المؤلفون: Okagaki, T., Tanizawa, M., Fujinaga, M., Kunikiyo, T., Yuki, H., Ishikawa, K., Nishikawa, Y., Eimori, T., Inuishi, M., Oji, Y.

المصدر: Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :219-222 2005

Relation: ICMTS 2005. Proceedings of the 2005 International Conference on Microelectronic Test Structures

المؤلفون: Kunikiyo, T., Watanabe, T., Kanamoto, T., Asazato, H., Shirota, M., Eikyu, K., Ajioka, Y., Makino, H., Ishikawa, K., Iwade, S., Inoue, Y., Yamashita, K., Kobayashi, M., Gohda, A., Oda, Y., Yamaguchi, R., Umimoto, H., Ohtani, K.

المصدر: International Conference on Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003. Simulation of semiconductor processes and devices Simulation of Semiconductor Processes and Devices, 2003. SISPAD 2003. International Conference on. :31-34 2003

Relation: IEEE International Conference on Simulation of Semiconductor Processes and Devices

المؤلفون: Tsukamoto, Y., Kunikiyo, T., Nii, K., Makino, H., Iwade, S., Ishikawa, K., Inoue, Y.

المصدر: International Conference on Simulation of Semiconductor Processes and Devices Simulation of semiconductor processes Simulation of Semiconductor Processes and Devices, 2002. SISPAD 2002. International Conference on. :63-66 2002

Relation: 2002 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2002)

المؤلفون: Hirano, Y., Matsumoto, T., Maeda, S., Iwamatsu, T., Kunikiyo, T., Nii, K., Yamamoto, K., Yamaguchi, Y., Ipposhi, T., Maegawa, S., Inuishi, M.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :467-470 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM

المؤلفون: Sayama, H., Nishida, Y., Oda, H., Oishi, T., Shimizu, S., Kunikiyo, T., Sonoda, K., Inoue, Y., Inuishi, M.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :657-660 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Taniguchi, K., Yamaji, M., Sonoda, K., Kunikiyo, T., Hamaguchi, C.

المصدر: Proceedings of 1994 IEEE International Electron Devices Meeting Electron devices Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International. :355-358 1994

Relation: Proceedings of 1994 IEEE International Electron Devices Meeting

المؤلفون: Kunikiyo, T., Watanabe, T., Kanamoto, T., Asazato, H., Shirota, M., Eikyu, K., Ajioka, Y., Makino, H., Ishikawa, K., Iwade, S., Inoue, Y.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(5):726-735 May, 2004

المؤلفون: Kunikiyo, T., Mitsui, K., Fujinaga, M., Uchida, T., Kotani, N., Akasaka, Y.

المصدر: NUPAD IV. Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits, Numerical Modeling of Processes and Devices for Integrated Circuits, 1992. NUPAD IV. Workshop on. :51-56 1992

Relation: Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits,

المؤلفون: Fujinaga, M., Kunikiyo, T., Uchida, T., Kotani, N., Osaki, A., Akasaka, Y.

المصدر: International Technical Digest on Electron Devices Electron Devices Meeting, 1990. IEDM '90. Technical Digest., International. :905-908 1990

Relation: International Technical Digest on Electron Devices

المؤلفون: Fujinaga, M., Tottori, I., Kunikiyo, T., Uchida, T., Kotani, N., Tsukamoto, K.

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 14(5):631-638 May, 1995