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1دورية أكاديميةDefect Detection in Atomic Resolution Transmission Electron Microscopy Images Using Machine Learning
المؤلفون: Philip Cho, Aihua Wood, Krishnamurthy Mahalingam, Kurt Eyink
المصدر: Mathematics, Vol 9, Iss 11, p 1209 (2021)
مصطلحات موضوعية: transmission electron microscopy (TEM), convolutional neural networks (CNN), anomaly detection, principal component analysis (PCA), machine learning, deep learning, Mathematics, QA1-939
وصف الملف: electronic resource
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المؤلفون: John W. Drazin, Kurt Eyink, Randall S. Hay
المصدر: Journal of the American Ceramic Society. 106:3934-3944
مصطلحات موضوعية: Materials Chemistry, Ceramics and Composites
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المؤلفون: Vitaliy N. Pustovit, David E. Zelmon, Kurt Eyink, Augustine M. Urbas
المصدر: Photonics and Nanostructures - Fundamentals and Applications. 51:101049
مصطلحات موضوعية: Hardware and Architecture, Electrical and Electronic Engineering, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials
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المؤلفون: Bruce Claflin, Jeongho Park, Kurt Eyink, David Tomich, John Albrecht
المصدر: ECS Meeting Abstracts. :1301-1301