يعرض 1 - 10 نتائج من 39 نتيجة بحث عن '"Kwan-Weon Kim"', وقت الاستعلام: 0.99s تنقيح النتائج
  1. 1
    مؤتمر
    A 2.5Gb/s/pin 256Mb GDDR3 SDRAM with Series Pipelined CAS Latency Control and Dual-Loop Digital DLL

    المؤلفون: Dong Uk Lee, Hyun Woo Lee, Ki Chang Kwean, Young Kyoung Choi, Hyong Uk Moon, Seung Wook Kwack, Shin Deok Kang, Kwan Weon Kim, Yong Ju Kim, Young Jung Choi, Moran, P., Jin Hong Ahn, Joong Sik Kih

    المصدر: 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers Solid-State Circuits Conference, 2006. ISSCC 2006. Digest of Technical Papers. IEEE International. :547-556 2006

    Relation: 2006 IEEE International Solid State Circuits Conference

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  2. 2
    مؤتمر
    An exact measurement and repair circuit of TSV connections for 128GB/s high-bandwidth memory(HBM) stacked DRAM

    المؤلفون: Dong Uk Lee, Kyung Whan Kim, Kwan Weon Kim, Kang Seol Lee, Sang Jin Byeon, Jin Hee Cho, Han Ho Jin, Sang Kyun Nam, Jaejin Lee, Jun Hyun Chun, Sungjoo Hong

    المصدر: 2014 Symposium on VLSI Circuits Digest of Technical Papers VLSI Circuits Digest of Technical Papers, 2014 Symposium on. :1-2 Jun, 2014

    Relation: 2014 IEEE Symposium on VLSI Circuits

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  3. 3
    مؤتمر
    A 1.6V 3.3Gb/s GDDR3 DRAM with dual-mode phase- and delay-locked loop using power-noise management with unregulated power supply in 54nm CMOS

    المؤلفون: Lee, Hyun-Woo, Yun, Won-Joo, Young-Kyoung Choi, Hyang-Hwa Choi, Jong-Jin Lee, Ki-Han Kim, Shin-Deok Kang, Ji-Yeon Yang, Jae-Suck Kang, Hyeng-Ouk Lee, Lee, Dong-Uk, Sujeong Sim, Young-Ju Kim, Won-Jun Choi, Keun-Soo Song, Sang-Hoon Shin, Hyung-Wook Moon, Seung-Wook Kwack, Jung-Woo Lee, Park, Nak-Kyu, Kwan-Weon Kim, Young-Jung Choi, Jin-Hong Ahn, Byong-Tae Chung

    المصدر: 2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International. :140-141,141a Feb, 2009

    Relation: 2009 IEEE International Solid-State Circuits Conference - (ISSCC)

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  4. 4
    مؤتمر
    A low power and high performance robust digital delay locked loop against noisy environments

    المؤلفون: Lee, Hyun-Woo, Yun, Won-Joo, Jong-Jin Lee, Ki-Han Kim, Park, Nak-Kyu, Kwan-Weon Kim, Young-Jung Choi, Jin-Hong Ahn, Byong-Tae Chung

    المصدر: 2008 IEEE Asian Solid-State Circuits Conference Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian. :241-244 Nov, 2008

    Relation: 2008 IEEE Asian Solid-State Circuits Conference (A-SSCC)

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  5. 5
    مؤتمر
    A wide-range all-digital multiphase DLL with supply noise tolerance

    المؤلفون: Hyunsoo Chae, Dongsuk Shin, Kisoo Kim, Kwan-Weon Kim, Young Jung Choi, Chulwoo Kim

    المصدر: 2008 IEEE Asian Solid-State Circuits Conference Solid-State Circuits Conference, 2008. A-SSCC '08. IEEE Asian. :421-424 Nov, 2008

    Relation: 2008 IEEE Asian Solid-State Circuits Conference (A-SSCC)

