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1مؤتمر
المؤلفون: Kuo, Feng-Wei, Babaie, Masoud, Chen, Ron, Yen, Kyle, Chien, Jinn-Yeh, Cho, Lanchou, Kuo, Fred, Jou, Chewn-Pu, Hsueh, Fu-Lung, Staszewski, Robert Bogdan
المصدر: ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC) European Solid-State Circuits Conference (ESSCIRC), ESSCIRC 2015 - 41st. :356-359 Sep, 2015
Relation: ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference
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2مؤتمر
المؤلفون: Pfaff, Dirk, Moazzeni, Shahaboddin, Gao, Leisheng, Chuang, Mei-Chen, Wang, Xin-Jie, Palusa, Chai, Abbott, Robert, Ramirez, Rolando, Amer, Maher, Huang, Ming-Chieh, Lin, Chih-Chang, Kuo, Fred, Chen, Wei-Li, Goh, Tae Young, Hsieh, Kenny
المصدر: 2019 Symposium on VLSI Circuits VLSI Circuits, 2019 Symposium on. :C270-C271 Jun, 2019
Relation: 2019 Symposium on VLSI Circuits
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3مؤتمر
المؤلفون: Hsieh-Hung Hsieh, Fu-Lung Hsueh, Chewn-Pu Jou, Kuo, Fred, Sean Chen, Tzu-Jin Yeh, Tan, Kevin Kai-Wen, Po-Yi Wu, Yu-Ling Lin, Ming-Hsien Tsai
المصدر: IEEE Custom Integrated Circuits Conference 2010 Custom Integrated Circuits Conference (CICC), 2010 IEEE. :1-4 Sep, 2010
Relation: 2010 IEEE Custom Integrated Circuits Conference -CICC 2010
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4تقرير
المؤلفون: Holsomback, Jerry, Kuo, Fred, Wade, Jim
المصدر: NASA Tech Briefs, August 2005.
مصطلحات موضوعية: Quality Assurance And Reliability
Relation: NASA Tech Briefs, August 2005
URL الوصول: https://ntrs.nasa.gov/citations/20110015073
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5دورية
المؤلفون: Erdmann, Andreas, Kye, Jongwook, Kuo, Fred, Huang, Jason, Melvin, Lawrence S.
المصدر: Proceedings of SPIE; March 2017, Vol. 10147 Issue: 1 p101471R-101471R-5, 913245p
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6مؤتمر
المؤلفون: Zheng, Xin, Huang, Jason, Kuo, Fred, Kazarian, Aram, Chin, Fook, Fan, Yongfa
المصدر: Proceedings of SPIE; Nov2009, Issue 1, p727435-727435-8, 8p