المؤلفون: Kuo, Feng-Wei, Babaie, Masoud, Chen, Ron, Yen, Kyle, Chien, Jinn-Yeh, Cho, Lanchou, Kuo, Fred, Jou, Chewn-Pu, Hsueh, Fu-Lung, Staszewski, Robert Bogdan

المصدر: ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference (ESSCIRC) European Solid-State Circuits Conference (ESSCIRC), ESSCIRC 2015 - 41st. :356-359 Sep, 2015

Relation: ESSCIRC Conference 2015 - 41st European Solid-State Circuits Conference

المؤلفون: Pfaff, Dirk, Moazzeni, Shahaboddin, Gao, Leisheng, Chuang, Mei-Chen, Wang, Xin-Jie, Palusa, Chai, Abbott, Robert, Ramirez, Rolando, Amer, Maher, Huang, Ming-Chieh, Lin, Chih-Chang, Kuo, Fred, Chen, Wei-Li, Goh, Tae Young, Hsieh, Kenny

المصدر: 2019 Symposium on VLSI Circuits VLSI Circuits, 2019 Symposium on. :C270-C271 Jun, 2019

Relation: 2019 Symposium on VLSI Circuits

المؤلفون: Hsieh-Hung Hsieh, Fu-Lung Hsueh, Chewn-Pu Jou, Kuo, Fred, Sean Chen, Tzu-Jin Yeh, Tan, Kevin Kai-Wen, Po-Yi Wu, Yu-Ling Lin, Ming-Hsien Tsai

المصدر: IEEE Custom Integrated Circuits Conference 2010 Custom Integrated Circuits Conference (CICC), 2010 IEEE. :1-4 Sep, 2010

Relation: 2010 IEEE Custom Integrated Circuits Conference -CICC 2010

المؤلفون: Holsomback, Jerry, Kuo, Fred, Wade, Jim

المصدر: NASA Tech Briefs, August 2005.

مصطلحات موضوعية: Quality Assurance And Reliability

Relation: NASA Tech Briefs, August 2005

URL الوصول: https://ntrs.nasa.gov/citations/20110015073

المؤلفون: Erdmann, Andreas, Kye, Jongwook, Kuo, Fred, Huang, Jason, Melvin, Lawrence S.

المصدر: Proceedings of SPIE; March 2017, Vol. 10147 Issue: 1 p101471R-101471R-5, 913245p

المؤلفون: Zheng, Xin, Huang, Jason, Kuo, Fred, Kazarian, Aram, Chin, Fook, Fan, Yongfa

المصدر: Proceedings of SPIE; Nov2009, Issue 1, p727435-727435-8, 8p