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1دورية أكاديمية
المؤلفون: Narayanan, P., Burr, G. W., Virwani, K., Kurdi, B.
المصدر: IEEE Journal on Emerging and Selected Topics in Circuits and Systems IEEE J. Emerg. Sel. Topics Circuits Syst. Emerging and Selected Topics in Circuits and Systems, IEEE Journal on. 6(3):330-338 Sep, 2016
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2كتاب إلكتروني
المؤلفون: Ahmad, A.Aff5, Alshurideh, M. T.Aff5, Aff6, Al Kurdi, B. H.Aff7, Salloum, S. A.Aff8
المساهمون: Kacprzyk, Janusz, Series EditorAff1, Alshurideh, M.T., editorAff2, Hassanien, Aboul Ella, editorAff3, Masa’deh, Ra’ed, editorAff4
المصدر: The Effect of Coronavirus Disease (COVID-19) on Business Intelligence. 334:95-106
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3كتاب إلكتروني
المؤلفون: Ahmad, A.Aff17, Alshurideh, M. T.Aff17, Aff18, Al Kurdi, B. H.Aff19
المساهمون: Kacprzyk, Janusz, Series EditorAff1, Pal, Nikhil R., Advisory EditorAff2, Bello Perez, Rafael, Advisory EditorAff3, Corchado, Emilio S., Advisory EditorAff4, Hagras, Hani, Advisory EditorAff5, Kóczy, László T., Advisory EditorAff6, Kreinovich, Vladik, Advisory EditorAff7, Lin, Chin-Teng, Advisory EditorAff8, Lu, Jie, Advisory EditorAff9, Melin, Patricia, Advisory EditorAff10, Nedjah, Nadia, Advisory EditorAff11, Nguyen, Ngoc Thanh, Advisory EditorAff12, Wang, Jun, Advisory EditorAff13, Hassanien, Aboul-Ella, editorAff14, Chang, Kuo-Chi, editorAff15, Mincong, Tang, editorAff16
المصدر: Advanced Machine Learning Technologies and Applications : Proceedings of AMLTA 2021. 1339:570-580
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4مؤتمر
المؤلفون: Gopalakrishnan, K., Shenoy, R.S., Rettner, C.T., King, R.S., Zhang, Y., Kurdi, B., Bozano, L.D., Welser, J.J., Rothwell, M.E., Jurich, M., Sanchez, M.I., Hernandez, M., Rice, P.M., Risk, W.P., Wickramasinghe, H.K.
المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :471-474 2005
Relation: International Electron Devices Meeting 2005
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5مؤتمر
المؤلفون: Padilla, A., Burr, G. W., Shenoy, R. S., Raman, K. V., Bethune, D., Shelby, R. M., Rettner, C. T., Mohammad, J., Virwani, K., Narayanan, P., Deb, A. K., Pandey, R. K., Bajaj, M., Murali, K. V. R. M., Kurdi, B. N., Gopalakrishnan, K.
المصدر: 72nd Device Research Conference Device Research Conference (DRC), 2014 72nd Annual. :163-164 Jun, 2014
Relation: 2014 72nd Annual Device Research Conference (DRC)
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6مؤتمر
المؤلفون: Narayanan, P., Burr, G. W., Shenoy, R. S., Stephens, S., Virwani, K., Padilla, A., Kurdi, B., Gopalakrishnan, K.
المصدر: 72nd Device Research Conference Device Research Conference (DRC), 2014 72nd Annual. :239-240 Jun, 2014
Relation: 2014 72nd Annual Device Research Conference (DRC)
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7مؤتمر
المؤلفون: Burr, G.W., Shelby, R.M., di Nolfo, C., Jang, J.W., Shenoy, R.S., Narayanan, P., Virwani, K., Giacometti, E.U., Kurdi, B., Hwang, H.
المصدر: 2014 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2014 IEEE International. :29.5.1-29.5.4 Dec, 2014
Relation: 2014 IEEE International Electron Devices Meeting (IEDM)
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8مؤتمر
المؤلفون: Narayanan, P., Burr, G. W., Shenoy, R. S., Virwani, K., Kurdi, B.
المصدر: 2014 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2014 IEEE International. :29.7.1-29.7.4 Dec, 2014
Relation: 2014 IEEE International Electron Devices Meeting (IEDM)
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9مؤتمر
المؤلفون: Burr, G. W., Virwani, K., Shenoy, R. S., Fraczak, G., Rettner, C. T., Padilla, A., King, R. S., Nguyen, K., Bowers, A. N., Jurich, M., BrightSky, M., Joseph, E. A., Kellock, A. J., Arellano, N., Kurdi, B. N., Gopalakrishnan, K.
المصدر: 2013 Symposium on VLSI Technology VLSI Technology (VLSIT), 2013 Symposium on. :T66-T67 Jun, 2013
Relation: 2013 Symposium on VLSI Technology
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10مؤتمر
المؤلفون: Burr, G. W., Virwani, K., Shenoy, R. S., Padilla, A., BrightSky, M., Joseph, E. A., Lofaro, M., Kellock, A. J., King, R. S., Nguyen, K., Bowers, A. N., Jurich, M., Rettner, C. T., Jackson, B., Bethune, D. S., Shelby, R. M., Topuria, T., Arellano, N., Rice, P. M., Kurdi, B. N., Gopalakrishnan, K.
المصدر: 2012 Symposium on VLSI Technology (VLSIT) VLSI Technology (VLSIT), 2012 Symposium on. :41-42 Jun, 2012
Relation: 2012 IEEE Symposium on VLSI Technology