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  6. 6
    مؤتمر
    A Low Power High Performance Register-Controlled Digital DLL for 2Gbps x32 GDDR SDRAM

    المؤلفون: Hyun-Woo Lee, Won-Joo Yun, Sin-Deok Kang, Hyung-Wook Moon, Seung-Wook Kwack, Dong-Uk Lee, Ki-Chang Kwean, Kwan-Weon Kim, Young-Jung Choi, Jin-Hong Ahn, Joong-Sik Kih

    المصدر: 2005 IEEE Asian Solid-State Circuits Conference Asian Solid-State Circuits Conference, 2005. :401-404 Nov, 2005

    Relation: 2005 IEEE Asian Solid-State Circuits Conference

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  7. 7
    مؤتمر
    A low cost high performance register-controlled digital DLL for 1 Gbps/spl times/32 DDR SDRAM

    المؤلفون: Jong-Tae Kwak, Chang-Ki Kwon, Kwan-Weon Kim, Seong-Hoon Lee, Joong-Sik Kih

    المصدر: 2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408) VLSI circuits VLSI Circuits, 2003. Digest of Technical Papers. 2003 Symposium on. :283-284 2003

    Relation: 2003 Symposium on VLSI Circuits. Digest of Technical Papers

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  8. 8
    A 1.2 V 8 Gb 8-Channel 128 GB/s High-Bandwidth Memory (HBM) Stacked DRAM With Effective I/O Test Circuits

    المؤلفون: Jin-Hee Cho, Kwan-Weon Kim, Jun Hyun Chun, Kang Seol Lee, Jae Hwan Kim, Sang-Jin Byeon, Jae-Jin Lee, Kyung Whan Kim, Dong Uk Lee

    المصدر: IEEE Journal of Solid-State Circuits. 50:191-203

    مصطلحات موضوعية: Engineering, business.industry, Bandwidth (signal processing), Electrical engineering, High Bandwidth Memory, Chip, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Wafer, Memory rank, Electrical and Electronic Engineering, business, Dram, Electronic circuit, Voltage

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6574b888b15c0118cbd08b7ceea3da9b
    https://doi.org/10.1109/jssc.2014.2360379

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  9. 9
    A 1.6 V 1.4 Gbp/s/pin Consumer DRAM With Self-Dynamic Voltage Scaling Technique in 44 nm CMOS Technology

    المؤلفون: Young-Kyoung Choi, Young-Jung Choi, Nak-Kyu Park, Ju-Hwan Shon, Chulwoo Kim, Ki-Han Kim, Byong-Tae Chung, Hyun-woo Lee, Kwan-Weon Kim

    المصدر: ISSCC

    مصطلحات موضوعية: Engineering, business.industry, DDR2 SDRAM, Clock gating, Dynamic voltage scaling, Process variation, CMOS, Low-power electronics, Timing margin, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Electrical and Electronic Engineering, business, Dram

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::315f6b1081199863686488c7575b9ac8
    https://doi.org/10.1109/jssc.2011.2164710

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  10. 10
    An exact measurement and repair circuit of TSV connections for 128GB/s high-bandwidth memory(HBM) stacked DRAM

    المؤلفون: Jun Hyun Chun, Sang-Jin Byeon, Han Ho Jin, Jin-Hee Cho, Kang Seol Lee, Jae-Jin Lee, Kwan-Weon Kim, Sung-Joo Hong, Kyung Whan Kim, Dong Uk Lee, Sang Kyun Nam

    المصدر: VLSIC

    مصطلحات موضوعية: Engineering, Correlated double sampling, Reliability (semiconductor), business.industry, Process (computing), Electrical engineering, Electronic engineering, High Bandwidth Memory, Ohm, business, Impedance distribution, Dram, Testability

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::25da9d3125b3cf800317659df0c5b5af
    https://doi.org/10.1109/vlsic.2014.6858368

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