المؤلفون: Knoll, D., Heinemann, B., Barth, R., Blum, K., Borngraber, J., Drews, J., Ehwald, K.-E., Fischer, G., Fox, A., Grabolla, T., Haak, U., Hoppner, W., Korndorfer, F., Kuck, B., Marschmeyer, S., Richter, H., Rucker, H., Schley, P., Schmidt, D., Scholz, R., Senapati, B., Tillack, B., Winkler, W., Wolansky, D., Wolf, C., Wulf, H.-E., Yamamoto, Y., Zaumseil, P.

المصدر: Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting. :241-244 2004

Relation: Proceedings of the 2004 Bipolar/BiCMOS Circuits and Technology Meeting

المؤلفون: Heinemann, B., Barth, R., Bolze, D., Drews, J., Formanek, P., Grabolla, T., Haak, U., Hoppner, W., Kopke, D.K., Kuck, B., Kurps, R., Marschmeyer, S., Richter, H.H., Rucker, H., Schley, P., Schmidt, D., Winkler, W., Wolansky, D., Wulf, H.E., Yamamoto, Y.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :251-254 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Heinemann, B., Rucker, H., Barth, R., Bauer, J., Bolze, D., Bugiel, E., Drews, J., Ehwald, K.-E., Grabolla, T., Haak, U., Hoppner, W., Knoll, D., Kruger, D., Kuck, B., Kurps, R., Marschmeyer, M., Richter, H.H., Schley, P., Schmidt, D., Scholz, R., Tillack, B., Winkler, W., Wolnsky, D., Wulf, H.-E., Yamamoto, Y., Zaumseil, P.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :775-778 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Knoll, D., Ehwald, K.E., Heinemann, B., Fox, A., Blum, K., Rucker, H., Furnhammer, F., Senapati, B., Barth, R., Haak, U., Hoppner, W., Drews, J., Kurps, R., Marschmeyer, S., Richter, H.H., Grabolla, T., Kuck, B., Fursenko, O., Schley, P., Scholz, R., Tillack, B., Yamamoto, Y., Kopke, K., Wulf, H.E., Wolansky, D., Winkler, W.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :783-786 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Schmundt, H., Knoll, D., Heinemann, B., Schley, P., Winter, H., Kuck, B., Schlote, J., Blum, K., Kurps, R., Grabolla, T., Rucker, H., Tillack, B., Bolze, K.D.

المصدر: 28th European Solid-State Device Research Conference Solid-State Device Research Conference, 1998. Proceeding of the 28th European. :260-263 1998

Relation: 28th European Solid-State Device Research Conference

المؤلفون: Fox, A., Heinemann, B., Barth, R., Bolze, D., Drews, J., Haak, U., Knoll, D., Kuck, B., Kurps, R., Marschmeyer, S., Richter, H.H., Rucker, H., Schley, P., Schmidt, D., Tillack, B., Weidner, G., Wipf, C., Wolansky, D., Yamamoto, Y.

المصدر: 2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008

Relation: 2008 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Rucker, H., Heinemann, B., Barth, R., Bauer, J., Blum, K., Bolze, D., Drews, J., Fischer, G.G., Fox, A., Fursenko, O., Grabolla, T., Haak, U., Hoppner, W., Knoll, D., Kopke, K., Kuck, B., Mai, A., Marschmeyer, S., Morgenstern, T., Richter, H.H., Schley, P., Schmidt, D., Schulz, K., Tillack, B., Weidner, G., Winkler, W., Wolansky, D., Wulf, H.-E., Yamamototo, Y.

المصدر: 2007 IEEE International Electron Devices Meeting Electron Devices Meeting, 2007. IEDM 2007. IEEE International. :651-654 Dec, 2007

Relation: 2007 IEEE International Electron Devices Meeting

المؤلفون: Knoll, D., Heinemann, B., Ehwald, K. E., Fox, A., Rucker, H., Barth, R., Bolze, D., Grabolla, T., Haak, U., Drews, J., Kuck, B., Marschmeyer, S., Richter, H. H., Chaimanee, M., Fursenko, O., Schley, P., Tillack, B., Kopke, K., Yamamoto, Y., Wulf, H. E., Wolansky, D.

المصدر: 2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006

Relation: 2006 International Electron Devices Meeting

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المؤلفون: Singh, R., Radu, I., Reiche, M., Himcinschi, C., Kuck, B., Tillack, B., Gösele, U., Christiansen, S.H.

المصدر: In Applied Surface Science 30 January 2007 253(7):3595-3599