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1دورية أكاديمية
Alternate Title: Machine-readable and machine-actionable digital calibration certificate (DCC) and its use in practice. (English)
المؤلفون: Hackel, Siegfried, Schönhals, Shanna, Krah, Thomas, Doering, Lutz
المصدر: Technisches Messen; Jan2024, Vol. 91 Issue 1, p51-62, 12p
مصطلحات موضوعية: DIGITAL certificates, DIGITAL signatures, INFORMATION sharing, DATA modeling, METROLOGY, CRYPTOGRAPHY
مصطلحات جغرافية: EUROPE
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2دورية أكاديمية
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المؤلفون: Al Mamun, Abdullah, Hussein, Ahmed, Keidel, Anke, Matamala, Antonio, Gloger, Benjamin, Hyland, Brett, Cooksey, Catherine C., Rohrig, Christian, Francese, Claudio, Pietri, Damiano, Hutzschenreuter, Daniel, Balslev-Harder, David, Nahuel Coppa, Diego, Camara, Dinis, Macedo, Eric Matos, Söylev Öktem, Gamze, Foyer, Gisa, Koch, Hans, Smith, Ian, Garcia, Igor Fernando Modesto, Domínguez-Mendoza, Itzel, Fester, Jakob, Lopez-Celis, José Armando, Suárez Barón, Juan Carlos, Haller, Julian, Jagieniak, Justin, Yamazawa, Kazuaki, Stotz, Maik, Bierzychudek, Marcos E., Kuster, Mark, Stocker, Markus, Häfner, Martin, Brown, Michael, Gadelrab, Mohammed S., Jordan, Moritz, Demir, Muhammed-Ali, Werhahn, Olav, Thongluang, Praiya, Hilgers, Robert, Fay, Robin, Schönhals, Shanna, Hackel, Siegfried, Parana, Sunantiya, Kuch, Susanne, Al-Rahali, Talaat Abdulkadder, Pathiragoda, Thilini, Engel, Thomas, Krah, Thomas
مصطلحات موضوعية: Different DCC Approaches, DCC and Industry, Digital SchemaX (DX), DCC-Tools, Digital SI (D-SI), DCC and Machines, Security in DCC, Digital Calibration Certificate (DCC), Digital Reference Materials (DRM), Digital Quality Infrastructure (QI Digital), Accreditation, Semantics, Human Readable DCC, Persistent Identification, DCC Good Practice (GP), Commercial Approaches to DCC
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0235396facfa4f310a57e980fbf2c06d
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4
المؤلفون: Laiz, Héctor, Hackel, Siegfried, Härtig, Frank, Schrader, Thorsten, Shanna, Shanna, Loewe, Jan, Doering, Lutz, Gloger, Benjamin, Jagieniak, Justin, Hutzschenreuter, Daniel, Söylev-Öktem, Gamze, Phuaknoi, Pawat, Mongkolsuttirat, Kittisun, Chantawong, Narin, Limthunyalak, Wasin, Buajarern, Jariya, Hanisch, Robert, Fedchak, James Antony, Choquette, Steven, Rimmer, Caterine, Long, Benjamin, Plante, Raymond, Lippa, Katrice, Camara, Dinis, Saxholm, Sari, Kärkkäinen, Anu, Hemming, Björn, Sairanen, Hannu, Koskinen, Sami, Nummiluikki, Juho, Riska, Kennet, Järnefelt, Tapio, Mustapää, Tuukka, Viitala, Raine, Ijäs, Miikka, Brandt, Jari, Haapalainen, Mikko, Videnoja, Emmi, Banholzer, Karlheinz, Müller-Schöll, Christian, Haller, Julian, Reitzer, Heiko, Kuenz, Eric, Koch, Hans, Lopez-Celis, Jose Armando, Dominguez-Mendoza, Itzel, Galvan-Hernandez, Carlos, Garcia-Gonzalez, Aldo, Gasca Aragon, Hugo, Ramos-Monsalvo, Oscar, Kuster, Mark, Tobola, Andreas, Bernien, Matthias, Bock, Thomas, Niepraschk, Rolf, Jousten, Karl, Matamala, Antonio, Proskurin, Pavel, Engel, Thomas, Smith, Ian, Stotz, Maik, Stobe, Caroline, Röske, Dirk, Schwartz, Schwartz Michael L., Cenker, Greg, Kuch, Susanne, Kirmes, Raoul, Witt, Florian, Bakri, Saad Ali Haj, Al-Rahali, Talaat, Busser, Lisa, Xiong, Xingchuang, Brown, Robert, Morse, Ed, Krah, Thomas
مصطلحات موضوعية: Digital Test Certificate (DTC), DCC Good Practice, Digital SchemaX (DX), Envelope Digital Certificate (EDC), Digital SI (D-SI), Security in DCC, Quality Information Framework (QIF), Digital Calibration Certificate (DCC), Excel tool for generating DCCs, Digital Reference Materials (DRM)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7f861f45b95b3569361c833c718f14b
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5دورية أكاديمية
المؤلفون: Richter, Claudia, Krah, Thomas, Büttgenbach, Stephanus
المصدر: Microsystem Technologies: Micro- and NanosystemsInformation Storage and Processing Systems. August 2012 18(7-8):1109-1118
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6دورية أكاديمية
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7دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
8دورية أكاديمية
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9دورية أكاديمية
المؤلفون: Wedmann, Achim, Kniel, Karin, Krah, Thomas, Härtig, Frank
المصدر: Technisches Messen; Aug2014, Vol. 81 Issue 7/8, p381-386, 6p
مصطلحات موضوعية: ACCURACY, METROLOGY, STANDARDS, ELECTRONIC probes, TECHNOLOGY
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10دورية
المؤلفون: Schrader, Christian, Herbst, Christian, Tutsch, Rainer, Büttgenbach, Stephanus, Krah, Thomas
المصدر: Key Engineering Materials; May 2010, Vol. 437 Issue: 1 p136-140, 5p