المؤلفون: Lischke, S., Knoll, D., Zimmermann, L., Scheit, A., Mai, C., Trusch, A., Voigt, K., Kroh, M., Kurps, R., Ostrovskyy, P., Yamamoto, Y., Korndorfer, F., Peczek, A., Winzer, G., Tillack, B.

المصدر: 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2014 IEEE. :29-32 Sep, 2014

Relation: 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM

المؤلفون: Heinemann, B., Barth, R., Bolze, D., Drews, J., Formanek, P., Grabolla, T., Haak, U., Hoppner, W., Kopke, D.K., Kuck, B., Kurps, R., Marschmeyer, S., Richter, H.H., Rucker, H., Schley, P., Schmidt, D., Winkler, W., Wolansky, D., Wulf, H.E., Yamamoto, Y.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :251-254 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Rucker, H., Heinemann, B., Barth, R., Bolze, D., Melnik, V., Kurps, R., Kruger, D.

المصدر: 32nd European Solid-State Device Research Conference Solid-State Device Research Conference, 2002. Proceeding of the 32nd European. :199-202 2002

Relation: 32nd European Solid-State Device Research Conference

المؤلفون: Heinemann, B., Rucker, H., Barth, R., Bauer, J., Bolze, D., Bugiel, E., Drews, J., Ehwald, K.-E., Grabolla, T., Haak, U., Hoppner, W., Knoll, D., Kruger, D., Kuck, B., Kurps, R., Marschmeyer, M., Richter, H.H., Schley, P., Schmidt, D., Scholz, R., Tillack, B., Winkler, W., Wolnsky, D., Wulf, H.-E., Yamamoto, Y., Zaumseil, P.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :775-778 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Knoll, D., Ehwald, K.E., Heinemann, B., Fox, A., Blum, K., Rucker, H., Furnhammer, F., Senapati, B., Barth, R., Haak, U., Hoppner, W., Drews, J., Kurps, R., Marschmeyer, S., Richter, H.H., Grabolla, T., Kuck, B., Fursenko, O., Schley, P., Scholz, R., Tillack, B., Yamamoto, Y., Kopke, K., Wulf, H.E., Wolansky, D., Winkler, W.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :783-786 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Heinemann, B., Barth, R., Bolze, D., Ehwald, K.-E., Knoll, D., Kruger, D., Kurps, R., Rucker, H., Schley, P., Tillack, B., Wolansky, D.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :471-474 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM

المؤلفون: Rucker, H., Heinemann, B., Bolze, D., Knoll, D., Kruger, D., Kurps, R., Osten, H.J., Schley, P., Tillack, B., Zaumseil, P.

المصدر: International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) Electron devices Electron Devices Meeting, 1999. IEDM '99. Technical Digest. International. :345-348 1999

Relation: International Electron Devices Meeting 1999. Technical Digest

المؤلفون: Schmundt, H., Knoll, D., Heinemann, B., Schley, P., Winter, H., Kuck, B., Schlote, J., Blum, K., Kurps, R., Grabolla, T., Rucker, H., Tillack, B., Bolze, K.D.

المصدر: 28th European Solid-State Device Research Conference Solid-State Device Research Conference, 1998. Proceeding of the 28th European. :260-263 1998

Relation: 28th European Solid-State Device Research Conference

المؤلفون: Rucker, H., Heinemann, B., Ropke, W., Fischer, G., Lippert, G., Osten, H.J., Kurps, R.

المصدر: SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest Simulation of semiconductor processes and devices Simulation of Semiconductor Processes and Devices, 1997. SISPAD '97., 1997 International Conference on. :281-284 1997

Relation: SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest

المؤلفون: Fox, A., Heinemann, B., Barth, R., Bolze, D., Drews, J., Haak, U., Knoll, D., Kuck, B., Kurps, R., Marschmeyer, S., Richter, H.H., Rucker, H., Schley, P., Schmidt, D., Tillack, B., Weidner, G., Wipf, C., Wolansky, D., Yamamoto, Y.

المصدر: 2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008

Relation: 2008 IEEE International Electron Devices Meeting (IEDM)