المؤلفون: Chuang, K.A., Lieu, C.H., Tsai, W.J., Wu, M.H., Chen, Y.C., Liao, J.F., Wang, C.C., Kuo, Y.C.

المصدر: Brazilian Journal of Medical and Biological Research. October 2010 43(10)

مصطلحات موضوعية: Cancer, Plasmids, Reporter assay, Screening, Wnt, β-catenin

وصف الملف: text/html

URL الوصول: http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0100-879X2010001000003

المؤلفون: Hsieh, E.R., Kuo, Y.C., Cheng, C., Kuo, J.L., Jiang, M., Lin, J., Chen, H., Chung, S.S., Liu, C., Chen, T.P., Huang, S.A., Chen, T., Cheng, O.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(12):4910-4918 Dec, 2017

المؤلفون: Lin, F.S., Chen, J.F., Liang, T.J., Lin, R.L., Kuo, Y.C.

المصدر: The 2004 IEEE Asia-Pacific Conference on Circuits and Systems, 2004. Proceedings. Circuits and systems Circuits and Systems, 2004. Proceedings. The 2004 IEEE Asia-Pacific Conference on. 2:745-748 2004

Relation: Proceedings. The 2004 IEEE Asia-Pacific Conference on Circuits and Systems

المؤلفون: Liang, T.J., Chen, J.F., Mi, T.C., Kuo, Y.C., Cheng, C.A.

المصدر: 4th IEEE International Conference on Power Electronics and Drive Systems. IEEE PEDS 2001 - Indonesia. Proceedings (Cat. No.01TH8594) Power-electronics and drive systems Power Electronics and Drive Systems, 2001. Proceedings., 2001 4th IEEE International Conference on. 2:807-810 vol.2 2001

Relation: Proceedings of International Conference on Power Electronics and Drives Systems (PEDS)

المؤلفون: Kuo, Y.C., Lo, S.H., Wang, W.K.

المصدر: 2001 Conference Proceedings of the 23rd Annual International Conference of the IEEE Engineering in Medicine and Biology Society Engineering in medicine and biology Engineering in Medicine and Biology Society, 2001. Proceedings of the 23rd Annual International Conference of the IEEE. 1:519-521 vol.1 2001

Relation: 2001 Conference Proceedings of the 23rd Annual International Conference of the IEEE Engineering n Medicine and Biology Society

المؤلفون: Juan, P.C., Lin, K.C., Chu, H.Y., Kuo, Y.C., Wang, H.W., Shih, T.Y.

المصدر: In Microelectronics Reliability April 2018 83:242-248

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Liang, S.H., Kuo, Y.C., Chen, S.H., Chen, C.Y., Kao, C.M.

المصدر: In Journal of Hazardous Materials 15 June 2013 254-255:107-115