المؤلفون: Arellano-Véliz, Nicol A., Cox, Ralf F.A., Jeronimus, Bertus F., Castillo, Ramón D., Kunnen, E. Saskia

المصدر: In Journal of Research in Personality June 2024 110

المؤلفون: Schram, T., Smets, Q., Groven, B., Heyne, M. H., Kunnen, E., Thiam, A., Devriendt, K., Delabie, A., Lin, D., Lux, M., Chiappe, D., Asselberghs, I., Brus, S., Huyghebaert, C., Sayan, S., Juncker, A., Caymax, M., Radu, I. P.

المصدر: 2017 47th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2017 47th European. :212-215 Sep, 2017

Relation: ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC)

المؤلفون: Chew, S-A., Yu, H., Schaekers, M., Demuynck, S., Mannaert, G., Kunnen, E., Rosseel, E., Hikavyy, A., Dangol, A., Meyer, K. De, Mocuta, D., Horiguchi, N., Leusink, G., Wajda, C., Hakamata, T., Hasegawa, T., Tapily, K., Clark, R.

المصدر: 2017 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2017 IEEE International. :1-3 May, 2017

Relation: 2017 IEEE International Interconnect Technology Conference (IITC)

المؤلفون: Demuynck, S., Mao, M., Kunnen, E., Versluijs, J., Croes, K., Wu, C., Schaekers, M., Peter, A., Kauerauf, T., Teugels, L., Bommels, J.

المصدر: IEEE International Interconnect Technology Conference Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2014 IEEE International. :307-310 May, 2014

Relation: 2014 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC)

المؤلفون: Vandooren, A., Witters, L., Vecchio, E., Kunnen, E., Hellings, G., Peng, L., Inoue, F., Li, W., Waldron, N., Mocuta, D., Collaert, N.

المصدر: 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2017 IEEE. :1-2 Oct, 2017

Relation: 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Schram, T., Smets, Q., Heyne, M.H., Graven, B., Kunnen, E., Thiam, A., Devriendt, K., Delabie, A., Lin, D., Chiappe, D., Asselberghs, I., Lux, M., Brus, S., Huyghebaert, C., Sayan, S., Juncker, A., Caymax, M., Radu, I.P.

المصدر: 2017 Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2017. :139-140 Jun, 2017

Relation: 2017 Silicon Nanoelectronics Workshop (SNW)

المؤلفون: van der Reijden, M.J., Op de Beeck, M., Sleeckx, E., Jaenen, P., Kunnen, E., Degroote, B., Wendy Yeh, Schreutelkamp, R.

المصدر: The 17th Annual SEMI/IEEE ASMC 2006 Conference Advanced Semiconductor Manufacturing Conference, 2006. ASMC 2006. The 17th Annual SEMI/IEEE. :39-43 2006

Relation: The 17th Annual SEMI/IEEE ASMC 2006 Conference

المؤلفون: Collaert, N., Brus, S., De Keersgieter, A., Dixit, A., Ferain, I., Goodwin, M., Kottantharayil, A., Rooyackers, R., Verheyen, P., Yim, Y., Zimmerman, P., Beckx, S., Degroote, B., Demand, M., Kim, M., Kunnen, E., Locorotondo, S., Mannaert, G., Neuilly, F., Shamiryan, D., Baerts, C., Ercken, M., Laidlcr, D., Leys, F., Loo, R., Lisoni, J., Snow, J., Vos, R., Boullart, W., Pollentier, I., De Gendt, S., De Meyer, K., Jurczak, M., Biescmans, S.

المصدر: 2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005. Integrated circuit design and technology Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on. :187-194 2005

Relation: 2005 International Conference on Integrated Circuit Design and Technology

المؤلفون: Jurczak, M., Rooyackers, R., De Keersgieter, A., Kunnen, E., Henson, K., Richard, O., Dachs, C.

المصدر: Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850) Solid-state device research conference Solid-State Device Research Conference, 2004. ESSDERC 2004. Proceeding of the 34th European. :145-148 2004

Relation: Proceedings of the 34th European Solid-State Device Research Conference