Tutsch, Rainer, Büttgenbach, Stephanus, Krah, Thomas

المصدر: Key Engineering Materials; May 2010, Vol. 437 Issue: 1 p136-140, 5p